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SYSTEMS AND METHODS FOR MATERIALS ANALYSIS

  • US 20160209340A1
  • Filed: 01/20/2015
  • Published: 07/21/2016
  • Est. Priority Date: 01/20/2015
  • Status: Active Grant
First Claim
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1. A system for the x-ray topography analysis of a sample, comprising:

  • a goniometer, the goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base;

    an x-ray source, the x-ray source operatively coupled with the tube arm and capable of emitting a non-collimated beam of x-rays;

    a collimator operatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions; and

    a detector operatively coupled to the detector arm.

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