SYSTEMS AND METHODS FOR MATERIALS ANALYSIS
First Claim
1. A system for the x-ray topography analysis of a sample, comprising:
- a goniometer, the goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base;
an x-ray source, the x-ray source operatively coupled with the tube arm and capable of emitting a non-collimated beam of x-rays;
a collimator operatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions; and
a detector operatively coupled to the detector arm.
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Accused Products
Abstract
A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.
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Citations
20 Claims
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1. A system for the x-ray topography analysis of a sample, comprising:
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a goniometer, the goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base; an x-ray source, the x-ray source operatively coupled with the tube arm and capable of emitting a non-collimated beam of x-rays; a collimator operatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions; and a detector operatively coupled to the detector arm. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An X-ray diffraction system for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase, comprising:
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a goniometer, the goniometer having a base, an automated tube arm rotatably associated with the base, an automated detector arm rotatably associated with the base, and an automated sample stage operatively associated with the base; an x-ray source, the x-ray source coupled to the automated tube arm, the x-ray source radiatively supplying an array of non-collimated x-rays; a collimator, operatively associated with and downstream of the x-ray source, the collimator providing a beam of x-rays that has a divergence in all directions less than or about equal to three degrees; a pixelated detector coupled to the automated detector arm, the detector having a plurality of pixels that extend in a first direction from a point and extend in a second direction from the point, each pixel having a detection surface having a width between one micrometer and one thousand micrometers, the detector generating an output signal; a computer in electrical communication with the goniometer having a first algorithm that controls the movement of the automated tube arm, the automated detector arm and the automated stage. - View Dependent Claims (12, 13, 14, 15)
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16. A method for the characterization of micro-textured regions in a metal sample containing more than one crystalline phase, comprising:
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providing an x-ray diffraction system, the system having a sample stage that includes three axes of translation and three axes of rotation, an x-ray source, a collimator that provides a collimated beam of x-rays with a divergence less than three degrees in all directions, a pixelated area detector whose distance between it and the sample stage is variable, and wherein the angle between the X-ray source and the pixelated area detector may be varied between zero degrees and one hundred and seventy degrees; activating the pixelated area detector, the detector continuously creating an output signal; turning on the X-ray source; moving the sample stage, the X-ray source and the detector until a portion of the collimated beam of X-rays is diffracted from the metal sample into the detector; and sending the output signal to a computer. - View Dependent Claims (17, 18, 19, 20)
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Specification