SYSTEM AND METHOD FOR TESTING MULTI-USER, MULTI-INPUT/MULTI-OUTPUT SYSTEMS
First Claim
1. A method of testing a multi-input, multi-output (MIMO) device under test (DUT), the method comprising:
- generating a plurality of independent uplink signals;
applying corresponding uplink fading channel characteristics to each of the independent uplink signals to generate a plurality of faded independent uplink signals;
selectively connecting the plurality of faded independent uplink signals to a plurality of RF ports configured to transmit RF signals to at least one of a plurality of inputs of the MIMO DUT in response to at least one control signal;
receiving at the plurality of RF ports a plurality of downlink signals from the MIMO DUT;
applying downlink fading channel characteristics to at least one of the downlink signals, to produce therefrom at least one faded downlink signal; and
measuring at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal.
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Accused Products
Abstract
A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.
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Citations
22 Claims
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1. A method of testing a multi-input, multi-output (MIMO) device under test (DUT), the method comprising:
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generating a plurality of independent uplink signals; applying corresponding uplink fading channel characteristics to each of the independent uplink signals to generate a plurality of faded independent uplink signals; selectively connecting the plurality of faded independent uplink signals to a plurality of RF ports configured to transmit RF signals to at least one of a plurality of inputs of the MIMO DUT in response to at least one control signal; receiving at the plurality of RF ports a plurality of downlink signals from the MIMO DUT; applying downlink fading channel characteristics to at least one of the downlink signals, to produce therefrom at least one faded downlink signal; and measuring at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A test system for testing a multi-input, multi-output (MIMO) device under test (DUT), the MIMO DUT, the test system comprising:
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one or more signal processors configured to generate a plurality of faded independent uplink signals; a switch network including, a plurality of first ports connected to the one or more signal processors and configured to receive the plurality of faded independent uplink signals, at least one switch, and a plurality of second ports configured to transmit RF uplink signals to the MIMO DUT, and at least one control input configured to receive at least one control signal for controlling the at least one switch to selectively supply to the second ports the plurality of faded independent uplink signals received at the plurality of first ports, wherein the switch network is further configured to receive at the plurality of second ports a plurality of downlink signals from the MIMO DUT and to selectively provide the downlink signals to the first ports in response to at least one control signal, and wherein the one or more signal processors are further configured to apply corresponding downlink fading channel characteristics to at least one of the downlink signals, to produce therefrom at least one faded downlink signal, and to measure at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification