SYSTEM AND METHOD FOR TESTING MULTI-USER, MULTI-INPUT/MULTI-OUTPUT SYSTEMS

• US 20160212641A1
• Filed: 01/19/2016
• Published: 07/21/2016
• Est. Priority Date: 01/19/2015
• Status: Active Grant

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Keysight Technologies, Inc.
• Inventors: Kong, Hong-Wei, Jing, Ya, Zhao, Xu
• Granted Patent: US 9,859,995 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: H04B 17/0087 using auxiliary channels or channel simulators
• CPC Class Codes: H04B 17/3911 Fading models or fading generators
• CPC Class Codes: H04B 7/0413 MIMO systems

Abstract

A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Claims

1. A method of testing a multi-input, multi-output (MIMO) device under test (DUT), the method comprising:

generating a plurality of independent uplink signals;

applying corresponding uplink fading channel characteristics to each of the independent uplink signals to generate a plurality of faded independent uplink signals;

selectively connecting the plurality of faded independent uplink signals to a plurality of RF ports configured to transmit RF signals to at least one of a plurality of inputs of the MIMO DUT in response to at least one control signal;

receiving at the plurality of RF ports a plurality of downlink signals from the MIMO DUT;

applying downlink fading channel characteristics to at least one of the downlink signals, to produce therefrom at least one faded downlink signal; and

measuring at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal.

2. The method of claim 1, further comprising applying different uplink fading channel characteristics to each of the independent uplink signals to generate the plurality of faded independent uplink signals.

3. The method of claim 2, further comprising:

supplying the plurality of faded independent uplink signals from the plurality of RF ports to a plurality of probe antennas via a corresponding plurality of RF cables; and

transmitting the plurality of faded independent uplink signals wirelessly from the probe antennas to the MIMO DUT.

4. The method of claim 3, further comprising supplying a first one of the plurality of faded independent uplink signals to a first group of the plurality of probe antennas, and supplying a second one of the plurality of faded independent uplink signals to a second group of the plurality of probe antennas, wherein at least one of the probe antennas included in the first group is not included in the second group.

5. The method of claim 3, wherein the MIMO DUT is disposed within an anechoic chamber, the method further comprising transmitting the plurality of faded independent uplink signals wirelessly from the probe antennas to the MIMO DUT within the anechoic chamber.

6. The method of claim 5, further comprising:

receiving at the probe antennas the plurality of downlink signals transmitted wirelessly from the MIMO DUT within the anechoic chamber; and

supplying the plurality of downlink signals from the plurality of probe antennas to the plurality of RF ports via the corresponding plurality of RF cables.

7. The method of claim 1, wherein the downlink fading channel characteristics applied to at least one of the downlink signals are the same as the uplink fading channel characteristics applied to a corresponding one of the independent uplink signals.

8. The method of claim 1, further comprising:

extracting data from the at least one of the downlink signals; and

adjusting at least one characteristic of a corresponding one of the plurality of independent uplink signals in response to the extracted data.

9. The method of claim 7, wherein the at least one characteristic of the corresponding one of the plurality of independent uplink signals includes a modulation type employed to generate the corresponding one of the plurality of independent uplink signals.

10. The method of claim 1, wherein measuring at least one performance characteristic of the MIMO DUT includes measuring at least one of:

a signal-to-interference-and-noise ratio (SINR), a signal-to-noise ratio, a bit error rate (BER), a block error rate (BLER), a data throughput, and a packet error rate for the at least one of the downlink signals.

11. The method of claim 1, wherein the plurality of independent uplink signals are baseband signals, and wherein applying corresponding uplink fading channel characteristics to each of the independent uplink signals to generate a plurality of faded independent uplink signals comprises:

converting the plurality of baseband independent uplink signals to a plurality of plurality of independent RF uplink signals; and

applying the corresponding uplink fading channel characteristics to each of the plurality of independent RF uplink signals to generate the plurality of faded independent uplink signals.

12. A test system for testing a multi-input, multi-output (MIMO) device under test (DUT), the MIMO DUT, the test system comprising:

one or more signal processors configured to generate a plurality of faded independent uplink signals;

a switch network including,

a plurality of first ports connected to the one or more signal processors and configured to receive the plurality of faded independent uplink signals,

at least one switch, and

a plurality of second ports configured to transmit RF uplink signals to the MIMO DUT,

and at least one control input configured to receive at least one control signal for controlling the at least one switch to selectively supply to the second ports the plurality of faded independent uplink signals received at the plurality of first ports,

wherein the switch network is further configured to receive at the plurality of second ports a plurality of downlink signals from the MIMO DUT and to selectively provide the downlink signals to the first ports in response to at least one control signal, and

wherein the one or more signal processors are further configured to apply corresponding downlink fading channel characteristics to at least one of the downlink signals, to produce therefrom at least one faded downlink signal, and to measure at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal.

13. The test system of claim 12, wherein the MIMO DUT has a plurality of antennas, the test system further comprising a plurality of probe antennas which are arranged to transmit the RF uplink signals to at least one of the plurality of antennas of the MIMO DUT.

14. The test system of claim 13, wherein the plurality of probe antennas are arranged to transmit the RF signals to the plurality of antennas of the MIMO DUT within an anechoic chamber.

15. The test system of claim 12, wherein the one or more signal processors comprise:

a multi-user signal emulator configured to generate a plurality of independent baseband uplink signals; and

a channel emulator configured to convert the independent baseband uplink signals to independent RF uplink signals, and to apply corresponding uplink fading channel characteristics to each of the independent RF uplink signals to generate the plurality of faded independent uplink signals.

16. The test system of claim 12, wherein the one or more signal processors comprise:

a multi-user signal emulator configured to generate a plurality of independent baseband uplink signals; and

a channel emulator configured to apply corresponding uplink fading channel characteristics to the independent baseband uplink signals to generate the plurality of faded independent baseband uplink signals, and to convert the faded independent baseband uplink signals to RF frequencies to produce the plurality of faded independent uplink signals.

17. The test system of claim 12, wherein the one or more signal processors comprise:

a multi-user signal emulator configured to generate a plurality of independent baseband uplink signals, wherein the multi-user signal emulator includes;

a signal generator configured to generate a plurality of independent baseband uplink signals;

a signal receiver configured to receive the at least one faded downlink signal; and

a performance measurement subsystem configured to measure at least one performance characteristic of the MIMO DUT from the at least one faded downlink signal.

18. The test system of claim 12, wherein the multi-user signal emulator further includes a sounding signal generator configured to generate a sounding signal to be transmitted to the MIMO DUT, the sounding signal being usable by the MIMO DUT to determine uplink fading channel characteristics for at least one of the faded independent uplink signals.

19. The test system of claim 12, further comprising a controller comprising:

a processor; and

memory storing instructions for causing the processor to control at least one operating parameter of the one or more signal processors and at least one operating parameter of the switch network.

20. The test system of claim 19, wherein the controller further comprises a graphical user interface configured to receive user input from a user and in response to the user input to control the at least one operating parameter of the one or more signal processors and the at least one operating parameter of the switch network.

21. The test system of claim 12, wherein the MIMO DUT has a plurality of RF input/output terminals, the test system further comprising an RF coupling network connected to the first ports and second ports of the switch network and further configured to be connected to the RF input/output terminals of the MIMO DUT, wherein the RF coupling network is configured to couple the plurality of uplink signals from the switch network to the RF input/output terminals of the MIMO DUT, and is further configured to couple the plurality of downlink signals from the MIMO DUT to the switch network.

22. The test system of claim 21, wherein the RF coupling network comprises:

an RF coupler subsystem comprising a plurality of RF couplers for isolating the uplink signals and the downlink signals from each other; and

an RF combiner/divider and phase shift network having a plurality of RF combiner/divider and phase shift elements for applying selected phase shifts to the uplink signals and downlink signals.