X-RAY PRODUCT QUALITY AUTOMATIC INSPECTION DEVICE

• US 20160223474A1
• Filed: 08/27/2015
• Published: 08/04/2016
• Est. Priority Date: 09/02/2014
• Status: Active Grant

• Current Assignee: Nuctech Company Limited (Tsinghua Tongfang Co., Ltd.)
• Original Assignee: Nuctech Company Limited (Tsinghua Tongfang Co., Ltd.)
• Inventors: LIU, Zhuoyan, TANG, Huaping, CHEN, Zhiqiang, LI, Yuanjing, WANG, Yonggang, QIN, Zhanfeng
• Granted Patent: US 10,969,346 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: B07C 5/3416 according to radiation transmissivity, e.g. for light, x-rays, particle radiation detecting hidden objects G01V
• CPC Class Codes: G01N 2223/3304 helicoidal scan
• CPC Class Codes: G01N 2223/3307 source and detector fixed; object moves
• CPC Class Codes: G01N 2223/643 object on conveyor
• CPC Class Codes: G01N 2223/645 quality control
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/046 using tomography, e.g. computed tomography [CT]

Abstract

An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.

Claims

1. An X-ray product quality automatic inspection device, comprising:

a distributed X-ray source having a plurality of targets, wherein the distributed X-ray source is able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence;

a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays;

a transport device for carrying the inspected product to pass through an X-ray radiation region; and

a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector, and to provide an inspection and analysis result of the inspected product according to the characteristic information.

2. The X-ray product quality automatic inspection device according to claim 1, further comprising:

a sorting device, which is located downstream of the distributed X-ray source and the detector in a moving direction of the inspected product, and is used to sort the inspected product according to the signal from the detector under the control of the power supply and control device.

3. The X-ray product quality automatic inspection device according to claim 1, further comprising:

a sorting device, which is located downstream of the distributed X-ray source and the detector in a moving direction of the inspected product, and is used to sort the inspected product according to the inspection and analysis result from the power supply and control device, under the control of the power supply and control device.

4. The X-ray product quality automatic inspection device according to claim 1, wherein the transport device is a part of a factory production line.

5. The X-ray product quality automatic inspection device according to claim 1, wherein the transport device is located between the distributed X-ray source and the detector, and is arranged as a continuous transport mechanism which matches a production line for the inspected product.

6. The X-ray product quality automatic inspection device according to claim 5, wherein the transport device is interposed into a factory standard production line, and the inspected product is transported from an upstream standard production line to the transport device, which carries the inspected product to pass through the X-ray radiation region and then transports the inspected product onto a downstream standard production line.

7. The X-ray product quality automatic inspection device according to claim 2, wherein the power supply and control device determines whether the signal from the detector falls within a predetermined threshold range, and the sorting device sorts out the inspected product when it is determined that the signal from the detector does not fall within the threshold range.

8. The X-ray product quality automatic inspection device according to claim 3, wherein the sorting device sorts out the inspected product in a case where the inspection and analysis result from the power supply and control device indicates that the characteristic information of the inspected product is inconsistent with standard characteristic information.

9. The X-ray product quality automatic inspection device according to claim 1, wherein

the power supply and control device further comprises an image construction subsystem, which is used to receive the signal from the detector to form a multi-view image or a three-dimensional image expressing the characteristic information of the inspected product.

10. The X-ray product quality automatic inspection device according to claim 9, wherein the power supply and control device further comprises an image analysis subsystem, which is used to compare and analyze the inspected image obtained by the image construction subsystem and an image of a standard product according to a predetermined rule, and wherein the inspected product is sorted according to the comparison and analysis result of the image analysis subsystem.

11. The X-ray product quality automatic inspection device according to claim 10, wherein the power supply and control device further comprises a display and operation subsystem for displaying at least one of:

operating state of the X-ray product quality automatic inspection device, an inspection image of the inspected product, the inspection and analysis result, and inputting of control instructions.

12. The X-ray product quality automatic inspection device according to claim 1, wherein the X-ray product quality automatic inspection device further comprises a shielding device, which encloses the X-ray radiation region and shields stray X-rays.

13. The X-ray product quality automatic inspection device according to claim 1, wherein the plurality of targets of the distributed X-ray source are arranged in straight line, polyline, arc or the combination thereof.

14. The X-ray product quality automatic inspection device according to claim 1, wherein an arrangement direction of the plurality of targets of the distributed X-ray source is perpendicular to the moving direction of the inspected product.

15. The X-ray product quality automatic inspection device according to claim 1, wherein the detector is one of a flat panel detector having numerous detection units or a detector having a plurality of detection units in a one-dimensional linear array, and or a detector having a plurality of detection units in a two-dimensional matrix array, and is able to receive the X-rays at a plurality of positions at the same time.

16. The X-ray product quality automatic inspection device according to claim 1, wherein a sum of a field angle of the X-rays from the distributed X-ray source to any point on the inspected product and a field angle of the X-rays from the point to the detector is more than 180 degrees.

17. The X-ray product quality automatic inspection device according to claim 1, wherein the distributed X-ray source is a dual-energy X-ray source and/or the detector is a dual energy detector.

18. The X-ray product quality automatic inspection device according to claim 1, wherein a time period during which the plurality of targets at different positions of the distributed X-ray source sequentially emits the X-rays is at a level of microsecond.

19. The X-ray product quality automatic inspection device according to claim 1, wherein the plurality of targets of the distributed X-ray source are arranged in an arc shape or a spiral shape along the moving direction of the inspected product.

20. The X-ray product quality automatic inspection device according to claim 1, wherein the detector is a dual-energy detector.