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IMPROVEMENTS IN OR RELATING TO SUPER-RESOLUTION MICROSCOPY

  • US 20160252718A1
  • Filed: 10/21/2014
  • Published: 09/01/2016
  • Est. Priority Date: 10/21/2013
  • Status: Active Grant
First Claim
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1. A method of processing images captured following structured illumination of a sample, the method comprising the steps of:

  • identifying emission spots within each captured image;

    verifying the emission spots; and

    reconstructing an enhanced image of the sample from the emission spots.

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