IMPROVEMENTS IN OR RELATING TO SUPER-RESOLUTION MICROSCOPY

• US 20160252718A1
• Filed: 10/21/2014
• Published: 09/01/2016
• Est. Priority Date: 10/21/2013
• Status: Active Grant

• Current Assignee: University of Leicester
• Original Assignee: University of Leicester
• Inventors: Hartell, Nicholas Anthony
• Granted Patent: US 9,946,060 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G02B 21/06 Means for illuminating specimens
• CPC Class Codes: G02B 21/361 Optical details, e.g. image relay to the camera or image sensor G02B21/364 takes precedence; illumination details G02B21/06 and subgroups
• CPC Class Codes: G02B 21/367 providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
• CPC Class Codes: G02B 27/58 Optics for apodization or superresolution; Optical synthetic aperture systems

Abstract

The present invention relates to a method of processing images captured following structured illumination of a sample, the method comprising the steps of: identifying emission spots within each captured image; verifying the emission spots; and reconstructing an enhanced image of the sample from the emission spots. The method may comprise identifying only in focus emission spots. By identifying and processing only in focus spots, whether or not they are centred on expected illumination positions, improvements in resolution can be achieved compared to known SIM methods. In particular, by suitable selection of in focus spots, significant improvements in lateral and axial resolution can be achieved.

Claims

1. A method of processing images captured following structured illumination of a sample, the method comprising the steps of:

identifying emission spots within each captured image;

verifying the emission spots; and

reconstructing an enhanced image of the sample from the emission spots.

2. A method as claimed in claim 1 wherein the method comprises the steps of:

identifying emission spots within each captured image;

determining the centre of each identified spot;

extracting a subimage concentric with each identified spot;

enhancing each subimage;

replacing the extracted subimages with the enhanced subimages; and

generating an enhanced image comprising the enhanced subimages.

3. A method as claimed in claim 1 wherein the step of identifying emission spots comprises iteratively fitting multiple point spread functions to regions of image data which appear to contain overlapping signals.

6. A method as claimed in claim 1, wherein the step of identifying emission spots comprises the steps of:

extracting emission spot co-ordinates from potentially overlapping image data by first calculating the expected image from each possible emission spot position; and

determining the emission spot positions that give rise to real signals in light of this complete prior knowledge.

7. A method as claimed in claim 1, wherein the step of reconstructing an enhanced image comprises the steps of calculating a 2D histogram of the emission spot positions with a chosen square bin size, which may correspond to the pixel size of the composite image;

and displaying the histogram as a pixelated image whose local intensity is proportional to the bin occupancy.

8. A method as claimed in claim 1, wherein the step of reconstructing an enhanced image comprises forming a Quad-Tree Based Adaptive Histogram based on a quad-tree representation of the localization data.

9. A method according to claim 1, wherein only in focus spots, are identified and processed, wherein in focus spots are identified if their diameters match the diameter of the expected point spread function (PSF) of the collection optics.

11. A method according to claim 1, wherein spots are identified using a generalised likelihood ratio test (GLRT) segmentation method based on spot diameter and signal to noise ratio.

19. A method as claimed in claim 8, wherein the method includes the further step of selecting the axial focus of the images by selecting the PSF diameter and/or threshold value.

20. A method as claimed in claim 1, wherein the centre of each identified spot is determined by using nonlinear curve fitting of a symmetric Gaussian function with a fixed standard deviation.

22. A method as claimed in claim 2, wherein subimage enhancement is carried out using a Gaussian mask or scaling the subimage.

24. A method as claimed in claim 1, wherein the method includes the further step of generating a composite image from a sequence of enhanced images.

25. A method as claimed in claim 24 wherein the method includes the additional steps of generating composite images under differing conditions and comparing said composite images.

26. A method as claimed in claim 24 wherein the method includes the steps of comparing emissions spots at said selected locations over the sequence of images used to generate a composite image.

27. A super-resolution imaging technique comprising the steps of:

selectively illuminating a series of separated points of a specimen;

capturing images resulting from said illumination; and

processing said images according to the method of claim 1.

30. A method as claimed in claim 27, wherein the illuminated spots are arranged according to a grid pattern determined iteratively.

34. A method as claimed in claim 27, wherein each illumination pattern is used to generate an enhanced image.

35. A method as claimed in claim 34 wherein the method includes the further step of generating a composite image from a sequence of enhanced images, wherein the number of images in the sequence is related to the number of illumination points in an illumination pattern.

37. An apparatus for super-resolution imaging, the apparatus comprising:

a programmable illumination arrangement operable to selectively illuminate a series of separated points of a specimen;

a detection arrangement operable to capture images resulting from said illumination; and

processing means operable to process captured images according to the method of claim 1.

42. An apparatus as claimed in claim 37, wherein the programmable illumination arrangement comprises:

a laser beam steering means including acousto-optic deflectors (AODs);

and compensation means including an acousto-optic modulator (AOM).

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