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PARASITIC CAPACITANCE CANCELLATION IN CAPACITIVE MEASUREMENT

  • US 20160282393A1
  • Filed: 06/05/2016
  • Published: 09/29/2016
  • Est. Priority Date: 10/15/2008
  • Status: Active Grant
First Claim
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1. An integrated circuit for measuring an inductance of an inductive structure, wherein said integrated circuit comprises:

  • charge transfer circuitry for transferring charge during each of a plurality of measurement cycles from said inductive structure to a reference capacitor, and wherein the charge accumulated in the reference capacitor is reduced during every cycle in the inductance measurement by a predetermined amount of charge, and wherein the charge being transferred for measurement is scaled using at least one current mirror structure.

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