DYNAMIC ERROR CODE, FAULT LOCATION, AND TEST & TROUBLESHOOTING USER EXPERIENCE CORRELATION/VISUALIZATION SYSTEMS AND METHODS

• US 20160342451A1
• Filed: 03/18/2016
• Published: 11/24/2016
• Est. Priority Date: 05/19/2015
• Status: Active Grant

• Current Assignee: the united states of america as represented by the secretary of the navy
• Original Assignee: the united states of america as represented by the secretary of the navy
• Inventors: Ly, Paul
• Granted Patent: US 9,983,919 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G06F 11/0739 in a data processing system embedded in automotive or aircraft systems
• CPC Class Codes: G06F 11/0769 Readable error formats, e.g. cross-platform generic formats, human understandable formats
• CPC Class Codes: G06F 11/079 Root cause analysis, i.e. error or fault diagnosis in a hardware test environment G06F11/22; in a software test environment G06F11/36

Abstract

An apparatus and method for testing and troubleshooting systems, such as remote systems, have been developed that provide for a test control system configured to perform testing on a system under test. The test control system may include an electronic device operable to display a system fault code failure matrix visualization that may include fault codes and/or fault locations for one or more subsystems of a SUT. The test control system may also include an aggregated subsystem fault locations database that stores previously identified system or subsystem fault locations of the SUT that may lead to a source of an issue causing a particular fault code for the SUT, where the electronic device is operable to access the aggregated subsystem fault locations database to obtain the various previously identified fault locations. The previously identified system or subsystem fault locations may be based on previous testing of a system or subsystem.

Claims

1. A method for testing a system under test (SUT) comprising:

obtaining, by an electronic device, a plurality of potential subsystem fault codes for the at least one subsystem of the SUT from an aggregated subsystem fault locations database;

providing, by the electronic device, a system fault code failure matrix for display that maps at least one subsystem of the SUT to a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receiving, by the electronic device, an indication of a selection of the at least one subsystem of the SUT;

providing, by the electronic device, a subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receiving, by the electronic device, an indication of a fault code for a fault of the at least one subsystem of the SUT;

determining, by the electronic device, that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

obtaining, by the electronic device, at least one subsystem fault location from the aggregated subsystem fault locations database, wherein the aggregated subsystem fault locations database aggregates a plurality of previously identified subsystem fault locations for each of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

providing, by the electronic device, an indication of the at least one subsystem fault location for testing of the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

2. The method of claim 1 further comprising, in response to determining that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, providing, by the electronic device, an indication of at least one fault isolation test to be performed on the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

3. The method of claim 1 further comprising:

receiving, by the electronic device, an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful; and

providing, by the electronic device, another indication of at least another subsystem fault location for testing of the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

4. The method of claim 1 further comprising:

receiving, by the electronic device, an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful;

receiving, by the electronic device, an indication of a new subsystem fault location for testing of the at least one subsystem of the SUT, wherein testing of the new subsystem fault location led to a source of the fault code for the fault of the at least one subsystem of the SUT; and

re-providing, by the electronic device, the subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT and at least one associated subsystem fault location for testing of the at least one subsystem of the SUT including the new subsystem fault location.

5. The method of claim 4 further comprising providing, by the electronic device, the new subsystem fault location to the aggregated subsystem fault locations database to be included in the plurality of previously identified subsystem fault locations, for the fault code for the at least one subsystem of the SUT, aggregated in the aggregated subsystem fault locations database.

6. The method of claim 1 wherein providing the indication of the at least one subsystem fault location for testing of the at least one subsystem of the SUT comprises providing, by the electronic device, a plurality of troubleshooting steps to be taken at the at least one subsystem fault location.

7. The method of claim 1 wherein providing the indication of the at least one subsystem fault location for testing of the at least one subsystem of the SUT comprises providing, by the electronic device, a plurality of the at least one subsystem fault locations in an order of most probable subsystem fault location to test to least probably subsystem fault location to test, wherein the probability of the subsystem fault locations is based on a number of times a particular subsystem fault location led to the source of the one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT.

8. A test control system configured to perform testing on a system under test (SUT) to produce one or more fault codes in response to a subsystem failure of at least one subsystem of the SUT comprising:

a display;

an input/output system configured to interact with an operator of the test control system;

an aggregated subsystem fault locations database that stores a plurality of previously identified subsystem fault locations for each of a plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

a processor operatively coupled to the display, to the input/output system, and to the aggregated subsystem fault locations database, and configured to;

obtain, from the aggregated subsystem fault locations database, a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

provide a first visualization for display that includes a system fault code failure matrix that maps at least one subsystem of the SUT to a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive, from the input/output system, an indication of a selection of the at least one subsystem of the SUT;

provide a second visualization for display that includes a subsystem fault code failure matrix that indicates the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive, from the input/output system, an indication of a fault code for a fault of the at least one subsystem of the SUT;

determine that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

obtain, from the aggregated subsystem fault locations database, at least one subsystem fault location wherein the aggregated subsystem fault locations database aggregates a plurality of previously identified subsystem fault locations for each of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

provide a third visualization for display that includes an indication of at least one subsystem fault location for testing of the at least one subsystem of the SUT to determine the fault of the at least one subsystem of the SUT.

9. The test control system of claim 8 wherein the processor is operable to provide, in response to determining that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, a fourth visualization for display that includes an indication of at least one fault isolation test to be performed on the at least one subsystem of the SUT to determine the fault of the at least one subsystem of the SUT.

10. The test control system of claim 8 wherein the processor is operable to:

receive, from the input/output system, an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful; and

provide a fourth visualization for display that includes another indication of at least another subsystem fault location for testing of the at least one subsystem of the SUT to determine the fault of the at least one subsystem of the SUT.

11. The test control system of claim 8 wherein the processor is operable to:

receive, from the input/output system, an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful;

receive, from the input/output system, an indication of a new subsystem fault location for testing of the at least one subsystem of the SUT, wherein testing of the new subsystem fault location led to a source of the fault code for the fault of the at least one subsystem of the SUT; and

re-provide the third visualization for display that includes the subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT and at least one associated subsystem fault location for testing of the at least one subsystem of the SUT including the new subsystem fault location.

12. The test control system of claim 11 wherein the processor is operable to provide the new subsystem fault location to the aggregated subsystem fault locations database to be included in the plurality of previously identified subsystem fault locations, for the fault code for the at least one subsystem of the SUT, aggregated in the aggregated subsystem fault locations database.

13. The test control system of claim 8 wherein the processor is operable to provide for display a plurality of troubleshooting steps to be taken at the at least one subsystem fault location.

14. The test control system of claim 8 wherein:

the aggregated subsystem fault locations database is operable to provide to the processor a plurality of the at least one subsystem fault locations with an indication of a probability of success for each of the plurality of the at least one subsystem fault locations, wherein the probability of each of the plurality of the at least one subsystem fault locations is based on a number of times a particular subsystem fault location led to the source of the one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

the processor is operable to provide the plurality of the at least one subsystem fault locations in an order of most probable subsystem fault location to test to least probably subsystem fault location to test, wherein the probability of the subsystem fault locations is based on a number of times a particular subsystem fault location led to the source of the one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT.

15. An electronic device comprising:

a processor; and

a non-transitory computer readable medium comprising executable instructions that when executed by the processor causes the processor to;

obtain a plurality of potential subsystem fault codes for the at least one subsystem of the SUT from an aggregated subsystem fault locations database;

provide a system fault code failure matrix for display that maps at least one subsystem of the SUT to a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive an indication of a selection of the at least one subsystem of the SUT;

provide a subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive an indication of a fault code for a fault of the at least one subsystem of the SUT;

determine that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

obtain at least one subsystem fault location from the aggregated subsystem fault locations database, wherein the aggregated subsystem fault locations database aggregates a plurality of previously identified subsystem fault locations for each of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

provide an indication of the at least one subsystem fault location for testing of the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

16. The electronic device of claim 15 wherein the executable instructions cause the processor to:

in response to determining that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, provide an indication of at least one fault isolation test to be performed on the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

17. The electronic device of claim 15 wherein the executable instructions cause the processor to:

receive an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful; and

provide another indication of at least another subsystem fault location for testing of the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

18. The electronic device of claim 15 wherein the executable instructions cause the processor to:

receive an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful;

receive an indication of a new subsystem fault location for testing of the at least one subsystem of the SUT, wherein testing of the new subsystem fault location led to a source of the fault code for the fault of the at least one subsystem of the SUT; and

re-provide the subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT and at least one associated subsystem fault location for testing of the at least one subsystem of the SUT including the new subsystem fault location.

19. The electronic device of claim 18 wherein the executable instructions cause the processor to provide the new subsystem fault location to the aggregated subsystem fault locations database to be included in the plurality of previously identified subsystem fault locations, for the fault code for the at least one subsystem of the SUT, aggregated in the aggregated subsystem fault locations database.

20. The electronic device of claim 15 wherein the executable instructions cause the processor to provide a plurality of troubleshooting steps to be taken at the at least one subsystem fault location.

21. The electronic device of claim 15 wherein the executable instructions cause the processor to provide a plurality of the at least one subsystem fault locations in an order of most probable subsystem fault location to test to least probably subsystem fault location to test, wherein the probability of the subsystem fault locations is based on a number of times a particular subsystem fault location led to the source of the one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT.

22. A test control system configured to perform testing on a system under test (SUT) to produce one or more fault codes in response to a subsystem failure of at least one subsystem of the SUT comprising:

an aggregated subsystem fault locations database that stores a plurality of previously identified subsystem fault locations for each of a plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein the aggregated subsystem fault locations database is operable to provide a plurality of the at least one subsystem fault locations with an indication of a probability of success for each of the plurality of the at least one subsystem fault locations, wherein the probability of each of the plurality of the at least one subsystem fault locations is based on a number of times a particular subsystem fault location led to the source of the one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

an electronic device comprising;

a display;

an input/output system configured to interact with an operator of the test control system; and

a processor operatively coupled to the display, to the input/output system, and to the aggregated subsystem fault locations database, and configured to;

obtain, from the aggregated subsystem fault locations database, a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

provide a first visualization for display that includes a system fault code failure matrix that maps at least one subsystem of the SUT to a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive, from the input/output system, an indication of a selection of the at least one subsystem of the SUT;

provide a second visualization for display that includes a subsystem fault code failure matrix that indicates the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

receive, from the input/output system, an indication of a fault code for a fault of the at least one subsystem of the SUT;

determine that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

obtain, from the aggregated subsystem fault locations database, at least one subsystem fault location;

provide a third visualization for display that includes an indication of at least one subsystem fault location for testing of the at least one subsystem of the SUT to determine the fault of the at least one subsystem of the SUT;

receive, from the input/output system, an indication that testing of the at least one subsystem fault location for testing of the at least one subsystem of the SUT was successful;

receive, from the input/output system, an indication of a new subsystem fault location for testing of the at least one subsystem of the SUT, wherein testing of the new subsystem fault location led to a source of the fault code for the fault of the at least one subsystem of the SUT;

provide the new subsystem fault location for testing of the at least one subsystem of the SUT to the aggregated subsystem fault locations database, wherein the aggregated subsystem fault locations database calculates the probability of success for each of the plurality of the at least one subsystem fault locations including the new subsystem fault location; and

re-provide the third visualization for display that includes the subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT and at least one associated subsystem fault location for testing of the at least one subsystem of the SUT including the new subsystem fault location.

23. A fault diagnostic system comprising:

a test system configured to perform testing on a system under test (SUT) to produce one or more fault codes (FC) in response to a system failure of the SUT; and

a diagnostic system comprising a display, a processor, and a storage medium operable to store a plurality of machine readable instructions that when executed by the processor cause the processor to generate a first, second, third, and fourth user experience (UX) and visualization on said display configured to graphically and textually interact with an operator using a plurality of graphical user interface (GUI) elements, wherein said first UX/visualization comprises a flow chart visualization comprising a plurality of troubleshooting steps, said second UX/visualization comprises a first system block diagram at a center section comprising a plurality of subsystems for the SUT and a plurality of first fault code fault location matrixes (FCFLM) associated with each said plurality of subsystems displayed around a periphery of the first system block diagram, wherein each FCFLM comprises a plurality of fault codes (FC) and related fault locations (FL) which are associated with previously identified FLs which have been a source of the FC as recorded by previous test and troubleshooting (TTA) activities, said third UX/visualization comprises a detail view of said FCFLM comprising said FCs and FLs, and said fourth UX/visualization comprises a search GUI associated with an element of said first UX/visualization process flow chart which enables a user to input a FC which then toggles to one of said third UX/visualizations associated with an input FC, wherein said first UX/visualization is configured to toggle between said first UX/visualization and said second through fourth UX/visualizations, said first UX/visualization is further configured to present a GUI element which selects or deselects a FL associated with a FC input so as to permit a reselection of a FC to generate a new FC/FL FCFLM display element if a previously selected FC/FL is determined not to clear a fault.

24. A process for performing diagnostics comprising:

providing a test system configured to perform testing on a system under test (SUT) to produce one or more fault codes (FC) in response to a system failure of the SUT;

providing a diagnostic system comprising a display, a storage medium operable to store a plurality of machine readable instructions that when executed by a processor cause the processor to generate a first, second, third, and fourth user experience (UX) and visualization on said display configured to graphically and textually interact with an operator using a plurality of graphical user interface (GUI) elements, wherein said first UX/visualization comprises a flow chart visualization comprising a plurality of troubleshooting steps, said second UX/visualization comprises a first system block diagram at a center section comprising a plurality of subsystems for the SUT and a plurality of first fault code fault location matrixes (FCFLM) associated with each said plurality of subsystems displayed around a periphery of the first system block diagram, wherein each FCFLM comprises a plurality of fault codes (FC) and related fault locations (FL) which are associated with previously identified FLs which have been a source of the FC as recorded by previous test and troubleshooting (TTA) activities, said third UX/visualization comprises a detail view of said FCFLM comprising said FCs and FLs, and said fourth UX/visualization comprises a search GUI associated with an element of said first UX/visualization process flow chart which enables a user to input a FC which then toggles to one of said third UX/visualizations associated with an input FC, wherein said first UX/visualization is configured to toggle between said first UX/visualization and said second through fourth UX/visualizations, said first UX/visualization is further configured to present a GUI element which selects or deselects a FL associated with a FC input so as to permit a reselection of a FC to generate a new FC/FL FCFLM display element if a previously selected FC/FL is determined not to clear a fault; and

operating said test system and said diagnostic system on a SUT to determine a fault based on FC/FL identified TT As and determining that a TT A and corrective action at a selected FL has cleared the fault code by rerunning said test system which does not produce a previously displayed FC.

25. The process of claim 24, further comprising:

attempting TTAs and corrective actions at all FC/FLs shown by said first through fourth UX/visualizations and said test system continues to determine that the previously displayed FC continues to exist;

performing additional TTAs based on diagnostics from a source outside the diagnostic system and identifying a cause of the FC and successfully performing corrective action to clear the FC; and

adding a new FC/FL based on the additional TTA information to a diagnostic system'"'"'s database containing the FC/FL correlation data.