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DYNAMIC ERROR CODE, FAULT LOCATION, AND TEST & TROUBLESHOOTING USER EXPERIENCE CORRELATION/VISUALIZATION SYSTEMS AND METHODS

  • US 20160342451A1
  • Filed: 03/18/2016
  • Published: 11/24/2016
  • Est. Priority Date: 05/19/2015
  • Status: Active Grant
First Claim
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1. A method for testing a system under test (SUT) comprising:

  • obtaining, by an electronic device, a plurality of potential subsystem fault codes for the at least one subsystem of the SUT from an aggregated subsystem fault locations database;

    providing, by the electronic device, a system fault code failure matrix for display that maps at least one subsystem of the SUT to a plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

    receiving, by the electronic device, an indication of a selection of the at least one subsystem of the SUT;

    providing, by the electronic device, a subsystem fault code failure matrix for display indicating the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

    receiving, by the electronic device, an indication of a fault code for a fault of the at least one subsystem of the SUT;

    determining, by the electronic device, that the received indication of the fault code identifies with at least one potential subsystem fault code of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT;

    obtaining, by the electronic device, at least one subsystem fault location from the aggregated subsystem fault locations database, wherein the aggregated subsystem fault locations database aggregates a plurality of previously identified subsystem fault locations for each of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT, wherein previous testing of the plurality of previously identified subsystem fault locations has led to a source of one or more of the plurality of potential subsystem fault codes for the at least one subsystem of the SUT; and

    providing, by the electronic device, an indication of the at least one subsystem fault location for testing of the at least one subsystem of the SUT for display to determine the fault of the at least one subsystem of the SUT.

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