Battery Life Time Management
First Claim
Patent Images
1. A method for managing the lifetime of a battery, the method comprising:
- measuring an ambient temperature near a battery;
detecting that the ambient temperature rises above a first threshold; and
in response to detecting that the ambient temperature rises above the first threshold, discharging the battery.
2 Assignments
0 Petitions
Accused Products
Abstract
A method for managing the lifetime of a battery is disclosed herein. An ambient temperature is measured near a battery. The ambient temperature rises above a first threshold and, in response to detecting that the ambient temperature has risen above the first threshold, the battery is discharged. A battery system and a device operable with a battery are also disclosed.
11 Citations
20 Claims
-
1. A method for managing the lifetime of a battery, the method comprising:
-
measuring an ambient temperature near a battery; detecting that the ambient temperature rises above a first threshold; and in response to detecting that the ambient temperature rises above the first threshold, discharging the battery. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
-
-
14. A battery system comprising:
-
a main battery configured to provide power to a load; a discharge circuit coupled to the main battery and configured to discharge batteries; a temperature sensor configured to measure an ambient temperature of the main battery; and a microcontroller coupled to the temperature sensor and the discharge circuit, wherein the microcontroller is configured to control the discharge circuit to discharge the main battery when the ambient temperature rises above a first temperature threshold. - View Dependent Claims (15, 16, 17)
-
-
18. A device operable with a battery, the device comprising:
-
a temperature measurement element configured to measure an ambient temperature near the battery; a discharge circuit configured to cause the battery to discharge; a bias circuit configured to apply voltages across batteries; a microcontroller coupled to the temperature measurement element and configured to control the discharge circuit and the bias circuit; program memory coupled to the microcontroller; parameter memory coupled to the microcontroller; and a clock mechanism coupled to the microcontroller. - View Dependent Claims (19, 20)
-
Specification