MODULAR PLUG-AND-PLAY SYSTEM FOR CONTINUOUS MODEL DRIVEN TESTING

• US 20170017566A1
• Filed: 07/17/2015
• Published: 01/19/2017
• Est. Priority Date: 07/17/2015
• Status: Active Grant

• Current Assignee: Magine Holding AB (Magine AB)
• Original Assignee: Magine Holding AB (Magine AB)
• Inventors: Lundstrom, Johan
• Granted Patent: US 9,916,231 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G06F 11/3672 Test management
• CPC Class Codes: G06F 11/3684 for test design, e.g. generating new test cases
• CPC Class Codes: G06F 11/3688 for test execution, e.g. scheduling of test suites

Abstract

A method for testing an application running on an electronic device includes parsing, by a test processor, a state model of the application representing relationships among a plurality nodes, each node representing an application state. The method further includes parsing, by the test processor, a test implementation file including a plurality of commands for manipulating at least one of the application and the electronic device, each of the plurality of commands associated with respective ones of the plurality of nodes, traversing, by the test processor, the state model of the application by selecting for testing an application node in accordance with the node relationships in the state model. The method also includes selecting, by the test processor, one or more of the plurality of commands for testing the application based on at least one criteria, and executing, by the test processor, the one or more selected commands.

Claims

1. A method for testing an application running on an electronic device, the method comprising:

parsing, by a test processor, a state model of the application representing relationships among a plurality nodes, each node representing an application state;

parsing, by the test processor, a test implementation file including a plurality of commands for manipulating at least one of the application and the electronic device, each of the plurality of commands associated with respective ones of the plurality of nodes;

traversing, by the test processor, the state model of the application by selecting for testing an application node in accordance with the node relationships in the state model;

selecting, by the test processor, one or more of the plurality of commands for testing the application based on at least one criteria; and

executing, by the test processor, the one or more selected commands.

2. The method of claim 1 wherein the at least one criteria is a random selection.

3. The method of claim 1 wherein the at least one criteria is a weight assigned to the one or more of the plurality of commands.

4. The method of claim 1 further comprising:

detecting, by the test processor, that a connection session with the electronic device was terminated; and

resuming, by the test processor, traversing of the state model of the application.

5. The method of claim 4 wherein the test processor resumes the traversing of the state model of the application from one of a predetermined application node and an application node for which the one or more selected commands were executing prior to the detection.

6. The method of claim 1 wherein the electronic device is selected from the group consisting of a mobile device, a mobile phone, a tablet computer, a computer, a set top box, and a television.

7. The method of claim 1 wherein the application is a video streaming interface.

8. The method of claim 1 further comprising generating a heat map graphical representation of application errors for each node in the state model.

9. The method of claim 1 further comprising assigning, by the test processor, a priority to an error based on maintaining a log of known errors.

10. The method of claim 1 wherein the electronic device is connected to the test processor via one of a wired connection and a wireless connection.

11. An apparatus for testing an application running on an electronic device comprising:

a test processor; and

memory, coupled to the test processor, having stored thereon computer readable instructions executed by the test processor, the instructions comprising;

parsing, by the test processor, a state model of the application representing relationships among a plurality nodes, each node representing an application state;

parsing, by the test processor, a test implementation file including a plurality of commands for manipulating at least one of the application and the electronic device, each of the plurality of commands associated with respective ones of the plurality of nodes;

traversing, by the test processor, the state model of the application by selecting for testing an application node in accordance with the node relationships in the state model;

selecting, by the test processor, one or more of the plurality of commands for testing the application based on at least one criteria; and

executing, by the test processor, the one or more selected commands.

12. The apparatus of claim 11 wherein the at least one criteria is a random selection.

13. The apparatus of claim 11 wherein the at least one criteria is a weight assigned to the one or more of the plurality of commands.

14. The apparatus of claim 11, wherein the instructions further include:

detecting, by the test processor, that a connection session with the electronic device was terminated; and

resuming, by the test processor, traversing of the state model of the application.

15. The apparatus of claim 14 wherein the test processor resumes the traversing of the state model of the application from one of a predetermined application node and an application node for which the one or more selected commands were executing prior to the detection.

16. The apparatus of claim 11 wherein the electronic device is selected from the group consisting of a mobile device, a mobile phone, a tablet computer, a computer, a set top box, and a television.

17. The apparatus of claim 11 wherein the application is a video streaming interface.

18. The apparatus of claim 11 wherein the test processor generates a heat map graphical representation of application errors for each node in the state model.

19. The apparatus of claim 11 wherein the test processor assigns a priority to an error based on maintaining a log of known errors.

20. The apparatus of claim 11 wherein the electronic device is connected to the test processor via one of a wired connection and a wireless connection.