SEMICONDUCTOR DEVICE, INFRARED IMAGING DEVICE EQUIPPED WITH THE SEMICONDUCTOR DEVICE, AND METHOD FOR CONTROLLING SEMICONDUCTOR DEVICE
First Claim
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1. A semiconductor device comprising:
- at least one bolometer element; and
a bias circuit including a bias voltage applying unit which applies bias voltage to the bolometer element, and inputting difference current between current flowing through the bolometer element when the bias voltage is applied with the bolometer element, and current from a bias-cancelling circuit eliminating offset current of the bolometer element, to an integration circuit, whereinthe bias circuit further includes a pre-charge unit which pre-charges the bolometer element with predetermined pre-charge voltage.
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Abstract
The purpose of the present invention is to shorten the time needed for the terminal voltage of a bolometer element to converge to bias voltage, shorten the reset interval of an integration circuit, and improve the temperature resolution. This semiconductor device is provided with a means for presenting a bias voltage to a bolometer element. A bias circuit that inputs to an integration circuit the differential current of the current flowing to the bolometer element when the bias voltage is presented to the bolometer element, and the current from a bias cancel circuit that eliminates offset current of the bolometer element, pre-charges the bolometer element at a prescribed pre-charge voltage.
40 Citations
21 Claims
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1. A semiconductor device comprising:
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at least one bolometer element; and a bias circuit including a bias voltage applying unit which applies bias voltage to the bolometer element, and inputting difference current between current flowing through the bolometer element when the bias voltage is applied with the bolometer element, and current from a bias-cancelling circuit eliminating offset current of the bolometer element, to an integration circuit, wherein the bias circuit further includes a pre-charge unit which pre-charges the bolometer element with predetermined pre-charge voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for controlling a semiconductor device, comprising:
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inputting difference current between current flowing through a bolometer element when bias voltage is applied with the bolometer element from a bias circuit, and current from a bias-cancelling circuit eliminating offset current of the bolometer element, to an integration circuit, and outputting an integrated value of the difference current; and pre-charging the bolometer element with predetermined pre-charge voltage. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21)
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Specification