METHOD AND APPARATUS FOR CALCULATING THE JUNCTION TEMPERATURE OF AN RF POWER MOSFET
First Claim
1. A method for calculating the junction temperature of an RF power MOSFET, comprising steps of:
- establishing a transient thermal impedance model of the RF power MOSFET in analog domain;
calculating a transfer function in time domain of the transient thermal impedance model using bilinear transformation;
selecting a preferable sampling frequency and a preferable type of second order infinite impulse response (IIR) filter structure to establish a junction temperature compensation model in digital domain based on the transfer function in time domain of the transient thermal impedance model; and
calculating the junction temperature of the RF power MOSFET by inputting an actual input to the junction temperature compensation model.
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Abstract
There are provided a method and apparatus for calculating the junction temperature of an RF power MOSFET. The method for calculating the junction temperature of an RF power MOSFET, comprising steps of: establishing a transient thermal impedance model of the RF power MOSFET in analog domain; calculating a transfer function in time domain of the transient thermal impedance model using bilinear transformation; establishing a junction temperature compensation model in digital domain based on the transfer function in time domain of the transient thermal impedance model with a sampling frequency and a type of 2nd order IIR filter structure; and calculating the junction temperature of the RF power MOSFET by inputting an actual input to the junction temperature compensation model. The present invention improves accuracy in determining the junction temperature of an RF power MOSFET.
4 Citations
16 Claims
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1. A method for calculating the junction temperature of an RF power MOSFET, comprising steps of:
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establishing a transient thermal impedance model of the RF power MOSFET in analog domain; calculating a transfer function in time domain of the transient thermal impedance model using bilinear transformation; selecting a preferable sampling frequency and a preferable type of second order infinite impulse response (IIR) filter structure to establish a junction temperature compensation model in digital domain based on the transfer function in time domain of the transient thermal impedance model; and calculating the junction temperature of the RF power MOSFET by inputting an actual input to the junction temperature compensation model. - View Dependent Claims (2, 3, 4, 5, 6, 7, 16)
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8. An apparatus for calculating the junction temperature of an RF power MOSFET, comprising:
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a first establishing unit configured to establish a transient thermal impedance model of the RF power MOSFET in analog domain; a first calculating unit configured to calculate a transfer function in time domain of the transient thermal impedance model using bilinear transformation; a second establishing unit configured to establish a junction temperature compensation model in digital domain based on the transfer function in time domain of the transient thermal impedance model by selecting a preferable sampling frequency and a preferable type of a second order infinite impulse response (IIR) filter structure; and a second calculating unit configured to calculate the junction temperature of the RF power MOSFET by inputting an actual input to the junction temperature compensation model. - View Dependent Claims (9, 11, 12, 13, 14, 15)
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10. (canceled)
Specification