PHOTONIC-CHANNELED X-RAY DETECTOR ARRAY

• US 20170038481A1
• Filed: 08/05/2016
• Published: 02/09/2017
• Est. Priority Date: 08/07/2015
• Status: Active Grant

• Current Assignee: Board of Trustees of the Leland Stanford Junior University (Stanford Management Co.), University of Arizona
• Original Assignee: Board of Trustees of the Leland Stanford Junior University (Stanford Management Co.)
• Inventors: Kim, Young-Sik, Takashima, Yuzuru, Yuen, Max, Cheng, Yao-Te, Hesselink, Lambertus
• Granted Patent: US 9,772,407 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01N 23/041 Phase-contrast imaging, e.g. using grating interferometers
• CPC Class Codes: G01T 1/2002 Optical details, e.g. reflecting or diffusing layers
• CPC Class Codes: G01T 1/20185 Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
• CPC Class Codes: G01T 1/2023 Selection of materials see provisionally also G01T1/202
• CPC Class Codes: G21K 2207/005 Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Abstract

An X-ray detector array includes a scintillator that converts input X-ray radiation to secondary optical radiation output from the scintillator, a first telecentric micro lens array that array receives the secondary optical radiation, a phase coded aperture, where the first telecentric micro lens array directs the secondary optical radiation on the phase coded aperture, a second telecentric micro lens array, where the secondary optical radiation output from the phase coded array is directed to the second telecentric micro lens array, a patterned grating mask, where the second telecentric micro lens array directs the optical beam on the patterned mask, and a photodetector array, where the patterned mask outputs the optical beam in a pattern according to the patterned mask to the photodetector array, where the photodetector array outputs a signal, where a photon fringe pattern is imaged and sampled in the wavelength domain of the radiation from the scintillator.

Claims

1. ) An X-ray detector array, comprising:

a) a scintillator, wherein said scintillator converts an input X-ray radiation to a secondary optical radiation, wherein said secondary optical radiation is output from said scintillator;

b) a first telecentric micro lens array wherein said telecentric micro lens array receives said secondary optical radiation;

c) a phase coded aperture, wherein said first telecentric micro lens array directs said secondary optical radiation on said phase coded aperture;

d) a second telecentric micro lens array, wherein said secondary optical radiation output from said phase coded array is directed to said second telecentric micro lens array;

e) a patterned grating mask, wherein said second telecentric micro lens array directs said optical beam on said patterned mask; and

f) a photodetector array, wherein said patterned mask outputs said optical beam in a pattern according to said patterned mask to said photodetector array, wherein said photodetector array outputs a signal, wherein a photon fringe pattern is imaged and sampled in the wavelength domain of said radiation from said scintillator.

2. ) The X-ray detector array according to claim 1, wherein said scintillator comprises a CsI scintillator crystal.

3. ) The X-ray detector array according to claim 1, wherein said phase coded aperture comprises a phase plate, wherein said phase plate comprises a cubic phase profile, wherein said phase plate is placed at a Fourier plane of said first telecentric micro lens array, wherein said phase plate is disposed to modify a point spread function, wherein said modified point spread function in an x-direction is constant over a depth of focus, wherein a point spread function in a y-direction increases with defocusing.

4. ) The X-ray detector array according to claim 1, wherein said patterned grating mask comprises a chromium patterned grating mask.

5. ) The X-ray detector array according to claim 4, wherein said grating mask comprises a photo processed absorption time mask.

6. ) The X-ray detector array according to claim 1, wherein said scintillator crystal has a thickness in a range of 0.001-1 mm.

7. ) The X-ray detector array according to claim 1, wherein each said telecentric micro lens array is arranged to form a 4-f imaging system.

8. ) The X-ray detector array according to claim 1, wherein said patterned grating mask is placed at a focal plane of said second telecentric micro lens array.

9. ) The X-ray detector array according to claim 1, wherein said X-ray detector array comprises a depth of focus configured to detect a distortion of an X-ray fringe while capturing photons from an entire volume of said scintillator.