ELECTRICAL ISOLATION FOR A CAMERA IN A TEST AND MEASUREMENT TOOL

• US 20170078544A1
• Filed: 09/12/2016
• Published: 03/16/2017
• Est. Priority Date: 09/16/2015
• Status: Abandoned Application

• Current Assignee: Fluke Corporation (Fortive Corp.)
• Original Assignee: Fluke Corporation (Fortive Corp.)
• Inventors: Ringsrud, Paul A., Huber, Clark N.
• Application Number:
  US15/262,820
• Publication Number:
  US 20170078544A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 15/14 Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
• CPC Class Codes: G01R 15/148 involving the measuring of a magnetic field or electric field G01R15/18, G01R15/20, G01R15/24, G01R15/26 take precedence
• CPC Class Codes: H04N 23/51 Housings
• CPC Class Codes: H04N 23/57 Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

Analysis systems can include both a test and measurement tool for generating measurement data representative of at least one parameter of a device under test and an imaging tool for generating image data representative of a target scene. A processor in communication with the test and measurement circuit and the imaging tool can process measurement data and image data. Isolation circuitry can be configured to provide isolation between the imaging tool and the test and measurement circuit while permitting communication between the processor and each of the test and measurement tool and the imaging tool. A display for presenting measurement data and/or image data can be electrically isolated from the test and measurement tool.

Claims

1. A system comprising

a test and measurement tool comprising a test and measurement circuit, the test and measurement tool configured to generate measurement data representative of at least one parameter of an object under test;

an imaging tool configured to generate image data representative of a target scene;

a processor in communication with the test and measurement tool and the imaging tool and configured to receive and process measurement data and image data for display;

isolation circuitry configured to provide galvanic isolation between the imaging tool and the test and measurement circuit of the test and measurement tool while permitting communication between the processor and each of the test and measurement tool and the imaging tool;

a display in communication with the processor and capable of presenting a display based on the processed measurement data and image data.

2. The system of claim 1, wherein the test and measurement tool and imaging tool are combined into a single combination tool.

3. The system of claim 2, wherein the combination tool comprises a power supply configured to provide electrical power to the test and measurement circuit, the imaging tool, and the processor.

4. The system of claim 3, further comprising

a transformer disposed between the power supply and the test and measurement circuit;

and

an isolating communication channel configured to provide communication between the test and measurement circuit and the processor while maintaining electrical isolation therebetween;

whereby

the test and measurement circuit is electrically isolated from the power supply, the processor, and the imaging tool via the transformer and the isolated communication channel.

5. The system of claim 4, wherein the isolating communication channel comprises an optical isolator.

6. The system of claim 5, wherein the test and measurement circuit is positioned at least predetermined distance from each of the power supply, the processor, and the imaging tool, and wherein the predetermined distance meets IEC 61010 standards.

7. The system of claim 2, wherein the imaging tool is removable from the combination tool.

8. The system of claim 7, wherein the display is in wireless communication with the processor, the test and measurement tool, and/or the imaging tool.

9. The system of claim 1, wherein the imaging tool comprises an infrared camera module configured to generate infrared image data representative of the target scene.

10. The system of claim 9, wherein the imaging tool further comprises a visible light camera module configured to generate visible light image data representative of the target scene.

11. An analysis system comprising:

a high voltage portion comprising;

one or more inputs configured to interface with a device under test and

a test and measurement circuit configured to interface with the one or more inputs and to receive high voltage measurement data from the device under test via the one or more inputs;

a low voltage portion electrically isolated from the high voltage portion, the low voltage portion comprising;

an imaging tool configured to generate image data representative of a target scene and

a display device;

an isolating communication interface configured to facilitate communication between the high voltage portion and the low voltage portion; and

a processor in communication with the test and measurement circuit, the imaging tool, the display device, and the isolating communication interface, the processor being configured to generate display data for presentation on the display device, the display data including one or both of image data and measurement data.

12. The analysis system of claim 11, wherein the processor is positioned in the low voltage portion and communicates with the test and measurement circuit via the isolating communication interface.

13. The analysis system of claim 11, wherein the high voltage portion and the low voltage portion are supported by a single housing.

14. The analysis system of claim 13, wherein all components located in the high voltage portion are separated from all components in the low voltage portion by at least a predetermined distance and/or an insulating material, wherein the predetermined distance meets IEC 61010 standards.

15. The analysis system of claim 13, wherein the housing includes an insulating outer layer surrounding at least the high voltage portion.

16. The system of claim 13, wherein the imaging tool is removable from the housing.

17. The analysis system of claim 11, wherein the low voltage portion further comprises a power supply, and wherein the system further comprises a transformer in communication with the power supply and configured to provide electrical power to the high voltage portion.

18. The analysis system of claim 11, further comprising memory in communication with the processor, the memory being configured to store image data from the imaging tool and/or measurement data from the test and measurement circuit.

19. The analysis system of claim 11, wherein the low voltage portion further comprises a user interface in communication with the processor.

20. A combination tool comprising:

a test and measurement circuit comprising one or more inputs configured to interface with a device under test;

an imaging tool electrically isolated from the test and measurement circuit and comprising at least one camera module configured to generate image data representative of a target scene;

a processor in communication with the test and measurement circuit and the imaging tool; and

a display electrically isolated from the test and measurement circuit and in communication with the processor, the display being configured to present a display based measurement data and/or image data received by the processor.

21. The combination tool of claim 20, wherein the test and measurement circuit, the imaging tool, and the display are supported by a single housing.