MATERIAL TESTING APPARATUS AND METHOD

• US 20170097280A1
• Filed: 03/18/2015
• Published: 04/06/2017
• Est. Priority Date: 03/28/2014
• Status: Active Grant

• Current Assignee: Rtx Corporation
• Original Assignee: United Technologies Corporation (Rtx Corporation)
• Inventors: Drescher, Joseph D., Brindley, William J.
• Granted Patent: US 9,903,781 B2
• Time in Patent Office: Days
• CPC Class Codes: B06B 1/06 operating with piezoelectric effect or with electrostriction piezoelectric or electrostrictive devices per se H10N30/00
• CPC Class Codes: B33Y 50/00 Data acquisition or data processing for additive manufacturing
• CPC Class Codes: G01B 7/14 for measuring distance or clearance between spaced objects or spaced apertures G01B7/30 takes precedence
• CPC Class Codes: G01J 2005/0077 Imaging
• CPC Class Codes: G01J 5/0831 Masks; Aperture plates; Spatial light modulators
• CPC Class Codes: G01J 5/48 Thermography; Techniques using wholly visual means
• CPC Class Codes: G01J 5/59 using polarisation; Details thereof
• CPC Class Codes: G01L 1/20 by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids of piezo-resistive materials G01L1/18; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
• CPC Class Codes: G01L 1/241 by photoelastic stress analysis
• CPC Class Codes: G01L 1/248 using infrared G01L1/241, G01L1/242 take precedence
• CPC Class Codes: G01M 3/08 for pipes, cables or tubes; for pipe joints or seals; for valves; for welds
• CPC Class Codes: G01M 7/022 Vibration control arrangements, e.g. for generating random vibrations
• CPC Class Codes: G01N 3/00 Investigating strength properties of solid materials by application of mechanical stress
• CPC Class Codes: G01N 3/02 Details
• CPC Class Codes: G01N 3/08 by applying steady tensile or compressive forces G01N3/28 takes precedence
• CPC Class Codes: G01N 3/20 by applying steady bending forces G01N3/26, G01N3/28 take precedence
• CPC Class Codes: G01N 3/24 by applying steady shearing forces G01N3/26, G01N3/28 take precedence
• CPC Class Codes: G01N 3/32 by applying repeated or pulsating forces
• CPC Class Codes: G01N 3/38 generated by electromagnetic means

Abstract

A testing apparatus may include a stand having an aperture and a platform adjacent to the aperture, a clamp adjacent to the platform and configured to hold a coupon, and an actuator within the aperture. The actuator is configured to impart a first force on the platform and the coupon at a specified frequency. The testing apparatus may also include a displacement sensor adjacent to the stand and configured to measure a displacement of the coupon and circuitry connected to the actuator and the displacement sensor with the circuitry configured to collect data from the actuator and the displacement sensor.

Claims

1. A testing apparatus comprising:

a stand having an aperture and a platform adjacent to the aperture;

a clamp adjacent to the platform and configured to hold a coupon;

an actuator within the aperture, the actuator configured to impart a first force on the platform and the coupon at a specified frequency;

a displacement sensor adjacent to the stand and configured to measure a displacement of the coupon; and

circuitry connected to the actuator and the displacement sensor, the circuitry configured to collect data from the actuator and the displacement sensor.

2. The testing apparatus of claim 1, wherein a free end of the coupon extends horizontally away from the platform to form a parallel cantilever beam and a fixed end of the coupon is held between the clamp and the platform.

3. The testing apparatus of claim 1, further comprising:

a thermal imaging camera focused on the coupon, the thermal imaging camera connected to the circuitry and configured to convey data to the circuitry.

4. The testing apparatus of claim 2, further comprising:

a load cell adjacent to the free end and configured to measure a second force imparted on the free end, the load cell connected to the circuitry and configured to convey data to the circuitry.

5. The testing apparatus of claim 1, wherein the displacement sensor is in contact with the coupon.

6. The testing apparatus of claim 1, wherein the actuator is a piezoelectric material that is configured to impart a first force on the platform and the coupon at a specified frequency in response to an applied electrical charge.

7. A testing apparatus comprising:

a stand having a platform;

a clamp attached to the stand and configured to hold a fixed end of a test piece;

a displacement sensor adjacent to the stand and configured to measure a displacement of a free end of the test piece;

an actuator adjacent to the free end and configured to impart a vibration force on the free end at a specified frequency;

a load cell adjacent to the free end and configured to measure a static force on the free end; and

circuitry connected to the displacement sensor, actuator, and load cell, the circuitry configured to collect data from the displacement sensor, actuator, and load cell.

8. The testing apparatus of claim 7, further comprising:

a thermal imaging camera focused on the test piece, the thermal imaging camera connected to the circuitry and configured to convey data to the circuitry.

9. The testing apparatus of claim 7, further comprising:

a processor connected to or contained within the circuitry that allows analysis of the data received from the circuitry.

10. The testing apparatus of claim 7, wherein the test piece extends horizontally away from the stand and forms a parallel cantilever.

11. The testing apparatus of claim 7, wherein the actuator is a piezoelectric material configured to impart a vibration force on the free end at a specified frequency in response to an applied electrical charge.

12. A method of testing a work piece, the method comprising:

placing the work piece in a testing apparatus, the testing apparatus includes;

a stand having a platform;

a clamp adjacent to the platform and configured to hold the work piece;

an actuator adjacent to the work piece;

a displacement sensor configured to measure a displacement of the work piece; and

circuitry connected to the actuator and the displacement sensor and configured to collect data;

imparting a force on the work piece; and

collecting data produced by imparting the force and measuring the displacement of the work piece by the displacement sensor.

13. The method of claim 12, wherein the work piece is constructed through additive manufacturing.

14. The method of claim 12, wherein the work piece is representative of an untested designed element and the data collected is correlated with the untested designed element.

15. The method of claim 12, wherein the actuator is a piezoelectric material that is configured to impart force on the work piece in response to an applied electrical charge.

16. The method of claim 12, wherein a free end of the work piece extends away from the platform to form a parallel cantilever beam and a fixed end is held by the clamp.

17. The method of claim 16, wherein the force is applied to the free end and the displacement sensor measures the displacement of the free end.

18. The method of claim 16, wherein the force is applied to the fixed end by the actuator and the displacement sensor measures the displacement of the free end.

19. The method of claim 18, wherein the force is applied to the fixed end by the actuator at a desired frequency.

20. The method of claim 18, wherein the force vibrates the work piece at a frequency and for a duration that causes high cycle fatigue of the work piece.

21. The method of claim 12, further comprising:

observing the work piece with a thermal imaging camera before, during, and after the force has been imparted on the work piece.

22. The method of claim 21, wherein the force vibrates the work piece at a natural resonance frequency.

23. The method of claim 12, further comprising:

analyzing the data received by the circuitry to determine material properties and defects of the work piece.