PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN
First Claim
1. A particle inspection system comprising:
- a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip which detects a fine particle in a sample liquid and outputs a current signal indicative of the fine particle;
a current-voltage conversion circuit which converts, into a voltage signal, the current signal output from the particle inspection (ship when the driving voltage is applied to the particle inspection chip;
a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip; and
an analysis circuit which analyzes the fine particle in the sample liquid based on the voltage signal,wherein the voltage driving circuit varies the driving voltage based on a detection result of the detection circuit.
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Accused Products
Abstract
According to one embodiment, a particle inspection system includes a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip, a current-voltage conversion circuit which converts, into a voltage signal, a current signal output from the particle inspection chip when the driving voltage is applied to the particle inspection chip, a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip, and an analysis circuit which analyzes the fine particle, in the sample liquid based on the voltage signal. The voltage driving circuit varies the driving voltage based on the detection result of the detection circuit.
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Citations
18 Claims
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1. A particle inspection system comprising:
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a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip which detects a fine particle in a sample liquid and outputs a current signal indicative of the fine particle; a current-voltage conversion circuit which converts, into a voltage signal, the current signal output from the particle inspection (ship when the driving voltage is applied to the particle inspection chip; a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip; and an analysis circuit which analyzes the fine particle in the sample liquid based on the voltage signal, wherein the voltage driving circuit varies the driving voltage based on a detection result of the detection circuit. - View Dependent Claims (2, 3, 4, 5, 6, 13, 14, 15, 16, 17, 18)
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7. A particle inspection system comprising:
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a current driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip which detects a fine particle in a sample liquid and outputs a current signal indicative of the fine particle to cause a constant current to flow in a detection region of the particle inspection chip; a current-voltage conversion circuit which converts, into a voltage signal, the current signal output from the particle inspection chip when the driving voltage is applied to the particle inspection chip; a detection circuit which detects whether the sample liquid is introduced into the detection region of the particle inspection chip, based on the voltage signal obtained by the current-voltage conversion circuit or the driving voltage applied by the current driving circuit; and an analysis circuit which analyzes the fine particle in the sample liquid based on the voltage signal, wherein the current driving circuit varies the driving voltage based on a detection result of the detection circuit. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification