BEAM FORMING AND STEERING OF HELICAL GUIDED WAVES IN PIPE-LIKE AND PLATE-LIKE STRUCTURES

• US 20170131242A1
• Filed: 06/24/2015
• Published: 05/11/2017
• Est. Priority Date: 06/24/2014
• Status: Active Grant

• Current Assignee: Quest Integrated, LLC
• Original Assignee: QI2 Elements, LLC
• Inventors: KANNAJOSYULA, Haraprasad, NINO, Giovanni, BONDURANT, Phillip D., FRATELLO, Vincent
• Granted Patent: US 10,641,743 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 2291/011 Velocity or travel time
• CPC Class Codes: G01N 2291/014 Resonance or resonant frequency
• CPC Class Codes: G01N 2291/0425 Parallel to the surface, e.g. creep waves
• CPC Class Codes: G01N 2291/044 Internal reflections (echoes), e.g. on walls or defects
• CPC Class Codes: G01N 2291/106 one or more transducer arrays
• CPC Class Codes: G01N 2291/2634 cylindrical from outside
• CPC Class Codes: G01N 29/04 Analysing solids using acoustic emission techniques G01N29/14
• CPC Class Codes: G01N 29/11 by measuring attenuation of acoustic waves
• CPC Class Codes: G01N 29/262 by electronic orientation or focusing, e.g. with phased arrays phased arrays per se G10K11/34

Abstract

A method of inspecting a pipe for flaws includes emitting ultrasonic waves, controlling the emission of the ultrasonic waves, receiving reflections of the ultrasonic waves, and determining at least one characteristic of one or more flaws. The ultrasonic waves are emitted in a helical pattern through the pipe from an array of ultrasonic transducer elements. The emission of the ultrasonic waves from the array is controlled such that the ultrasonic waves are emitted at a plurality of helical angles within a range of helical angles. The reflections of the ultrasonic waves are caused by impingement of the ultrasonic waves on the one or more flaws. The at least one characteristic of the one or more flaws is determined based on the received reflections of the ultrasonic waves.

Claims

1. A method of inspecting a pipe for flaws comprising:

emitting ultrasonic waves in a helical pattern through the pipe from an array of ultrasonic transducer elements;

controlling the emission of the ultrasonic waves from the array such that the ultrasonic waves are emitted at a plurality of helical angles within a range of helical angles;

receiving reflections of the ultrasonic waves, the reflections of the ultrasonic waves caused by impingement of the ultrasonic waves on one or more flaws; and

determining at least one characteristic of the one or more flaws based on the received reflections of the ultrasonic waves.

2. The method of claim 1, wherein the at least one characteristic of the one or more flaws comprises one or more of a location of the one or more flaws, a size of the one or more flaws, an orientation of the one or more flaws, or a shape of the one or more flaws.

3. The method of claim 1, wherein the at least one characteristic of the one or more flaws is determined based a presence or an absence of an anomalous signature, the method further comprising:

mapping the at least one characteristic based on at least one of an amplitude distribution in time, an amplitude distribution in frequency, arrival time, or direction of approach of the anomalous signature.

21. The method of claim 1, further comprising:

controlling one or more of an average value of the range of helical angles or a width of the range of helical angles.

4. A device for inspecting a structure for flaws, the device comprising:

at least one ultrasonic emitter configured to emit waves in the structure;

at least one ultrasonic receiver configured to receive reflections of the waves caused by impingement of the waves on one or more flaws; and

a computing system configured to;

control emission of waves from the at least one ultrasonic transducer in helical patterns based on one or more control parameters, the one or more control parameters comprising at least a windowed pulsed signal comprising at least a half oscillation of any shape; and

determine at least one characteristic of one or more flaws in the structure based on the signals emitted from the array and the reflections of the waves received by the array.

5. The device of claim 4, wherein the one or more control parameters further comprise at least one of:

a continuous oscillation of signal amplitudes;

a variance of signal frequency over time;

a prescribed range of frequencies;

or

a variance of one or more of time delays, amplitudes, number cycles, pulse lengths, or frequencies.

6. The device of claim 4, wherein further comprising:

an array comprising the at least one ultrasonic emitter and the at least one ultrasonic receiver.

7. The device of claim 5, further comprising:

at least one additional ultrasonic receiver configured to receive one or more of the waves emitted by the array or the reflections of the waves, wherein the at least one additional ultrasonic receiver is separate from the array;

wherein the computing system is further configured to determine the at least one characteristic of the one or more flaws based on the characteristics of reflected or transmission of waves received by the at least one additional ultrasonic receiver.

8. The device of claim 4, wherein the computing system is configured to evaluate and select one or more of a guided wave subtype of the waves, helical paths of the waves, or a focal point of the waves.

9. The device of claim 4, wherein the structure is a pipe.

10. The device of claim 9, wherein the pipe comprises at least one of a circular cross-section, a square cross-section, a triangular cross-section, any other polygonal cross-section, or a cross-section that rotates along an axis of the pipe.

11. The device of claim 9, wherein at least one emitter is configured to emit omnidirectional waves, wherein at least one ultrasonic transducer element comprises the at least one ultrasonic emitter and the at least one ultrasonic receiver, and wherein the at least one ultrasonic transducer element is in a configuration determined by a direction of oscillation relative to waves propagating in the pipe or to an axis of the pipe.

12. The device of claim 11, wherein the oscillation is along a thickness of the pipe, and wherein the at least one ultrasonic transducer element is a thickness mode piezoelectric transducer or a particularly-shaped 1-3 piezo-composite transducer.

13. The device of claim 11, wherein the oscillation is along the axis of the pipe, and wherein the at least one ultrasonic transducer element is a circular-shaped macro-fiber composite with piezoelectric fibers oriented perpendicular to the axis and comprises electrodes arranged along the axis of the pipe.

14. The device of claim 11, wherein the oscillation is tangential and orthogonal to the axis of the pipe, and wherein the at least one ultrasonic transducer element is a circular-shaped macro-fiber composite with piezoelectric fibers oriented perpendicular to the axis and comprises electrodes arranged perpendicular to the axis of the pipe.

15. The device of claim 11, wherein the oscillation is tangential and orthogonal to the waves, and wherein the at least one ultrasonic transducer element is a circular-shaped macro-fiber composite with piezoelectric fibers forming an annular array and comprises electrodes oriented radially from the center of the annular array.

16. The device of claim 11, wherein the oscillation is tangential and parallel to the waves, and wherein the at least one ultrasonic transducer element comprises electrodes forming an annular array, and wherein the at least one ultrasonic transducer element is a circular-shaped macro-fiber composite with piezoelectric fibers oriented radially from the center of the annular array.

17. The device of claim 4, wherein the at least one ultrasonic emitter is configured to emit waves both unidirectionally and bidirectionally.

18. The device of claim 4, wherein the structure comprises a plate like structure.

19. The device of claim 4, wherein the computing system is further configured to determine at least one characteristic of one or more flaws in the structure based at least in part on the following formula:

20. The device of claim 4, wherein the computing system is further configured to determine at least one characteristic of one or more flaws in the structure based at least in part a time delay supplemented by amplitude control based on a minimum time delay increment, and wherein the minimum time delay is a characteristic of hardware in the device.

22. The device of claim 9, wherein the pipe is a bent pipe.

23. The device of claim 4, wherein the computing system is configured to process received data from independent actuation of transducer array elements to mimic effects of real beam forming.