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METHOD AND SYSTEM FOR IMPROVING PARAMETER MEASUREMENT

  • US 20170138781A1
  • Filed: 11/17/2015
  • Published: 05/18/2017
  • Est. Priority Date: 11/17/2015
  • Status: Abandoned Application
First Claim
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1. A measurement system comprising:

  • a first sensor comprising a first output signal comprising a plurality of output characteristics, at least one output characteristic of said plurality of output characteristics being deficient for measuring a desired parameter and at least one output characteristic being suitable for measuring the desired parameter;

    a second sensor comprising a second output signal comprising at least some of the plurality of output characteristics of said first output signal, the at least one deficient characteristic of said first output signal being suitable in said second output signal for measuring the desired parameter; and

    a processor communicatively coupled to a memory device, said processor programmed to calibrate said first output signal of said first sensor using said second output signal of said second sensor to generate a third output signal comprising the at least one suitable characteristic of said first output signal and the at least one suitable characteristic of said second output signal.

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