SYSTEMS AND METHODS FOR MONITORING COMPONENT STRAIN

• US 20170146334A1
• Filed: 11/20/2015
• Published: 05/25/2017
• Est. Priority Date: 11/20/2015
• Status: Active Grant

• Current Assignee: GE Infrastructure Technology, LLC (GE Vernova, Inc.)
• Original Assignee: General Electric Company
• Inventors: Germann, Bryan J., Ranson, William F.
• Granted Patent: US 9,733,062 B2
• Time in Patent Office: Days
• CPC Class Codes: F01D 17/04 responsive to load
• CPC Class Codes: F05D 2270/808 Strain gauges; Load cells
• CPC Class Codes: G01B 7/16 for measuring the deformation in a solid, e.g. by resistance strain gauge
• CPC Class Codes: G01L 1/146 for measuring force distributions, e.g. using force arrays G01L1/148 takes precedence
• CPC Class Codes: G01M 5/0016 of aircraft wings or blades
• CPC Class Codes: G01M 5/0083 by measuring variation of impedance, e.g. resistance, capacitance, induction
• CPC Class Codes: G01R 29/08 Measuring electromagnetic field characteristics

Abstract

A system for monitoring a component is provided. The system includes an electrical field scanner for analyzing an electrical field across a reference zone, and a processor in operable communication with the electrical field scanner. The reference zone may include a plurality of fiducials configured on the component to influence the electrical field. The processor may be operable for measuring an electrical field value along a mutually-orthogonal X-axis and Y-axis, assembling a zone profile including a data point set according to the measured electrical field value. Methods of using the system are also provided.

Claims

1. A system for monitoring a component, the system comprising:

an electrical field scanner for analyzing an electrical field across a reference zone, the reference zone including a plurality of fiducials configured on the component to influence the electrical field; and

a processor in operable communication with the electrical field scanner, the processor operable for measuring an electrical field value along a mutually-orthogonal X-axis and Y-axis, and assembling a zone profile including a data point set according to the measured electrical field value.

2. The system of claim 1, wherein the electrical field scanner includes a capacitance scanner configured to measure capacitance across the reference zone.

3. The system of claim 2, wherein the capacitance scanner includes a multi-layer capacitance grid having a pair of perpendicular electrode layers.

4. The system of claim 2, wherein the capacitance scanner includes a flexible uniform substrate supporting at least one detection electrode.

5. The system of claim 1, wherein each fiducial includes a protrusion formed on an exterior surface of the component.

6. The system of claim 5, wherein the protrusions include an integrally-formed nodule.

7. The system of claim 5, wherein the protrusions include a plurality of fringe ridges.

8. The system of claim 1, wherein the component is a turbine component.

9. The system of claim 2, wherein the capacitance scanner has a resolution between 200 points per inch and 1000 points per inch in the X-axis and Y-axis.

10. The system of claim 1, wherein the processor is further operable for comparing multiple zone profiles.

11. A method for monitoring a component, the method comprising:

measuring an electrical field value across a reference zone along a mutually-orthogonal X-axis and Y-axis at a first time, the reference zone including a plurality of fiducials configured on the component to influence the electrical field value; and

assembling a first zone profile including a data point set according to the measured electrical field value.

12. The method of claim 11, wherein the component includes a turbine component and the measuring step includes measuring changes in capacitance across the reference zone.

13. The method of claim 11, wherein the measuring step includes calculating a Z-axis data point set in a Z-axis orthogonal to the X-axis and the Y-axis, and

wherein the assembling step includes assembling a three-dimensional zone profile of the reference zone based on an X-axis data point set, a Y-axis data point set, and the Z-axis data point set.

14. The method of claim 13, wherein the fiducials include a plurality of fringe ridges,

wherein the measuring step includes engaging the ridges with a capacitance scanner and identifying variations in capacitance at the scanner, and

wherein the calculating step includes determining a Z-axis data value according the variations in capacitance.

15. The method of claim 13, wherein the fiducials includes a plurality of nodules formed as a matrix grid,

wherein detecting includes engaging the nodule with a capacitance scanner and identifying variations in capacitance at the scanner, and

wherein the calculating step includes determining a Z-axis data value according the variations in capacitance.

16. The method of claim 11, wherein the measuring step includes placing an electrical field scanner on the component in direct contact with the reference zone.

17. The method of claim 16, wherein placing the electrical field scanner includes deforming the scanner to match a contoured shape of the exterior surface.

18. The method of claim 17, wherein the electrical field scanner includes a flexible substrate supporting at least one detection electrode;

and wherein deforming includes non-destructively bending the scanner.

19. The method of claim 11, wherein the measuring step occurs at a first time, and the method further comprises:

measuring an electrical field value across the reference zone at a second time, the second time being different from the first time; and

assembling a second zone profile including a second data point set according to the measured electrical field value.

20. The method of claim 19, further comprising comparing the first zone profile and the second zone profile.