OPTICAL MEASURING METHOD AND MEASURING APPARATUS FOR EXTERNAL DIMENSION

• US 20170167852A1
• Filed: 12/13/2016
• Published: 06/15/2017
• Est. Priority Date: 12/15/2015
• Status: Abandoned Application

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: MIKI, Yutaka
• Application Number:
  US15/376,934
• Publication Number:
  US 20170167852A1
• Time in Patent Office: Days
• CPC Class Codes: G01B 11/08 for measuring diameters
• CPC Class Codes: G01B 11/2433 for measuring outlines by shadow casting

Abstract

A light emitter and a reflector are placed such that an optical axis of a measuring light beam and an optical axis of a reflection light beam intersect, and further the measuring light beam and the reflection light beam are formed inside the same virtual measuring plane; a first measuring light beam and a second measuring light beam are defined in the measuring light beam, a first and second reflection light beam are defined in the reflection light beam, a measured object is placed in a measuring region on a measuring plane where the first and second measuring light beams overlap, an external diameter of the measured object in a first direction is measured from a shadow appearing in the first reflection light beam and an external diameter of the measured object in a second direction is measured from a shadow appearing in the second reflection light beam.

Claims

1. An optical measuring method for measuring an external dimension of a measured object, the method comprising:

providing a light emitter emitting a band-shaped measuring light beam which is configured by parallel light beams, wherein at least a main measuring light beam and a sub measuring light beam are defined in the measuring light beam;

providing a reflector reflecting the measuring light beam and forming a reflection light beam, wherein at least a main reflection light beam which is reflected light of the main measuring light beam and a sub reflection light beam which is reflected light of the sub measuring light beam are defined in the reflection light beam;

providing a photoreceiver receiving the reflection light beam are arranged;

arranging the light emitter and the reflector such that an optical axis of the measuring light beam and an optical axis of the reflection light beam intersect;

forming the measuring light beam and the reflection light beam inside the same measuring plane;

placing the measured object in a measuring region on the measuring plane where the main measuring light beam and the sub reflection light beam overlap;

measuring the external dimension in a main direction of the measured object from a shadow of the measured object appearing in the main reflection light beam; and

measuring the external dimension in a sub direction of the measured object from the shadow of the measured object appearing in the sub reflection light beam.

2. An optical measuring apparatus for measuring an external dimension of a measured object, the apparatus comprising:

a light emitter configured to emit a band-shaped measuring light beam which is configured by parallel light beams, the measuring light beam including at least a main measuring light beam and a sub measuring light beam;

a reflector configured to reflect the measuring light beam and form a reflection light beam including at least a main reflection light beam which is reflected light of the main measuring light beam and a sub reflection light beam which is reflected light of the sub measuring light beam, wherein the light emitter and the reflector are arranged such that;

an optical axis of the measuring light beam and an optical axis of the reflection light beam intersect, and

the measuring light beam and the reflection light beam are formed inside the same measuring plane;

a photoreceiver configured to receive the reflection light beam; and

a measuring region where the main measuring light beam and the sub reflection light beam overlap on the measuring plane, the measuring region configured to accept the measured object.