DIRECTIONAL PULSE INJECTION INTO A MICROELECTRONIC SYSTEM FOR ELECTROSTATIC TEST
2 Assignments
0 Petitions
Accused Products
Abstract
A directional pulse injection system and method are described for injecting a pulse into a microelectronic system for electrostatic test. One example has a transformer coupled to a pulse source through a transmission line and to a conductive trace of a test board to apply the electrical pulse to the trace as a test pulse. The test board is connected to a microelectronic device under test. This example also has a cancellation pulse transmission line coupled to the pulse source and a cancellation pulse contact coupled to the pulse source through the cancellation pulse transmission line and to the trace on a side of the trace opposite the transformer to receive a cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse.
33 Citations
40 Claims
-
1-20. -20. (canceled)
-
21. An apparatus comprising:
-
a pulse source to produce an electrical pulse; a test pulse transmission line coupled to the pulse source; a transformer coupled to the pulse source through the transmission line and to a conductive trace of a test board to apply the electrical pulse to the trace as a test pulse, the test board being connected to a microelectronic device under test, wherein the trace has a contact coupled to the device under test; a cancellation pulse transmission line coupled to the pulse source; and a cancellation pulse contact coupled to the pulse source through the cancellation pulse transmission line and to the trace on a side of the trace opposite the transformer to receive a cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30)
-
-
31. A method comprising:
-
producing an electrical pulse at a pulse source; applying the electrical pulse to a conductive trace of a test board as a test pulse through a transformer coupled to the pulse source through a transmission line, the test board being connected to a microelectronic device under test, wherein the trace has a contact coupled to the device under test; and applying a cancellation pulse from a cancellation pulse transmission line coupled to the pulse source to a cancellation pulse contact, the cancellation pulse contact being coupled to the trace on a side of the trace opposite the transformer to receive the cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse. - View Dependent Claims (32, 33, 34, 35, 36)
-
-
37. An apparatus comprising:
-
a test board connected to a device under test having a plurality of conductive traces coupled to pins of the device under test; a test controller coupled to the test board to drive the signals and power on the test board to simulate operation of the device under test; a pulse source to produce an electrical pulse; a test pulse transmission line coupled to the pulse source; a transformer coupled to the pulse source through the transmission line and to a selected conductive trace of the plurality of the conductive traces of the test board to apply the electrical pulse to the trace as a test pulse; a cancellation pulse transmission line coupled to the pulse source; and a cancellation pulse contact coupled to the pulse source through the cancellation pulse transmission line and to the selected trace on a side of the selected trace opposite the transformer to receive a cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse. - View Dependent Claims (38, 39, 40)
-
Specification