ENCODER

• US 20170176219A1
• Filed: 12/20/2016
• Published: 06/22/2017
• Est. Priority Date: 12/22/2015
• Status: Active Grant

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: KIMURA, Akihide
• Granted Patent: US 10,190,893 B2
• Time in Patent Office: Days
• CPC Class Codes: G01D 5/34746 Linear encoders
• CPC Class Codes: G01D 5/38 by diffraction gratings

Abstract

A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result. A signal processing unit detects a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detects incremental positions based on the interference fringes which appear at other positions. The detection head includes a light source, a detecting unit configured to output the detection result of the beams radiated onto light receiving devices to the signal processing unit, and an optical system configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams on the detecting unit.

Claims

1. An encoder comprising:

a scale having a plurality of pattern areas having a plurality of patterns arranged in a measurement direction with a predetermined pitch and including at least one pattern area disposed with an offset from a neighboring pattern area in the measurement direction by 1/(2×

s) of the pitch (wherein “

s”

is an integer of 1 or greater);

a detection head configured to be relatively movable in the measurement direction with respect to the scale, and detect interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result; and

a signal processing unit configured to detect a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detect incremental positions based on the interference fringes which appear at positions other than the position where light intensity is lower than the predetermined value,

wherein, the detection head includes;

a light source configured to radiate beams onto the scale;

a detecting unit having a plurality of light receiving devices arranged in the measurement direction, and configured to output the detection result of the beams radiated onto the plurality of light receiving devices to the signal processing unit; and

an optical system disposed between the scale and the detecting unit, and configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams generated when the beams are radiated onto the scale on the detecting unit.

2. The encoder according to claim 1, wherein:

the optical system includes;

a first mirror disposed such that its mirror surface is perpendicular to the measurement direction, and configured to reflect the positive s-th-order diffracted beams toward the detecting unit; and

a second mirror disposed such that its mirror surface is perpendicular to the measurement direction and faces the first mirror, and configured to reflect the negative s-th-order diffracted beams toward the detecting unit, and

the first mirror and the second mirror are disposed at positions for imaging the positive s-th-order diffracted beams and the negative s-th-order diffracted beams on the detecting unit.

3. The encoder according to claim 1, wherein:

the optical system is configured as a bi-telecentric imaging optical system including two or more lenses.

4. The encoder according to claim 1, wherein:

the optical system includes a diffraction grating for imaging the positive s-th-order diffracted beams and the negative s-th-order diffracted beams on the detecting unit.

5. The encoder according to claim 1, wherein:

the plurality of pattern areas is disposed such that a plurality of joint lines occurs due to an offset of one or both of two neighboring pattern areas.

6. The encoder according to claim 5, wherein:

the joint lines are disposed in a random manner or a pseudo-random manner.

7. The encoder according to claim 6, wherein:

the joint lines are disposed based on an M-sequence code.