REMOVABLE TEST AND DIAGNOSTICS CIRCUIT
First Claim
Patent Images
1. A backup power testing and diagnostic system, comprising:
- a plurality of nodes, wherein a node within the plurality of nodes contains at least one non-volatile dual inline memory module (NV-DIMM) slot;
a battery module;
a backup power control module having instructions stored in a non-transitory storage medium and executed by a processing resource to determine, based on monitored power, a backup power demand of at least one load to the node and to provide backup power from the battery module to the node; and
a test and diagnostics circuit removably located in the NV-DIMM slot to test the battery module and the node.
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Abstract
A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.
8 Citations
15 Claims
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1. A backup power testing and diagnostic system, comprising:
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a plurality of nodes, wherein a node within the plurality of nodes contains at least one non-volatile dual inline memory module (NV-DIMM) slot; a battery module; a backup power control module having instructions stored in a non-transitory storage medium and executed by a processing resource to determine, based on monitored power, a backup power demand of at least one load to the node and to provide backup power from the battery module to the node; and a test and diagnostics circuit removably located in the NV-DIMM slot to test the battery module and the node. - View Dependent Claims (2, 3, 4, 5)
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6. A test and diagnostic circuit, comprising;
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a controller; a power monitor coupled to the controller; a load switch to selectably implement a load from among multiple load values to test a server node; and circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the server node. - View Dependent Claims (7, 8, 9)
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10. A method of testing backup powerand diagnostics for a plurality of nodes, comprising:
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receiving at a test and diagnostics circuit, removably located in a non-volatile dual inline memory module (NV-DIMM) slot of at least one of the plurality nodes, a test enable signal from a backup power control module associated with a backup power supply; registering an available level of the backup power supply; selecting a particular load to emulate from among multiple load scenarios; activating a test duration timer; and monitoring a power demand for the at least one node under the selected particular load and in reference to the level of the backup power supply. - View Dependent Claims (11, 12, 13, 14, 15)
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Specification