DEFECT DETECTOR FOR CONDUCTIVE MATERIALS
First Claim
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16. A method comprising:
- receiving, from a magnetometer, an initial magnetic field magnitude;
moving the magnetometer parallel to a length of a material;
receiving, from the magnetometer, a measured magnetic field magnitude that is different than the initial magnetic field magnitude at a first location along the length of the material; and
determining, based on the measured magnetic field magnitude, that the material comprises a defect at the first location.
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Abstract
A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material comprises a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
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Citations
40 Claims
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16. A method comprising:
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receiving, from a magnetometer, an initial magnetic field magnitude; moving the magnetometer parallel to a length of a material; receiving, from the magnetometer, a measured magnetic field magnitude that is different than the initial magnetic field magnitude at a first location along the length of the material; and determining, based on the measured magnetic field magnitude, that the material comprises a defect at the first location.
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17. A method comprising:
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measuring, using a magnetometer, a magnetic field of Earth while the magnetometer travels parallel to a length of material; monitoring for a change in the measured magnetic field of Earth while the magnetometer travels parallel to the length of the material; and determining that a portion of the length of the material comprises a defect by detecting the change in the measured magnetic field of Earth. - View Dependent Claims (21)
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18. A method comprising:
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inducing a current in a length of material; determining an expected magnitude of a magnetic field along the length of the material; measuring, using a magnetometer, a measured magnitude of the magnetic field along at least a portion of the length of the material; and determining that the length of the material comprises a defect by comparing the expected magnitude of the magnetic field and the measured magnitude of the magnetic field. - View Dependent Claims (19, 20)
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22. A device comprising:
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a magnetometer configured to sense a magnetic field magnitude; and a processor operatively coupled to the magnetometer and configured to; monitor the magnetic field magnitude sensed by the magnetometer; determine a change in the magnetic field sensed by the magnetometer; and determine that a length of a material comprises a defect based at least on the change in the magnetic field. - View Dependent Claims (1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35)
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30-1. The device of claim 22, wherein the material is a ferrous material.
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31-1. The device of claim 22, wherein the material is ferromagnetic.
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36. A device comprising:
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a magnetometer configured to sense a magnetic field magnitude; and a processor operatively coupled to the magnetometer and configured to; receive, from the magnetometer, a first magnetic field magnitude along a first portion of a length of material; receive, from the magnetometer, a second magnetic field magnitude along a second portion of the length of material; and determine that the material comprises a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
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37. A device comprising:
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a magnetometer configured to sense a magnetic field magnitude; and a processor operatively coupled to the magnetometer and configured to; determine an expected magnitude of a magnetic field along a length of a material; measure, using a magnetometer, a measured magnitude of the magnetic field along at least a portion of the length of the material; and determine that the length of the material comprises a defect by comparing the expected magnitude of the magnetic field and the measured magnitude of the magnetic field. - View Dependent Claims (38, 39, 40)
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Specification