Method for Detecting Substrate Crack, Substrate, and Detection Circuit
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Accused Products
Abstract
A method for detecting a substrate crack, a substrate, and a detection circuit. A non-closed test line having an opening is peripherally disposed along an edge of a glass substrate of a TFT substrate. Whether an edge of the TFT substrate has a crack or chip can be determined by measuring whether the test line is on or off. In this way, a detection omission can be avoided, detection efficiency is improved, and after the TFT substrate is used to assemble a liquid crystal module or the liquid crystal module is used to assemble a complete device, whether the edge of the TFT substrate in the liquid crystal module has a crack or chip can also be detected.
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Citations
45 Claims
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1-25. -25. (canceled)
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26. An electronic terminal, comprising:
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a liquid crystal display comprising a thin film transistor (TFT) substrate, wherein the TFT substrate comprises a glass substrate, wherein a non-closed test line having an opening is peripherally disposed on the glass substrate along an edge of the glass substrate; and wherein the opening is formed by two end points of the test line, wherein a test point is provided at a position on the test line that is a set distance away from each of the two end points, wherein the test point is configured to connect to a measurement tool that is able to determine whether the test line is on or off;
wherein the measurement tool is able to determine whether an edge of the TFT substrate has a crack or chip based on whether the test line is on or off; andwherein one of the two end points is grounded. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33, 34, 35, 36)
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37. An electronic terminal, comprising:
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a liquid crystal display comprising a thin film transistor (TFT) substrate, wherein the TFT substrate comprises a glass substrate, wherein a non-closed test line having an opening is peripherally disposed on the glass substrate along an edge of the glass substrate, wherein the opening is formed by two end points of the test line, wherein one of the two end points is grounded, wherein the opening is located in an interference fit flexible printed circuit board on glass (FOG) bonding region between a flexible printed circuit board and the glass substrate, wherein the two end points of the opening are electrically connected to a first connector interface by using the flexible printed circuit board, wherein the first connector interface is configured to electrically connect to a connector interface of a detection circuit, and wherein the detection circuit is configured to measure whether the test line is on or off to determine whether an edge of the TFT substrate has a crack or chip. - View Dependent Claims (38, 39, 40, 41, 42, 43, 44, 45)
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Specification