MEMS PEIZOELECTRIC ACCELEROMETER WITH BUILT-IN SELF TEST

• US 20170205440A1
• Filed: 01/19/2016
• Published: 07/20/2017
• Est. Priority Date: 01/19/2016
• Status: Abandoned Application

• Current Assignee: Rosemount Aerospace, Inc. (Rtx Corporation)
• Original Assignee: Rosemount Aerospace, Inc. (Rtx Corporation)
• Inventors: Huynh, Cuong Tho, Zhang, Weibin, McTighe, James Joseph
• Application Number:
  US15/000,838
• Publication Number:
  US 20170205440A1
• Time in Patent Office: Days
• CPC Class Codes: G01P 15/09 by piezoelectric pick-up
• CPC Class Codes: G01P 15/0922 of the bending or flexing mode type
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

Apparatus and associated methods relate to an accelerometer having first and second piezoelectric transducers that are electrically isolated but mechanically coupled one to another via a coupling member. The first piezoelectric transducer is configured to induce a mechanical deformation of the coupling member in response to an electrical excitation signal received by the first piezoelectric transducer. The second piezoelectric transducer is configured to generate an electrical response signal in response to mechanical deformation of the coupling member. The accelerometer has a self-test module configured to generate the electrical excitation signal and to receive the electrical response signal. The self-test module is further configured to generate a sensor test result based upon a comparison between the received electrical response signal and a reference signal. The self-test module may advantageously detect changes in an excitation/response relation due to time and/or environmental conditions, for example.

Claims

1. An accelerometer comprising:

a substrate having a proofmass and at least one coupling member, the at least one coupling member configured to mechanically couple the accelerometer to a device to be tested;

a first MEMS piezoelectric transducer mounted to one of the at least one coupling member of the substrate and configured to deform the at least one coupling member in response to a first electrical signal received by the piezoelectric transducer;

a second MEMS piezoelectric transducer mounted to one of the at least one coupling member of the substrate and configured to provide a second electrical signal in response to deformation of the at least one coupling member of the substrate; and

a self-test module configured to generate the first electrical signal and to receive the second electrical signal, the self-test module configured to compare the received second electrical signal to a reference signal and configured to generate a test result based upon the comparison.

2. The accelerometer of claim 1, wherein the proofmass of the substrate is substantially cylindrical, and the at least one coupling member of the substrate is formed as a single annular coupling member projecting radially outward from the proofmass of the substrate.

3. The accelerometer of claim 2, wherein the first and second MEMS piezoelectric transducers are substantially circular.

4. The accelerometer of claim 1, wherein the at least one coupling member of the substrate comprises two coupling members, wherein the first MEMS piezoelectric transducer is located on a first one of the two coupling members, and wherein the second MEMS piezoelectric transducer is located on a second one of the two coupling members.

5. The accelerometer of claim 1, wherein the first and second MEMS piezoelectric transducers are located on a same one of the at least on coupling member.

6. The accelerometer of claim 1, wherein the first and second MEMS piezoelectric transducers are located on a first one and second one of the at least one coupling member, respectively.

7. The accelerometer of claim 1, wherein the proofmass of the substrate has a substantially orthorhombic shape, and the at least one coupling member of the substrate comprises two coupling members projecting from opposite sides of the orthorhombic shaped proofmass.

8. The accelerometer of claim 7, further comprising:

a third MEMS piezoelectric transducer mounted to one of the at least one coupling member of the substrate and configured to deform the at least one coupling member in response to a first electrical signal received by the piezoelectric transducer; and

a fourth MEMS piezoelectric transducer mounted to one of the at least one coupling member of the substrate and configured to provide a second electrical signal in response to deformation of the at least one coupling member of the substrate.

9. The accelerometer of claim 1, wherein the at least one coupling member of the substrate is configured to permit motion of the proofmass in a unidirectional manner.

10. The accelerometer of claim 1, wherein the accelerometer has an excitation/response relation that is substantially independent of frequency between a low-frequency limit and a high-frequency limit.

11. The accelerometer of claim 1, wherein the first and second MEMS piezoelectric transducers comprise aluminum nitride.

12. The accelerometer of claim 1, wherein the substrate is a unitary body.

13. The accelerometer of claim 1, wherein the second MEMS piezoelectric transducer is adjacent to the first piezoelectric transducer.

14. An accelerometer comprising:

a substrate having a proofmass and an elastically deformable coupling member;

a first MEMS piezoelectric transducer configured to induce a mechanical deformation of the elastically deformable coupling member in response to an electrical excitation signal received by the first MEMS piezoelectric transducer;

a second MEMS piezoelectric transducer electrically isolated from but mechanically coupled to the first piezo electric transducer via the elastically deformable coupling member, the second MEMS piezoelectric transducer configured to generate an electrical response signal in response to mechanical deformation of the elastically deformable coupling member; and

a self-test module configured to generate the electrical excitation signal and to receive the electrical response signal, the self-test module further configured to generate a sensor test result based upon a comparison between the received electrical response signal and a reference signal.

15. The accelerometer of claim 14, wherein the electrical excitation signal is a first electrical excitation signal, and the second MEMS piezoelectric transducer is further configured to induce a mechanical deformation of the elastically deformable coupling member in response to a second electrical excitation signal received by the second MEMS piezoelectric transducer.

16. The accelerometer of claim 15, wherein the electrical response signal is a first electrical response signal, and the first MEMS piezoelectric transducer is further configured to generate a second electrical response signal in response to mechanical deformation of the elastically deformable coupling member.

17. The accelerometer of claim 16, wherein the sensor test result is a first sensor test result and the reference signal is a first reference signal, wherein the self-test module is further configured to generate the second electrical excitation signal and to receive the second electrical response signal, the self-test module further configured to generate a second sensor test result based upon a comparison between the received second electrical response signal and a second reference signal.

18. The accelerometer of claim 14, wherein the elastically deformable coupling member is configured to permit motion of the proofmass in a unidirectional manner.

19. The accelerometer of claim 14, wherein the accelerometer has an excitation/response relation that is substantially independent of frequency between a low-frequency limit and a high-frequency limit.

20. The accelerometer of claim 14, wherein the second MEMS piezoelectric transducer is adjacent to the first piezoelectric transducer.