MAGNETO-OPTICAL DEFECT SENSOR WITH COMMON RF AND MAGNETIC FIELDS GENERATOR
First Claim
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1. A magnetometer comprising:
- a magneto-optical defect center material with a plurality of magneto-optical defect centers;
a first optical excitation source that transmits excitation light that excites at least a portion of the magneto-optical defect centers of the magneto-optical defect center material;
a first photo sensor that receives generated light that is generated by the portion of the magneto-optical defect centers;
a plurality of radio frequency (RF) elements spaced around the magneto-optical defect center material, wherein the plurality of RF elements generate a microwave signal that is substantially uniform over the magneto-optical defect center material and generate a magnetic bias field to the magneto-optical defect center material; and
a processor operatively coupled to the first photo sensor, wherein the processor is configured to determine a magnitude of an external magnetic field based on a signal received from the first photo sensor.
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Abstract
Systems and apparatuses are disclosed for providing a uniform RF field and magnetic bias field to a nitrogen vacancy center diamond.
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Citations
44 Claims
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1. A magnetometer comprising:
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a magneto-optical defect center material with a plurality of magneto-optical defect centers; a first optical excitation source that transmits excitation light that excites at least a portion of the magneto-optical defect centers of the magneto-optical defect center material; a first photo sensor that receives generated light that is generated by the portion of the magneto-optical defect centers; a plurality of radio frequency (RF) elements spaced around the magneto-optical defect center material, wherein the plurality of RF elements generate a microwave signal that is substantially uniform over the magneto-optical defect center material and generate a magnetic bias field to the magneto-optical defect center material; and a processor operatively coupled to the first photo sensor, wherein the processor is configured to determine a magnitude of an external magnetic field based on a signal received from the first photo sensor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A device comprising:
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a magneto-optical defect center material with a plurality of magneto-optical defect centers; and a plurality of radio frequency (RF) elements spaced around the magneto-optical defect center material, wherein the plurality of RF elements generate a microwave signal that is substantially uniform over the magneto-optical defect center material and generate a magnetic bias field to the magneto-optical defect center material. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A method comprising:
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receiving, at each of a plurality of radio frequency (RF) elements, a feed signal; generating, by the plurality of RF elements, a microwave signal that is substantially uniform over a magneto-optical defect center material that has a plurality of magneto-optical defect centers; and generating, by the plurality of RF elements, a magnetic bias field that is applied to the magneto-optical defect center material. - View Dependent Claims (36, 37, 38, 39, 40, 41, 42, 43, 44)
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Specification