×

LARGE CLUSTER PERSISTENCE DURING PLACEMENT OPTIMIZATION OF INTEGRATED CIRCUIT DESIGNS

  • US 20170220722A1
  • Filed: 08/11/2016
  • Published: 08/03/2017
  • Est. Priority Date: 01/29/2016
  • Status: Active Grant
First Claim
Patent Images

1. A method for high physical persistence during placement optimization of an integrated circuit design, comprising:

  • performing, by a processor coupled to a memory, cluster operation by grouping of a plurality of cells into a plurality of mobs; and

    performing, by the processor, a spreading operation by a utilizing a force-directed placement to move the plurality of mobs and the plurality of cells simultaneously to optimize empty space of the integrated circuit design.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×