METHOD FOR SUPPLYING GAS FOR PLASMA BASED ANALYTICAL INSTRUMENT

• US 20170221688A1
• Filed: 01/27/2017
• Published: 08/03/2017
• Est. Priority Date: 01/29/2016
• Status: Active Grant

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Nagata, Yoichi, Tsuruga, Shusaku, Kuwabara, Takeo, Tobiyama, Ryosuke
• Granted Patent: US 10,211,038 B2
• Time in Patent Office: Days
• CPC Class Codes: H01J 49/0422 for gaseous samples interfaces to gas chromatographs G01N30/7206
• CPC Class Codes: H01J 49/105 using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Abstract

To achieve an effective gas filtering in a plasma spectrometric apparatus using a gas of a comparatively high consumption flow rate, and to improve the analytical ability, there is provided a plasma spectrometric apparatus containing a sample introducer for producing and delivering an injector gas containing an analyte sample, a plasma generator for generating plasma into which the injector gas is introduced, and an analyzer disposed subsequent to the plasma generator for analyzing the analyte sample. The plasma spectrometric apparatus contains a first gas line for supplying gas to the sample introducer, a second gas line for supplying gas to the plasma generator, and a filter located in the first gas line for removing impurities contained in the gas.

Claims

1. A plasma spectrometric apparatus comprising a sample introducer for producing and delivering an injector gas containing an analyte sample, a plasma generator for generating plasma into which the injector gas is introduced, and an analyzer disposed subsequent to the plasma generator for analyzing the analyte sample, wherein the plasma spectrometric apparatus further comprises:

a first gas line for supplying gas to said sample introducer;

a second gas line for supplying gas to said plasma generator; and

a filter located in said first gas line for removing impurities contained in the gas.

2. The plasma spectrometric apparatus of claim 1, wherein said first gas line and said second gas line are branched from a source gas line.

3. The plasma spectrometric apparatus of claim 1, wherein the flow rate through said first gas line is smaller than the flow rate through said second gas line.

4. The plasma spectrometric apparatus of claim 1, wherein said filter is a gas purifier.

5. The plasma spectrometric apparatus of claim 1, wherein said first gas line branches into a third gas line and a fourth gas line, one delivering a carrier gas and the other delivering a make-up gas to said sample introducer.

6. The plasma spectrometric apparatus of claim 5, wherein said filter is located in each of said third gas line and said fourth gas line.

7. The plasma spectrometric apparatus of claim 1, wherein said second gas line branches into a fifth gas line and a sixth gas line, one delivering a plasma gas and the other delivering an auxiliary gas to said plasma generator.

8. The plasma spectrometric apparatus of claim 1, wherein a seventh gas line for delivering an auxiliary gas to said plasma generator is branched from said first gas line.

9. The plasma spectrometric apparatus of claim 1, wherein an eighth gas line for delivering a dilution gas to said sample introducer is branched from said first gas line.

10. The plasma spectrometric apparatus of claim 1, further comprising:

an optional gas line for supplying an option gas to said sample introducer, and

a second filter located in said optional gas line for removing impurities contained in the option gas,

wherein said option gas is an oxygen-containing gas selected from the group consisting of oxygen, argon-containing oxygen, nitrogen-containing oxygen, helium-containing oxygen, and mixtures thereof.

11. The plasma spectrometric apparatus of claim 1, wherein the gas supplied through each of said first and said second gas lines is selected from the group consisting of argon, nitrogen, helium, hydrogen, and mixtures thereof.

12. The plasma spectrometric apparatus of claim 1, wherein said sample introducer comprises a nebulizer for producing said injector gas by mixing said analyte sample with the gas from said first gas line.

13. The plasma spectrometric apparatus of claim 1, wherein said injector gas is the output from a gas chromatograph.

14. The plasma spectrometric apparatus of claim 1, wherein said injector gas is the output from a laser ablation device.

15. The plasma spectrometric apparatus of claim 1, wherein said plasma generator comprises a plasma torch for receiving the gas from said second gas line to generate plasma into which the injector gas is introduced.