TEST APPARATUS FOR LIGHT EMITTING DEVICES

• US 20170234937A1
• Filed: 08/11/2016
• Published: 08/17/2017
• Est. Priority Date: 02/15/2016
• Status: Abandoned Application

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Park, Seung Won, Kang, Seung Won, Lee, Joon Sub
• Application Number:
  US15/234,417
• Publication Number:
  US 20170234937A1
• Time in Patent Office: Days
• CPC Class Codes: G01J 1/0223 Sample holders for photometry
• CPC Class Codes: G01J 1/42 using electric radiation detectors optical or mechanical part G01J1/04; by comparison with a reference light or electric value G01J1/10
• CPC Class Codes: G01J 2001/4252 for testing LED's
• CPC Class Codes: G01R 31/44 Testing lamps

Abstract

A testing apparatus includes a plate unit including at least one chip mounting unit on which a light emitting diode (LED) to be tested is mounted. The chip mounting unit has a first region in which the LED is overlaid and a second region surrounding the first region. The first and second electrode pads are disposed in the first region and include respective extension portions extended toward the second region. A probe portion is configured to connect to the extension portions of the first and second electrode pads. A power control unit is configured to selectively apply test power to the LED through the probe portion. A light measuring unit is configured to measure light properties of light emitted by the LED.

Claims

1. A test apparatus, comprising:

a plate unit including at least one chip mounting unit on which a light emitting diode (LED) chip to be tested is mounted, the chip mounting unit having a first region in which the LED chip is overlaid and a second region surrounding the first region;

a first electrode pad and a second electrode pad disposed in the first region and including respective extension portions extended toward the second region;

a probe portion configured to connect to the extension portions of the first and second electrode pads;

a power control unit configured to selectively apply test power to the LED chip through the probe portion; and

a light measuring unit configured to measure light properties of light emitted by the LED chip.

2. The test apparatus of claim 1, wherein the first and second electrode pads have substantially the same shape.

3. The test apparatus of claim 1, wherein the at least one chip mounting unit is fixedly inserted into a connection recess disposed on an edge of the plate unit.

4. The test apparatus of claim 1, wherein the first region includes a convex portion disposed thereon.

5. The test apparatus of claim 1, wherein the at least one chip mounting unit includes an elastic material layer on the first region to improve adhesion of the first region to the LED chip.

6. The test apparatus of claim 1, wherein the first region includes an inlet vacuum port passing through the at least one chip mounting unit in a direction perpendicular to a width of the LED chip.

7. The test apparatus of claim 1, wherein the first region is disposed in a region where the LED chip is disposed, and the second region is disposed on an edge of the at least one chip mounting unit.

8. The test apparatus of claim 1, wherein the LED chip is disposed in the first region with electrical connections of the LED chip proximally located to the first region.

9. A test apparatus device, comprising:

a plate unit including at least one chip mounting unit on which a light emitting diode (LED) chip to be tested is mounted, having a first region in which the LED chip is overlaid and a second region surrounding the first region;

a first electrode pad and a second electrode pad disposed in the first region and including respective portions extended toward the second region;

a first via electrode and a second via electrode electrically connected to the first and second electrode pads respectively, and passing through the at least one chip mounting unit in a direction perpendicular to a width of the LED chip to apply test power to the first and second electrode pads;

a probe portion configured to connect to the first and second via electrodes;

a power control unit configured to selectively control power applied to the probe portion;

a power control unit configured to selectively apply test power to the LED through the probe portion; and

a light measuring unit configured to measure light properties of light emitted by the LED chip.

10. The test apparatus of claim 9, wherein the at least one chip mounting unit is fixedly inserted into a connection recess disposed on an edge of the plate unit.

11. The test apparatus of claim 10, further comprising first and second connection terminals on a lower surface of the connection recess, connected to the respective first and second via electrodes to supply power applied by the power control unit.

12. The test apparatus of claim 10, wherein in the at least one chip mounting unit, first and second connection pads are further disposed on a surface in contact with the respective first and second connection terminals.

13. The test apparatus of claim 9, wherein the first electrode pad is electrically isolated from the second electrode pad.

14. The test apparatus of claim 9, wherein in the first region an inlet port passes through the at least one chip mounting unit in a direction perpendicular to a width of the LED chip.

15. The test apparatus of claim 9, wherein the LED chip is disposed in the first region with electrical connections of the LED chip proximally located to the first region.

16. A test apparatus comprising:

a movable plate configured to receive one or more test adaptors, each test adaptor configured to receive a respective light emitting diode (LED) by reducing a pressure between the respective test adaptor and a front surface of the LED opposing a photonic emitting surface of the LED, the test adaptor including a pair of displaced electrode pads configured to contact a respective pair of device electrodes disposed on the front surface of the LED;

a light measurement unit configured to measure a photonic emission from the photonic emitting surface of a respective one of the LEDs to determine an optical property of the LED, the light measurement unit positioned proximal to the photonic emitting surface of the LED; and

a power unit configured to supply a current to the LED through a first probe and a second probe connected between the power unit and the respective displaced electrode pad.

17. The test apparatus of claim 16 wherein the electrode pads are laterally displaced from the LED, collinear with the front surface of the LED, and the light measurement unit is disposed between the first probe and the second probe.

18. The test apparatus of claim 17 wherein each of the electrode pads include an elastically deformable cantilever portion in contact with the respective device electrode of the LED.

19. The test apparatus of claim 16 wherein the electrode pads are vertically displaced from the LED, perpendicular from the front surface of the LED, and the first probe and the second probe contact the electrode pads on a surface of the movable plate opposing a test surface proximal to the LED.

20. The test apparatus of claim 16 wherein the movable plate is a rotatable plate comprising a plurality of test adaptors circumferentially disposed thereon.