METHOD AND ARRANGEMENT FOR MEASURING A FORCE OR A MOMENT, USING MULTIPLE MANGETIC SENSORS
First Claim
1. An arrangement for measuring at least one of a force or a moment on a machine extending along an axis, in which the machine element includes a magnetization area for a magnetization extending circumferentially around the axis, the arrangement further comprises at least one first magnetic field sensor and one second magnetic field sensor each of which are formed for individually measuring a first and a second directional component of a magnetic field caused by the magnetization and by the at least one of the force or the moment, wherein the first directional component of the magnetic field measurable with the first magnetic field sensor and the second directional component of the magnetic field measurable with the first magnetic field sensor have different orientations, wherein the first directional component of the magnetic field measurable with the second magnetic field sensor and the second directional component of the magnetic field measurable with the second magnetic field sensor have different orientations, and the first magnetic field sensor and the second magnetic field sensor are arranged at different circumferential positions about the axis.
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Accused Products
Abstract
The present invention relates to a method and an arrangement for measuring a force and/or moment on a machine element extending along an axis, using the inverse magnetostrictive effect. The machine element has a magnetization region for magnetization, this region fully encompassing the axis. The arrangement includes at least one first magnetic sensor and one second magnetic sensor, each being designed to measure individually a first and a second direction component of a magnetic field that is caused by the magnetization and by the force and/or the moment. The direction components that can be measured using the first magnetic sensor have differing orientations. Likewise, the direction components that can be measured using the second magnetic sensor have differing orientations. The first magnetic sensor and the second magnetic sensor are arranged around the axis at different peripheral positions.
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Citations
10 Claims
- 1. An arrangement for measuring at least one of a force or a moment on a machine extending along an axis, in which the machine element includes a magnetization area for a magnetization extending circumferentially around the axis, the arrangement further comprises at least one first magnetic field sensor and one second magnetic field sensor each of which are formed for individually measuring a first and a second directional component of a magnetic field caused by the magnetization and by the at least one of the force or the moment, wherein the first directional component of the magnetic field measurable with the first magnetic field sensor and the second directional component of the magnetic field measurable with the first magnetic field sensor have different orientations, wherein the first directional component of the magnetic field measurable with the second magnetic field sensor and the second directional component of the magnetic field measurable with the second magnetic field sensor have different orientations, and the first magnetic field sensor and the second magnetic field sensor are arranged at different circumferential positions about the axis.
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10. A method for measuring at least one of a force or a moment, wherein the force or the moment acts on a machine element that extends along an axis and has a magnetization area extending about the axis for a magnetization extending about the axis, the method comprising:
- measuring the at least one of the force or the moment in at least two differential circumferential positions about the axis at each of which at least two directional components with different orientations of a magnetic field caused by the magnetization and by the at least one of the force or the moment are determined.
Specification