ABNORMALITY MEASURING METHOD AND ABNORMALITY MEASURING APPARATUS
First Claim
1. An abnormality measuring method, comprising:
- acquiring a feature sequence corresponding to a life cycle according to a recipe information and a sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is relative to a plurality of process runs;
performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of feature subset sequences corresponding to one of the plurality of life segments;
building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and
determining whether to send an alarm message according to a plurality of trending distributions.
1 Assignment
0 Petitions
Accused Products
Abstract
An abnormality measuring method and an abnormality measuring apparatus of equipment are provided. The abnormality measuring method includes the following steps: acquiring a feature sequence corresponding to a life cycle according to recipe information and sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is relative to a plurality of process runs; performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of the feature subset sequences corresponding to one of the plurality of life segments; building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and determining whether to send an alarm message according to a plurality of trending distributions.
4 Citations
23 Claims
-
1. An abnormality measuring method, comprising:
-
acquiring a feature sequence corresponding to a life cycle according to a recipe information and a sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is relative to a plurality of process runs; performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of feature subset sequences corresponding to one of the plurality of life segments; building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and determining whether to send an alarm message according to a plurality of trending distributions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. An apparatus for measuring abnormality, comprising:
-
a feature extraction module, acquiring a feature sequence corresponding to a life cycle according to a recipe information and a sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is related to a plurality of process runs; a life segment analyzing module coupled to the feature extraction module, performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of feature subset sequences corresponding to one of the plurality of life segments; a trending analyzing module coupled to the feature extraction module and the life segment analyzing module, building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and a warning module coupled to the tending analyzing module, determining whether to send an alarm message according to a plurality of trending distributions. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
-
Specification