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ABNORMALITY MEASURING METHOD AND ABNORMALITY MEASURING APPARATUS

  • US 20170276720A1
  • Filed: 10/05/2016
  • Published: 09/28/2017
  • Est. Priority Date: 03/23/2016
  • Status: Active Application
First Claim
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1. An abnormality measuring method, comprising:

  • acquiring a feature sequence corresponding to a life cycle according to a recipe information and a sensing information, wherein the feature sequence includes a plurality of feature subset sequences, and the life cycle is relative to a plurality of process runs;

    performing repeatedly a life segment analyzing process to acquire a plurality of life segments of the life cycle and each of the plurality of feature subset sequences corresponding to one of the plurality of life segments;

    building a corresponding trending distribution of each of the plurality of life segments according to a corresponding feature subset sequence of the life segment; and

    determining whether to send an alarm message according to a plurality of trending distributions.

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