DETERMINING THE LEACHING PROFILE OF A CUTTER ON A DRILLING TOOL

• US 20170307547A1
• Filed: 11/24/2014
• Published: 10/26/2017
• Est. Priority Date: 11/24/2014
• Status: Active Grant

• Current Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Original Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Inventors: LIANG, Qi, SAINI, Gagan
• Granted Patent: US 10,444,167 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 2223/33 scanning, i.e. relative motion for measurement of successive object-parts
• CPC Class Codes: G01N 2223/3308 object translates
• CPC Class Codes: G01N 2223/61 thin films, coatings
• CPC Class Codes: G01N 2223/652 impurities, foreign matter, trace amounts
• CPC Class Codes: G01N 23/083 the radiation being X-rays
• CPC Class Codes: G01N 23/18 Investigating the presence of flaws defects or foreign matter

Abstract

In accordance with some embodiments of the present disclosure, systems and methods for determining the leaching profile of cutter on a drilling tool are disclosed. The method includes applying an X-ray impermeable layer to a surface of a leached PCD element with residual infiltrant. The method also includes moving the element through an X-ray beam. The method further includes detecting an X-ray intensity received by an X-ray detector. The method further includes generating a leaching profile of the leached PCD element based on the X-ray intensity.

Claims

1. A method for detecting residual infiltrant in a leached PCD element comprising:

applying an X-ray impermeable layer to a surface of a leached PCD element with residual infiltrant;

moving the element through an X-ray beam;

detecting an X-ray intensity received by an X-ray detector; and

generating a leaching profile of the leached PCD element based on the X-ray intensity.

2. The method of claim 1, further comprising calculating a leaching depth for the leached PCD element based on a location of the X-ray impermeable layer and the X-ray intensity.

3. The method of claim 1, further comprising calculating a residual infiltrant concentration for at least a portion of the leached PCD element based on an X-ray permeability of the portion of the leached PCD element.

4. The method of claim 1, wherein the X-ray impermeable layer is a metal tape, a metal disposition, or a metal coating.

5. The method of claim 1, wherein a thickness of the X-ray impermeable layer is greater than a width of the X-ray beam.

6. The method of claim 1, wherein the X-ray beam is a point scanning beam.

7. The method of claim 1, wherein the X-ray beam is a line scanning beam.

8. The method of claim 1, further comprising rotating the leached PCD element across the X-ray beam.

9. A system for detecting residual infiltrant in a leached PCD element comprising:

a leached PCD element with residual infiltrant;

an X-ray impermeable layer applied to a surface of a leached PCD element with residual infiltrant; and

an X-ray testing device operable to;

expose the leached PCD element to an X-ray beam;

move the leached PCD element across the X-ray beam;

detect an X-ray intensity received by an X-ray detector; and

generate a leaching profile of the leached PCD element based on the X-ray intensity.

10. The system of claim 9, the X-ray testing device is further operable to calculate a leaching depth for the leached PCD element based on a location of the X-ray impermeable layer and the X-ray intensity.

11. The system of claim 9, the X-ray testing device is further operable to calculate a residual infiltrant concentration for at least a portion of the leached PCD element based on an X-ray permeability of the portion of the leached PCD element.

12. The system of claim 9, wherein the X-ray impermeable layer is a metal tape, a metal disposition, or a metal coating.

13. The system of claim 9, wherein a thickness of the X-ray impermeable layer is greater than a width of the X-ray beam.

14. The system of claim 9, wherein the X-ray beam is a point scanning beam.

15. The system of claim 9, wherein the X-ray beam is a line scanning beam.

16. The system of claim 9, the X-ray testing device is further operable to rotate the leached PCD element across the X-ray beam.

17. A non-transitory machine-readable medium comprising instructions stored therein, the instructions executable by one or more processors to facilitate performing a method for detecting residual infiltrant in an element, comprising:

applying an X-ray impermeable layer to a surface of a leached PCD element with residual infiltrant;

moving the element through an X-ray beam;

detecting an X-ray intensity received by an X-ray detector; and

generating a leaching profile of the leached PCD element based on detected X-rays.

18. The non-transitory machine-readable medium of claim 17, the method further comprising calculating a leaching depth for the leached PCD element based on a location of the X-ray impermeable layer and the X-ray intensity.

19. The non-transitory machine-readable medium of claim 17, the method further comprising calculating a residual infiltrant concentration for at least a portion of the leached PCD element based on an X-ray permeability of the portion of the leached PCD element.

20. The non-transitory machine-readable medium of claim 17, wherein a thickness of the X-ray impermeable layer is greater than a width of the X-ray beam.