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FAULT DETECTION USING EVENT-BASED PREDICTIVE MODELS

  • US 20170322120A1
  • Filed: 05/03/2016
  • Published: 11/09/2017
  • Est. Priority Date: 05/03/2016
  • Status: Active Grant
First Claim
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1. A method for diagnosing faults to predict faults comprising:

  • providing, to an analyzer server, event data of events from sensors for measuring operating metrics of devices of a system of devices, wherein the event data comprises alarm events of devices;

    analyzing the event data to identify relationships of events;

    defining a device health index (DHI) based on identified relationships of events to predict failures based on the DHI; and

    monitoring, by the analyzer server, events from sensors of the devices to determine possible failures based on the DHI.

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