HIGH SPEED METROLOGY WITH NUMERICALLY CONTROLLED MACHINES
First Claim
1. A system, comprising:
- a first computer component configured to generate an index signal that increments periodically at a regular or substantially regular first frequency;
a second computer component configured to measure and record, at a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine;
a third computer component configured to record workpiece metrology values and corresponding index signal values of the index signal to yield a first matrix of metrology values and index signal values, wherein the workpiece metrology values are measured by a metrology device for a workpiece associated with the manufacturing machine;
a fourth computer component configured to temporally adjust the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values;
a fifth computer component configured to interpolate the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values;
a sixth computer component configured to apply a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and
a seventh computer component configured to generate report data based on the spatially oriented workpiece metrology value matrix.
1 Assignment
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Accused Products
Abstract
Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
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Citations
20 Claims
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1. A system, comprising:
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a first computer component configured to generate an index signal that increments periodically at a regular or substantially regular first frequency; a second computer component configured to measure and record, at a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine; a third computer component configured to record workpiece metrology values and corresponding index signal values of the index signal to yield a first matrix of metrology values and index signal values, wherein the workpiece metrology values are measured by a metrology device for a workpiece associated with the manufacturing machine; a fourth computer component configured to temporally adjust the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values; a fifth computer component configured to interpolate the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values; a sixth computer component configured to apply a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and a seventh computer component configured to generate report data based on the spatially oriented workpiece metrology value matrix. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method, comprising:
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generating, by a system comprising at least one processor, an index signal that increments periodically at a regular or substantially regular first frequency; recording, by the system at a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine; recording, by the system, workpiece metrology values measured by a metrology device for a workpiece associated with the manufacturing machine; recording, by the system, index signal values of the index signal corresponding to the workpiece metrology values to yield a first matrix of metrology values and index signal values; temporally adjusting, by the system, the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values; interpolating, by the system, the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values; applying, by the system, a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and generating, by the system, report data based on the spatially oriented workpiece metrology value matrix. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A computer-readable medium having stored thereon executable components that, in response to execution, cause a system comprising at least one processor to perform operations, the operations comprising:
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generating an index signal that increments periodically according to a regular or substantially regular first frequency; recording, according to a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine; recording workpiece metrology values measured by a metrology device for a workpiece associated with the manufacturing machine; recording index signal values of the index signal corresponding to the workpiece metrology values to yield a first matrix of metrology values and index signal values; temporally adjusting the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values; interpolating the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values; applying a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and generating report data based on the spatially oriented workpiece metrology value matrix. - View Dependent Claims (20)
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Specification