HIGH SPEED METROLOGY WITH NUMERICALLY CONTROLLED MACHINES

• US 20170328708A1
• Filed: 12/01/2016
• Published: 11/16/2017
• Est. Priority Date: 12/08/2012
• Status: Active Grant

• Current Assignee: Grale Technologies, Inc.
• Original Assignee: Grale Technologies, Inc.
• Inventors: Garvey, Michael, Osterloh, James D., Persi, Fred
• Granted Patent: US 10,295,341 B2
• Time in Patent Office: Days
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01B 21/16 for measuring distance of clearance between spaced objects
• CPC Class Codes: G05B 19/401 characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes G05B19/19 takes precedence
• CPC Class Codes: G05B 2219/37198 Machine as measuring station, use tool or probe, in process incycle
• CPC Class Codes: Y02P 80/40 Minimising material used in manufacturing processes

Abstract

Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.

Claims

1. A system, comprising:

a first computer component configured to generate an index signal that increments periodically at a regular or substantially regular first frequency;

a second computer component configured to measure and record, at a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine;

a third computer component configured to record workpiece metrology values and corresponding index signal values of the index signal to yield a first matrix of metrology values and index signal values, wherein the workpiece metrology values are measured by a metrology device for a workpiece associated with the manufacturing machine;

a fourth computer component configured to temporally adjust the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values;

a fifth computer component configured to interpolate the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values;

a sixth computer component configured to apply a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and

a seventh computer component configured to generate report data based on the spatially oriented workpiece metrology value matrix.

2. The system of claim 1, wherein the first computer component is a component of the manufacturing machine.

3. The system of claim 1 wherein the first computer component is a component of the metrology device.

4. The system of claim 1, further comprising an eighth computer component configured to send the index signal to the manufacturing machine in a format compatible with the manufacturing machine.

5. The system of claim 1, wherein the first frequency is higher than the second frequency.

6. The system of claim 1, further comprising the metrology device, wherein the metrology device is configured to vary a rate of measurement of the workpiece metrology values based on a measured characteristic of the workpiece.

7. The system of claim 1, wherein at least one of the first computer component or the third computer component is configured to convert the workpiece metrology values to encoded metrology values having a format compatible with the manufacturing machine.

8. The system of claim 7, wherein the third computer component is further configured to apply an offset to at least one of the encoded metrology values or the position coordinate values that synchronizes or substantially synchronizes the encoded metrology values with the position coordinate values.

9. The system of claim 7, wherein the third computer component is further configured to apply a temporal delay value to the position coordinate values that synchronizes or substantially synchronizes the position coordinate values with the encoded metrology values.

10. The system of claim 1, wherein the metrology device comprises one of a surface flaw detector, a through-body inspection device, or an x-ray fluorescence (XRF) analyzer.

11. The system of claim 1, wherein

the second computer component is configured to record the position coordinate values in association with respective first index signal values corresponding to times at which the position coordinate values were generated, and

the third computer component is configured to record a workpiece metrology value, of the workpiece metrology values, in association with a second index signal value corresponding to a time of recording the metrology value, and to associate the workpiece metrology value with an interpolated coordinate value between two of the position coordinate values based on a comparison between the first index signal value and the second index signal values.

12. A method, comprising:

generating, by a system comprising at least one processor, an index signal that increments periodically at a regular or substantially regular first frequency;

recording, by the system at a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine;

recording, by the system, workpiece metrology values measured by a metrology device for a workpiece associated with the manufacturing machine;

recording, by the system, index signal values of the index signal corresponding to the workpiece metrology values to yield a first matrix of metrology values and index signal values;

temporally adjusting, by the system, the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values;

interpolating, by the system, the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values;

applying, by the system, a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and

generating, by the system, report data based on the spatially oriented workpiece metrology value matrix.

13. The method of claim 12, wherein the first frequency is higher than the second frequency.

14. The method of claim 12, further comprising varying, by the system, a rate of measurement of the workpiece metrology values based on a measured characteristic of the workpiece.

15. The method of claim 12, further comprising converting, by the system, the workpiece metrology values to encoded metrology values having a format compatible with the manufacturing machine.

16. The method of claim 15, further comprising offsetting, by the system, at least one of the encoded metrology values or the position coordinate values according to an offset value that synchronizes or substantially synchronizes the encoded metrology values with the position coordinate values.

17. The method of claim 15, further comprising applying, by the system, a temporal delay value to the position coordinate values that synchronizes or substantially synchronizes the position coordinate values with the encoded metrology values.

18. The method of claim 12, further comprising:

recording, by the system, the position coordinate values in association with respective first index signal values corresponding to times at which the position coordinate values were generated;

recording, by the system, a workpiece metrology value, of the workpiece metrology values, in association with a second index signal value corresponding to a time of recording the metrology value, and

assigning, by the system, the workpiece metrology value to an interpolated coordinate value between two of the position coordinate values based on a comparison between the first index signal value and the second index signal values.

19. A computer-readable medium having stored thereon executable components that, in response to execution, cause a system comprising at least one processor to perform operations, the operations comprising:

generating an index signal that increments periodically according to a regular or substantially regular first frequency;

recording, according to a regular or substantially regular second frequency, position coordinate values of a manufacturing machine during a cycle of movement of an operating tool arm of the manufacturing machine;

recording workpiece metrology values measured by a metrology device for a workpiece associated with the manufacturing machine;

recording index signal values of the index signal corresponding to the workpiece metrology values to yield a first matrix of metrology values and index signal values;

temporally adjusting the index signal values to yield a second matrix of metrology values and temporally adjusted index signal values;

interpolating the position coordinate values corresponding to the temporally adjusted index signal values to yield interpolated coordinate values;

applying a vector addition of interpolated coordinate values and corresponding workpiece metrology values to yield a spatially oriented workpiece metrology value matrix; and

generating report data based on the spatially oriented workpiece metrology value matrix.

20. The computer-readable medium of claim 19, the operations further comprising:

recording the position coordinate values in association with respective first index signal values corresponding to times at which the position coordinate values were generated;

recording a workpiece metrology value, of the workpiece metrology values, in association with a second index signal value corresponding to a time of recording the metrology value, and

assigning the workpiece metrology value to an interpolated coordinate value between two of the position coordinate values based on a comparison between the first index signal value and the second index signal values.