MEASURING ASSEMBLY
First Claim
1. A measuring assembly for measuring the contour of a workpiece, comprising:
- a) a measuring probe that is pivotably supported and deflectable about a first axis in order tc contact a surface of the workpiece;
b) a second axis that is associated with the workpiece;
c) the first axis and the second axis are substantially parallel to one another for radially contacting a surface of the workpiece;
d) a means for rotating the measuring probe and the workpiece relative to one another are provided, such that the measuring probe contacts the surface of the workpiece during the rotation; and
e) a means for plotting the angular deflection of the measuring probe as a function of the rotational position of the workpiece relative to the measuring probe is provided.
1 Assignment
0 Petitions
Accused Products
Abstract
A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.
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Citations
17 Claims
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1. A measuring assembly for measuring the contour of a workpiece, comprising:
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a) a measuring probe that is pivotably supported and deflectable about a first axis in order tc contact a surface of the workpiece; b) a second axis that is associated with the workpiece; c) the first axis and the second axis are substantially parallel to one another for radially contacting a surface of the workpiece; d) a means for rotating the measuring probe and the workpiece relative to one another are provided, such that the measuring probe contacts the surface of the workpiece during the rotation; and e) a means for plotting the angular deflection of the measuring probe as a function of the rotational position of the workpiece relative to the measuring probe is provided. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A measuring assembly for measuring the contour of a workpiece, comprising:
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a) a measuring probe is provided that is pivotably supported and deflectable about a first axis in order to contact a surface of the workpiece; b) a second axis that is associated with the workpiece; c) the first axis and the second axis are substantially parallel to one another for radially contacting a surface of the workpiece; d) a rotary drive for rotating the measuring probe and the workpiece relative to one another, such that the measuring probe contacts the surface of the workpiece during the rotation; and e) of a plotter is provided, the plotter plots the angular deflection of the measuring probe as a function of the rotational position of the workpiece relative to the measuring probe. - View Dependent Claims (14, 15, 16, 17)
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Specification