BURN-IN TESTING OF INDIVIDUALLY PERSONALIZED SEMICONDUCTOR DEVICE CONFIGURATION

• US 20170370988A1
• Filed: 06/28/2016
• Published: 12/28/2017
• Est. Priority Date: 06/28/2016
• Status: Abandoned Application

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Motika, Franco, You, Soungbum
• Application Number:
  US15/194,971
• Publication Number:
  US 20170370988A1
• Time in Patent Office: Days
• CPC Class Codes: G01R 31/287 Procedures; Software aspects
• CPC Class Codes: G01R 31/2875 related to heating

Abstract

Examples of techniques for burn-in testing of an individually personalized device configuration are disclosed. In one example implementation according to aspects of the present disclosure, a computer-implemented method may include: retrieving the individually personalized device configuration; enabling a device to receive the individually personalized device configuration, wherein the device is one of a plurality of devices; and loading the individually personalized device configuration to the device that is enabled, wherein other devices of the plurality of devices are disabled from receiving the individually personalized device configuration.

Claims

1. A computer-implemented method for burn-in testing of an individually personalized device configuration, the method comprising:

retrieving the individually personalized device configuration;

enabling a device to receive the individually personalized device configuration, wherein the device is one of a plurality of devices; and

loading the individually personalized device configuration to the device that is enabled, wherein other devices of the plurality of devices are disabled from receiving the individually personalized device configuration.

2. The computer-implemented method of claim 1, further comprising:

initiating a burn-in test of the plurality of devices.

3. The computer-implemented method of claim 1, wherein the device is a first device, the method further comprising:

subsequent to loading the individually personalized device configuration to the first device, disabling the first device;

retrieving a second individually personalized device configuration;

enabling a second device to receive the second individually personalized device configuration, wherein the second device is one of the plurality of devices, and wherein other devices of the plurality of devices and the first device are disabled from receiving the second individually personalized device configuration;

loading the second individually personalized device configuration to the device; and

initiating a burn-in test of the plurality of devices.

4. The computer-implemented method of claim 1, wherein the device is enabled via a serial interface between a burn-in test system and the device.

5. The computer-implemented method of claim 1, wherein the device is enabled via a parallel interface between a burn-in test system and the device.

6. The computer-implemented method of claim 1, wherein the device is enabled via a field-replaceable unit service interface between a control device and the device.

7. The computer-implemented method of claim 1, wherein the device is enabled via a radio frequency interface between a burn-in test system and the device.

8. The computer-implemented method of claim 1, wherein the plurality of devices are connected to a burn-in board for testing the plurality of devices, and wherein the burn-in board and the plurality of devices are positioned within an oven to provide heat to the plurality of devices.

9. The computer-implemented method of claim 1, further comprising:

subsequent to loading the individually personalized device configuration to the device, disabling the device;

enabling the plurality of devices not including the device;

loading a standard device configuration to the plurality of devices not including the device; and

initiating a burn-in test of the plurality of devices.

10. A system for burn-in testing of an individually personalized device configuration, the system comprising:

a memory having computer readable instructions; and

a processing device for executing the computer readable instructions, the computer readable instructions comprising;

retrieving the individually personalized device configuration;

enabling a device to receive the individually personalized device configuration, wherein the device is one of a plurality of devices; and

loading the individually personalized device configuration to the device that is enabled, wherein other devices of the plurality of devices are disabled from receiving the individually personalized device configuration.

11. The system of claim 10, wherein the computer readable instructions further comprise:

initiating a burn-in test of the plurality of devices.

12. The system of claim 10, wherein the device is a first device, and wherein the computer readable instructions further comprise:

subsequent to loading the individually personalized device configuration to the first device, disabling the first device;

retrieving a second individually personalized device configuration;

enabling a second device to receive the second individually personalized device configuration, wherein the second device is one of the plurality of devices, and wherein other devices of the plurality of devices and the first device are disabled from receiving the second individually personalized device configuration;

loading the second individually personalized device configuration to the device; and

initiating a burn-in test of the plurality of devices.

13. The system of claim 10, wherein the device is enabled via a serial interface between a burn-in test system and the device.

14. The system of claim 10, wherein the device is enabled via a parallel interface between a burn-in test system and the device.

15. The system of claim 10, wherein the device is enabled via a field-replaceable unit service interface between a control device and the device.

16. The system of claim 10, wherein the device is enabled via a radio frequency interface between a burn-in test system and the device.

17. The system of claim 10, wherein the plurality of devices are connected to a burn-in board for testing the plurality of devices, and wherein the burn-in board and the plurality of devices are positioned within an oven to provide heat to the plurality of devices.

18. The system of claim 10, further comprising:

subsequent to loading the individually personalized device configuration to the device, disabling the device;

enabling the plurality of devices not including the device;

loading a standard device configuration to the plurality of devices not including the device; and

initiating a burn-in test of the plurality of devices.

19. A computer program product for burn-in testing of an individually personalized device configuration, the computer program product comprising:

a non-transitory computer readable storage medium having program instructions embodied therewith, the program instructions executable by a processing device to cause the processing device to;

retrieve the individually personalized device configuration;

enable a device to receive the individually personalized device configuration, wherein the device is one of a plurality of devices; and

load the individually personalized device configuration to the device that is enabled, wherein other devices of the plurality of devices are disabled from receiving the individually personalized device configuration.

20. The computer program product of claim 19, wherein the program instructions cause the processing device to:

subsequent to loading the individually personalized device configuration to the device, disable the device;

enable the plurality of devices not including the device;

load a standard device configuration to the plurality of devices not including the device; and

initiate a burn-in test of the plurality of devices.