Test strip, system and method of inspection

• US 20180067105A1
• Filed: 09/05/2016
• Published: 03/08/2018
• Est. Priority Date: 09/05/2016
• Status: Active Grant

• Current Assignee: Cheng-Hao Ko
• Original Assignee: Cheng-Hao Ko
• Inventors: Ko, Cheng-Hao
• Granted Patent: US 10,533,993 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/293 with colour charts, graduated scales or turrets
• CPC Class Codes: G01N 21/78 producing a change of colour
• CPC Class Codes: G01N 33/521 Single-layer analytical elements

Abstract

The invention provides a test strip comprising an identification region coded a screen function of the test strip by a chromaticity coordinates model; a calibration region having a particular color for calibrating an external spectrum analyzer; and a reaction region chemically reacted with a specific specimen for changing its own color. By using the external spectrum analyzer to conduct light splitting of the reflective lights from the recognition and reaction regions of the test strip, automatic recognition and simplified usage can be achieved.

Claims

1. A test strip, comprising:

an identification region, coded a screening function of the test strip by a chromaticity coordinates model;

a calibration region, having a particular color for calibrating an external spectrum analyzer; and

a reaction region, chemically reacted with a particular specimen for changing its own color.

2. The test strip of claim 1, wherein the external spectrum analyzer conducts light splitting of reflective lights from the identification region and the reaction region.

3. The test strip of claim 1, wherein the external spectrum analyzer conducts light splitting of a reflective light from the calibration region, and a self-calibration on errors as well.

4. An inspection system of test strips, comprising:

a test strip comprising;

an identification region, coded a screening function of the test strip by a chromaticity coordinates model;

a calibration region, having a particular color; and

a reaction region, chemically reacted with a particular specimen for changing its own color;

a spectrum analyzer, conducting a light splitting calibration through the calibration region, and generating two light splitting signals based on colors of the identification region and the reaction region; and

a display, determining a test result according to the two light splitting signals.

5. The inspection system of test strips of claim 4, wherein a parameter truth table is stored in the display, and the test result is generated by comparing the two light splitting signals with the parameter truth table.

6. The inspection system of test strips of claim 4, wherein the spectrum analyzer is a system-on-a-chip (SOC), and elements inside the SOC are completed by utilizing a high energy light source with wavelengths ranged between 0.01 nm and 100 nm to expose a photoresist layer, and then removing the unexposed photoresist layer.

7. An inspection method of test strips, including the following steps:

providing a test strip comprising an identification region, a calibration region and a reaction region;

wherein the identification region is coded a screening function of the test strip by a chromaticity coordinates model;

wherein the calibration region has a particular color; and

wherein the reaction region is chemically reacted with a specific specimen for changing its own color;

providing the specific specimen for contacting with the reaction region;

providing a light splitting calibration to a spectrum analyzer through the calibration region;

splitting reflective lights from the identification region and the reaction region by the spectrum analyzer for generating two light splitting signals; and

providing a display for showing a test result which is determined according to the two light splitting signals.

8. The inspection method of test strip of claim 7, wherein the specific color is white.

9. The inspection method of test strips of claim 7, further comprising the step of storing a parameter truth table inside the display, thereby the test result is generated by comparing the two light splitting signals with the parameter truth table.

10. The inspection method of test strips of claim 7, wherein the spectrum analyzer is a system-on-a-chip (SOC), and elements inside the SOC are completed by utilizing a high energy light source with wavelengths ranged between 0.01 nm and 100 nm to expose a photoresist layer, and then removing the unexposed photoresist layer.