IMAGING PANEL AND X-RAY IMAGING DEVICE INCLUDING SAME

• US 20180097027A1
• Filed: 04/13/2016
• Published: 04/05/2018
• Est. Priority Date: 04/17/2015
• Status: Abandoned Application

• Current Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Inventors: SAITOH, TAKAO, KANEKO, SEIJI, TAKAMARU, YUTAKA, KANZAKI, YOHSUKE
• Application Number:
  US15/567,254
• Publication Number:
  US 20180097027A1
• Time in Patent Office: Days
• CPC Class Codes: G01T 1/20 with scintillation detectors
• CPC Class Codes: G01T 1/247 Detector read-out circuitry for processing gain or off-set correction H04N
• CPC Class Codes: G01T 7/00 Details of radiation-measuring instruments
• CPC Class Codes: H01L 27/1225 with semiconductor materials not belonging to the group IV of the periodic table, e.g. InGaZnO
• CPC Class Codes: H01L 27/14612 involving a transistor
• CPC Class Codes: H01L 27/14663 Indirect radiation imagers, e.g. using luminescent members
• CPC Class Codes: H01L 29/45 Ohmic electrodes
• CPC Class Codes: H01L 29/66969 of devices having semiconductor bodies not comprising group 14 or group 13/15 materials comprising selenium or tellurium in uncombined form other than as impurities in semiconductor bodies of other materials, comprising cuprous oxide or cuprous iodide H01L21/02365
• CPC Class Codes: H01L 29/7869 having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
• CPC Class Codes: H04N 5/32 Transforming X-rays cameras or camera modules for generating image signals from X-rays H04N23/30; circuitry of SSIS for transforming X-rays into image signals H04N25/30

Abstract

Provided is an imaging panel and an imaging device with which the amount of irradiated X-ray can be reduced, and at the same time, the threshold voltage of a TFT during X-ray irradiation can be prevented from shifting. The imaging panel includes an imaging part that includes a plurality of pixels 13 that generate charges based on X-ray projected from an X-ray source, and a thin film transistor 14 for reading out the charges generated at the pixel 13. The thin film transistor 14 has a gate 141 and an oxide semiconductor layer 142, as well as a source 143S and a drain 143D formed on a part of the oxide semiconductor layer 142 by wet etching with respect to a metal film formed on the oxide semiconductor layer 142. The oxide semiconductor layer 142 contains indium, tin, gallium, and oxygen.

Claims

1. An imaging panel comprising:

an imaging part that includes a pixel that receives X-ray and outputs charges corresponding to the received X-ray; and

a thin film transistor for reading out the charges at the pixel,

wherein the thin film transistor includes;

a gate;

an oxide semiconductor layer; and

a source and a drain formed on a part of the oxide semiconductor layer, the source and the drain being formed by wet etching with respect to a metal film formed on the oxide semiconductor layer,

wherein the oxide semiconductor layer includes an ITZO layer that contains indium, tin, gallium, and oxygen.

2. The imaging panel according to claim 1,

wherein the oxide semiconductor layer further includes a semiconductor layer that is provided on the ITZO layer and contains indium and oxygen, as well as at least one of tin, zinc, gallium, and tungsten.

3. The imaging panel according to claim 1, further comprising:

an insulating film provided on the thin film transistor; and

a conductive part provided at a position opposed to the thin film transistor, in an upper layer above the insulating film, the conductive part being connected with the gate or the source through a contact hole formed in the insulating film.

6. An X-ray imaging device comprising:

the imaging panel according to claim 1;

an X-ray source that projects X-ray to the imaging panel; and

a control unit that controls a gate voltage of the thin film transistor in the imaging panel, and reads out a signal corresponding to charges generated at the pixel in the imaging panel.

4. An imaging panel comprising:

an imaging part that includes a pixel that receives X-ray and outputs charges corresponding to the received X-ray;

a thin film transistor for reading out the charges at the pixel;

an insulating film provided on the thin film transistor; and

a conductive part provided at a position opposed to the thin film transistor, in an upper layer above the insulating film,

wherein the thin film transistor includes;

a gate;

an oxide semiconductor layer;

a source provided on the oxide semiconductor layer; and

a drain provided on the oxide semiconductor layer,

wherein the oxide semiconductor layer includes an ITZO layer that contains indium, tin, gallium, and oxygen, and

the conductive part is connected with the gate or the source through a contact hole formed in the insulating film.

5. The imaging panel according to claim 4,

wherein the oxide semiconductor layer further includes a semiconductor layer that is provided on the ITZO layer and contains indium and oxygen, as well as at least one of tin, zinc, gallium, and tungsten.