SEMICONDUCTOR INSPECTION DEVICE
First Claim
1. A semiconductor test apparatus, comprising:
- a test socket having a socket surface formed thereon, the socket surface having a contact pin towering therefrom; and
a semiconductor transport fixture having a concave portion formed thereon, the concave portion adapted to receive therein an IC under test, whereinthe test socket has a position adjustment guide provided thereon,the semiconductor transport fixture has a guide through bore formed therein, the guide through bore adapted to receive the position adjustment guide therethrough when the IC under test comes under test, andeither one of the position adjustment guide or the guide through bore is formed in a tapered shape.
1 Assignment
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Accused Products
Abstract
A semiconductor test apparatus capable of securely having the contact pin and the external contact terminal held in contact with each other even in case where the vertical type handler is used. The semiconductor test apparatus comprises: a test socket having a socket surface formed thereon, the socket surface having a contact pin towering therefrom; and a semiconductor transport fixture having a concave portion formed thereon, the concave portion adapted to receive therein an IC under test, wherein the test socket has a position adjustment guide provided thereon, the semiconductor transport fixture has a guide through bore formed therein, the guide through bore adapted to receive the position adjustment guide therethrough when the IC under test comes under test, and either one of the position adjustment guide or the guide through bore is formed in a tapered shape.
3 Citations
6 Claims
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1. A semiconductor test apparatus, comprising:
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a test socket having a socket surface formed thereon, the socket surface having a contact pin towering therefrom; and a semiconductor transport fixture having a concave portion formed thereon, the concave portion adapted to receive therein an IC under test, wherein the test socket has a position adjustment guide provided thereon, the semiconductor transport fixture has a guide through bore formed therein, the guide through bore adapted to receive the position adjustment guide therethrough when the IC under test comes under test, and either one of the position adjustment guide or the guide through bore is formed in a tapered shape. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification