Transparent Force Sensitive Structures in an Electronic Device
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Abstract
One or more transparent transistor force sensitive structures can be included in an electronic device. The transistor force sensitive structures(s) is used to detect a force that is applied to the electronic device, to a component in the electronic device, and/or to an input region of the electronic device. As one example, the one or more transparent transistor force sensitive structures may be included in a display stack of a display in an electronic device.
8 Citations
52 Claims
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1-6. -6. (canceled)
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7. An electronic device, comprising:
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a cover layer configured to receive a touch input; a display layer positioned below the cover layer; a transparent force layer positioned below the cover layer and configured to detect strain based on the touch input, the transparent force layer comprising; a first plurality of transparent piezotronic transistor force sensitive structures positioned over a first surface of a transparent substrate; and a processing device configured to receive strain signals from the first plurality of transparent piezotronic transistor force sensitive structures and configured to estimate an amount of force associated with the touch input. - View Dependent Claims (8, 9, 10, 11, 12, 13)
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14-40. -40. (canceled)
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41. An electronic device, comprising:
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a force-sensitive structure comprising; a source electrode; a semiconducting layer positioned below the source electrode; and a drain electrode positioned below the semiconducting layer; and a processing circuitry coupled to the source electrode and the drain electrode of the force-sensitive structure and configured to estimate an amount of force applied to the force-sensitive structure based on a current flowing between the source electrode and the drain electrode of the force-sensitive structure. - View Dependent Claims (42, 43, 44, 45, 46, 47, 48, 49)
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50. An electronic device, comprising:
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a display; a transparent substrate above the display; a transparent array of force-sensitive structures defined on the transparent substrate, each force-sensitive structure of the transparent array comprising a source electrode and a drain electrode disposed on opposite sides of a piezoelectric semiconductor; and a sense circuitry coupled to the transparent array and configured to; measure change in current flowing between the source electrode and the drain electrode of at least one force-sensitive structure of the transparent array; and correlate the measured change in current to a strain induced in the transparent substrate as a result of a force applied to the transparent substrate. - View Dependent Claims (50, 51, 52)
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Specification