PACKAGED SEMICONDUCTOR DEVICES WITH MULTI-USE INPUT CONTACTS AND RELATED METHODS

• US 20180166378A1
• Filed: 02/07/2018
• Published: 06/14/2018
• Est. Priority Date: 04/27/2016
• Status: Active Grant

• Current Assignee: Semiconductor Components Industries LLC (ON Semiconductor Corporation)
• Original Assignee: Semiconductor Components Industries LLC (ON Semiconductor Corporation)
• Inventors: IYOSHI, Kentaro
• Granted Patent: US 10,446,482 B2
• Time in Patent Office: Days
• CPC Class Codes: H01L 23/50 for integrated circuit devices, e.g. power bus, number of leadsH01L23/482 - H01L23/498 take precedence
• CPC Class Codes: H02P 6/08 Arrangements for controlling the speed or torque of a single motor H02P6/10, H02P6/28 take precedence
• CPC Class Codes: H03M 1/12 Analogue/digital converters H03M1/001 – H03M1/10 take precedence
• CPC Class Codes: H03M 11/24 using analogue means , e.g. by coding the states of multiple switches into a single multi-level analogue signal or by indicating the type of a device using the voltage level at a specific tap of a resistive divider

Abstract

A semiconductor device includes a first contact receiving a first voltage, a second contact receiving a second voltage, one or more comparing elements comparing the first and second voltages, and one or more setting elements setting one or more parameters of the device in response to a comparison of the first and second voltages. When the first voltage is greater than the second voltage the setting element selects the first voltage as a high voltage, the second voltage as a low voltage, and sets a mode signal to a first value. When the second voltage is greater than the first voltage the setting element selects the first voltage as the low voltage, the second voltage as the high voltage, and sets the mode signal to a second value. The first and second values alter a condition of an electronic component coupled with the device between a first and second state.

Claims

1. A packaged semiconductor device, comprising:

a first input contact configured to receive a first input voltage;

a second input contact configured to receive a second input voltage;

one or more comparing elements configured to compare the first input voltage with the second input voltage, and;

one or more setting elements configured to set three operating parameters of the device in response to a comparison of the first input voltage and the second input voltage by the one or more comparing elements;

wherein the three operating parameters are supplied to an electronic component coupled with the device; and

wherein the three operating parameters are derived from no more input contacts than the first input contact and the second input contact.

2. The device of claim 1, wherein the one or more comparing elements comprises a comparator.

3. The device of claim 1, wherein the one or more setting elements comprises one or more switches and one or more inverters.

4. The device of claim 1, wherein the one or more setting elements comprises one or more multiplexers.

5. The device of claim 1, wherein the device further comprises one or more analog-to-digital converters (ADCs).

6. The device of claim 1, wherein the first input contact and the second input contact are each coupled with a first multiplexer, the first multiplexer is coupled with an analog-to-digital converter (ADC), the ADC is coupled with a register, and the register is coupled with a comparator and with a second multiplexer and a third multiplexer, the second multiplexer and third multiplexer being controlled by an output of the comparator.

7. A packaged semiconductor device, comprising:

a plurality of input contacts configured to receive a plurality of input voltages;

one or more comparing elements configured to compare the plurality of input voltages; and

one or more setting elements configured to, in response to a comparison of the plurality of input voltages by the one or more comparing elements, set a plurality of operating parameters which are supplied to an electronic component;

wherein a number of operating parameters in the plurality of parameters is greater than a number of input contacts in the plurality of input contacts.

8. The device of claim 7, wherein the one or more setting elements are configured to select a first input voltage of the plurality of input voltages as a high input voltage, select a second input voltage as a medium input voltage, and select a third input voltage as a low input voltage.

9. The device of claim 8, wherein the one or more setting elements are configured to vary values of one or more mode signals of the device in response to which of the plurality of input voltages is selected as the high input voltage, which of the plurality of input voltages is selected as the medium input voltage, and which of the plurality of voltages is selected as the low input voltage, wherein the values of the one or more mode signals are configured to alter an operating condition of an electronic component coupled with the device between one or more states.

10. The device of claim 9, wherein the one or more mode signals comprises three mode signals, and wherein the one or more setting elements are configured to vary the three mode signals between two values each in response to which of the input voltages is selected as the high input voltage, which of the input voltages is selected as the medium input voltage, and which of the input voltages is selected as the low input voltage.

11. The device of claim 9, wherein the one or more setting elements are configured to vary one of the one or more mode signals between six values in response to which of the input voltages is selected as the high input voltage, which of the input voltages is selected as the medium input voltage, and which of the input voltages is selected as the low input voltage.

12. The device of claim 7, wherein the device is configured to set six operating parameters of the device using no input contacts except a first input contact, a second input contact, and a third input contact of the plurality of input contacts.

13. The device of claim 7, wherein one or more analog-to-digital converters (ADCs) are coupled between the one or more comparing elements and the plurality of input voltages, and wherein the one or more comparing elements compare digital values of the plurality of input voltages.

14. The device of claim 7, wherein the one or more comparing elements comprises a plurality of comparators, wherein each of the plurality of input contacts is coupled with inputs of the plurality of comparators, wherein each of the plurality of input contacts is further coupled with inputs of a plurality of multiplexers, wherein a decoder is configured to control the plurality of multiplexers in response to receiving outputs of the plurality of comparators, and wherein the plurality of input voltages are coupled with one or more analog-to-digital converters.

15. The device of claim 7, wherein each of the plurality of input voltages is coupled with an input of a multiplexer, an output of the multiplexer is coupled with an analog-to-digital converter (ADC), an output of the ADC is coupled with a first register to store ADC output values therein, a controller is coupled with the multiplexer and is configured to control the multiplexer, the controller is configured to compare the stored ADC output values from the first register to select a high input voltage, a medium input voltage, a low input voltage, and one or more of the values of one or more mode signals, and wherein the controller is configured to store values associated with the high input voltage, the medium input voltage, the low input voltage, and the one or more mode signals in a second register.

16. A method of use of a packaged semiconductor device, comprising:

applying a plurality of input voltages to a plurality of input contacts;

comparing the plurality of input voltages using one or more comparing elements of the device; and

setting a plurality of operating parameters of the device using the plurality of input contacts;

wherein a number of the plurality of operating parameters is greater than a number of the plurality of input contacts.

17. The method of claim 16, further comprising using one or more setting elements, selecting a first input voltage of the plurality of input voltages as a high input voltage, a second input voltage of the plurality of input voltages as a medium input voltage, and a third input voltage of the plurality of input voltages as a low input voltage.

18. The method of claim 17, further comprising varying, using the one or more setting elements, multiple mode signals of the device, between at least two values each, in response to which of the plurality of input voltages is selected as the high input voltage, which of the plurality of input voltages is selected as the medium input voltage, and which of the plurality of input voltages is selected as the low input voltage.

19. The method of claim 17, further comprising varying, using the one or more setting elements, the mode signal between at least three values in response to which of the plurality of input voltages is selected as the high input voltage, which of the plurality of input voltages is selected as the medium input voltage, and which of the plurality of input voltages is selected as the low input voltage.

20. The method of claim 16, wherein the plurality of input voltages comprise three input voltages.