SYSTEM AND METHOD FOR DESATURATION DETECTION

• US 20180183228A1
• Filed: 12/22/2016
• Published: 06/28/2018
• Est. Priority Date: 12/22/2016
• Status: Active Grant

• Current Assignee: Infineon Technologies Austria Ag (Infineon Technologies AG)
• Original Assignee: Infineon Technologies Austria Ag (Infineon Technologies AG)
• Inventors: Huber, Erwin
• Granted Patent: US 10,263,412 B2
• Time in Patent Office: Days
• CPC Class Codes: G01R 19/165 Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
• CPC Class Codes: G01R 19/16571 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533, G01R19/1659 take precedence; measuring currents by using elements sensitive to the magnetic field generated G01R15/14; measuring earth resistance G01R27/18; testing for leakage or short circuits in electrical apparatus G01R31/52
• CPC Class Codes: G01R 19/16576 comparing DC or AC voltage with one threshold G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533 and G01R19/1659 take precedence
• CPC Class Codes: G01R 31/2608 for testing bipolar transistors
• CPC Class Codes: G01R 31/2621 for testing field effect transistors, i.e. FET's
• CPC Class Codes: H02H 3/006 Calibration or setting of parameters
• CPC Class Codes: H02H 3/087 for dc applications
• CPC Class Codes: H02H 3/20 responsive to excess voltage
• CPC Class Codes: H03K 17/0822 in field-effect transistor switches
• CPC Class Codes: H03K 17/0828 in composite switches

Abstract

In accordance with an embodiment, a method of operating a control circuit includes generating a threshold value based on a drive signal of an external power transistor, and determining an overpower state of the external power transistor based on a voltage at a drain or a collector of the external power transistor and the threshold value.

Claims

1. A method of operating a control circuit, the method comprising:

generating a threshold value based on a drive signal of an external power transistor; and

determining an overpower state of the external power transistor based on a voltage at a drain or a collector of the external power transistor and the threshold value.

2. The method of claim 1, wherein generating the threshold value comprises

determining the drive signal of the external power transistor using an analog-to-digital converter (ADC);

setting the threshold value appropriate for the external power transistor based on the drive signal using a digital-to-analog converter (DAC); and

comparing the voltage at the drain or the collector of the external power transistor to the threshold value using a comparator.

3. The method of claim 1, wherein generating the threshold value comprises

determining the drive signal of the external power transistor using an analog-to-digital converter (ADC);

comparing the voltage at the drain or the collector of the external power transistor to the threshold value using a comparator; and

adjusting the threshold value by adjusting a filter time constant.

4. The method of claim 1, further comprising disabling the external power transistor when the voltage at the drain or the collector of the external power transistor exceeds the threshold value.

5. The method of claim 1, further comprising measuring the voltage at the drain or the collector of the external power transistor.

6. The method of claim 1, wherein generating the threshold value comprises

determining a gate drive voltage of the external power transistor;

and

adjusting the threshold value for the external power transistor based on the gate drive voltage.

7. The method of claim 6, wherein determining the gate drive voltage comprises measuring a supply voltage of a driver for the external power transistor.

8. The method of claim 6, wherein determining the gate drive voltage comprises measuring the gate drive voltage directly.

9. A circuit comprising:

a threshold generation circuit configured to generate a threshold value based on a drive signal of an external power transistor; and

an overpower determination circuit configured to determine an overpower state of the external power transistor based on a voltage at a drain or a collector of the external power transistor and the threshold value.

10. The circuit of claim 9, wherein

the threshold generation circuit comprises:

an analog-to-digital converter (ADC) configured to sample a signal indicative of the drive signal of the external power transistor and output a digital representation of the signal indicative of the drive signal of the external power transistor,

a threshold adjustment circuit coupled to the ADC and configured to set the threshold value for the external power transistor based on the digital representation of the signal indicative of the drive signal of the external power transistor; and

the overpower determination circuit comprises a comparator configured to compare the voltage at the drain or the collector of the external power transistor to the threshold value and generate a disable signal for the external power transistor when the voltage at the drain or the collector of the external power transistor is greater than the threshold value.

11. The circuit of claim 9, wherein

the threshold generation circuit comprises an analog-to-digital converter (ADC) configured to sample a signal indicative of the drive signal of the external power transistor and output a digital representation of the signal indicative of the drive signal of the external power transistor;

and

the overpower determination circuit comprises

a comparator configured to compare the voltage at the drain or the collector of the external power transistor to a desaturation threshold value and generate a comparison signal when the voltage at the drain or the collector of the external power transistor is greater than the desaturation threshold value, and

a filter coupled to the ADC and the comparator, the filter configured to

adjust the threshold value for the external power transistor based on the digital representation of the signal indicative of the drive signal of the external power transistor, wherein adjusting the threshold value for the external power transistor comprises adjusting a time constant of the filter,

receive the comparison signal from the comparator,

filter the comparison signal using the time constant of the filter, and

generate a filtered comparison signal based on filtering the comparison signal.

12. The circuit of claim 9, wherein the overpower determination circuit is further configured to disable the external power transistor when the voltage at the drain or the collector of the external power transistor is greater than the threshold value.

13. The circuit of claim 9, further comprising a measurement circuit configured to be coupled to the external power transistor, the measurement circuit configured to measure the voltage at the drain or the collector of the external power transistor.

14. The circuit of claim 9, wherein the threshold generation circuit is further configured to determine the drive signal of the external power transistor, wherein

determining the drive signal of the external power transistor comprises determining a gate drive voltage;

and

generating the threshold value for the external power transistor comprises adjusting the threshold value for the external power transistor based on the gate drive voltage.

15. The circuit of claim 14, wherein

the overpower determination circuit comprises a driver configured to be coupled to the external power transistor;

and

determining the gate drive voltage comprises measuring a supply voltage of the driver.

16. The circuit of claim 14, wherein determining the gate drive voltage comprises measuring the gate drive voltage directly.

17. An electronic circuit comprising:

a measurement circuit comprising a first input configured to be coupled to an external power transistor and a measurement output;

a threshold circuit comprising

a second input configured to receive an indication of a gate drive voltage of the external power transistor, and

a threshold output, the threshold output being set based on the indication of the gate drive voltage received at the second input;

a comparator comprising

a third input coupled to the measurement output,

a fourth input coupled to the threshold output, and

a comparison output; and

a drive circuit configured to be coupled to the external power transistor and coupled to the comparison output, the drive circuit configured to disable the external power transistor based on signals at the comparison output.

18. The electronic circuit of claim 17, further comprising the external power transistor.

19. The electronic circuit of claim 17, wherein the second input is coupled to a gate of the external power transistor.

20. The electronic circuit of claim 17, wherein the second input is coupled to a power supply terminal of the drive circuit.

21. The electronic circuit of claim 17, wherein the external power transistor comprises a metal-oxide-semiconductor field effect transistor (MOSFET), and the first input is configured to be coupled to a drain of the MOSFET.

22. The electronic circuit of claim 21, wherein the external power transistor comprises a silicon carbide (SiC) MOSFET.

23. The electronic circuit of claim 17, wherein the external power transistor comprises an insulated-gate bipolar transistor (IGBT), and the first input is configured to be coupled to a collector of the IGBT.

24. The electronic circuit of claim 17, wherein the threshold circuit comprises:

an analog-to-digital converter (ADC) coupled to the second input and configured to receive the indication of the gate drive voltage of the external power transistor; and

a digital-to-analog converter (DAC) configured to provide the threshold output based on the indication of the gate drive voltage received at the second input.

25. The electronic circuit of claim 17, wherein the measurement circuit comprises:

a measurement resistor;

a measurement diode coupled in series with the measurement resistor, the measurement resistor and the measurement diode forming a series path from the measurement output to the first input; and

a measurement current source coupled to the measurement output and configured to force a measurement current through the measurement resistor and the measurement diode.

26. The electronic circuit of claim 17, further comprising a logic circuit coupled from the comparison output to the drive circuit, wherein the logic circuit is configured to disable the external power transistor when the measurement output exceeds the threshold output.

27. The electronic circuit of claim 17, wherein the comparator comprises:

a threshold comparator comprising a first comparison input coupled to the third input, a second comparison input coupled to a desaturation threshold, and an initial comparison output; and

a filter comprising a filter input coupled to the initial comparison output, a filter control input coupled to the fourth input, and a filter output coupled to the comparison output, wherein the filter has a filter time constant, the filter time constant being adjusted based on the gate drive voltage of the external power transistor.