HIGH-TEMPERATURE MAGNETOSTRICTIVE GUIDED WAVE PIPE INSPECTION SYSTEM

• US 20180217105A1
• Filed: 01/25/2018
• Published: 08/02/2018
• Est. Priority Date: 01/27/2017
• Status: Active Grant

• Current Assignee: FBS, Inc. (INFRONEER Holdings, Inc.)
• Original Assignee: FBS, Inc. (INFRONEER Holdings, Inc.)
• Inventors: BORIGO, Cody J., McLAUGHLIN, John C., OWENS, Steven E., ROSE, Joseph L.
• Granted Patent: US 10,641,741 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 2291/0234 Metals, e.g. steel
• CPC Class Codes: G01N 2291/0425 Parallel to the surface, e.g. creep waves
• CPC Class Codes: G01N 2291/045 External reflections, e.g. on reflectors
• CPC Class Codes: G01N 2291/2634 cylindrical from outside
• CPC Class Codes: G01N 29/041 on the surface of the material, e.g. using Lamb, Rayleigh or shear waves
• CPC Class Codes: G01N 29/069 Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
• CPC Class Codes: G01N 29/2412 using the magnetostrictive properties of the material to be examined, e.g. electromagnetic acoustic transducers [EMAT]; investigating the presence of flaws using eddy currents G01N27/90, magnetostrictive transducers B06B1/08, measuring magnetostrictive properties G01R33/18
• CPC Class Codes: G01N 29/262 by electronic orientation or focusing, e.g. with phased arrays phased arrays per se G10K11/34
• CPC Class Codes: G01N 29/348 with frequency characteristics, e.g. single frequency signals, chirp signals measuring frequency of mechanical vibrations or acoustic waves in general G01H1/06, G01H3/04; measuring frequency or analysing frequency spectra G01R23/00

Abstract

A system for non-destructive inspection of a structure includes at least one magnetostrictive strip, a plurality of coil circuits, a jacket having at least one component layer, and a tensioner. The at least one magnetostrictive strip is configured to be induced with a bias magnetic field and be wrapped at least partially around an outer surface of the structure. The plurality of coil circuits are configured to be disposed adjacent to the at least one magnetostrictive strip, and the jacket is configured to be disposed adjacent to at least one of the plurality of coil circuits. The tensioner is configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure. At least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.

Claims

1. A system for non-destructive inspection of a structure, comprising:

at least one magnetostrictive strip configured to be induced with a bias magnetic field and wrapped at least partially around an outer surface of said structure;

a plurality of coil circuits configured to be disposed adjacent to said at least one magnetostrictive strip;

a jacket having at least one component layer configured to be disposed adjacent to at least one of the plurality of coil circuits; and

a tensioner configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure,

wherein said at least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.

2. The system of claim 1, wherein each of said plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure using at least one of active phased-array focusing or synthetic phased-array, focusing of the guided waves.

3. The system of claim 1, wherein the tensioner includes at least one mechanical fastener attached to said jacket for providing the mechanical pressure coupling.

4. The system of claim 3, wherein said at least one mechanical fastener includes a threaded fastener.

5. The system of claim 3, wherein said at least one mechanical fastener includes an over-center or under-center mechanism.

6. The system of claim 1, further comprising at least one strap configured to be disposed adjacent to said jacket and tensioned by the tensioner.

7. The system of claim 6, further comprising at least one mechanical fastener to secure ends of said at least one component layer around said structure.

8. The system of claim 6, wherein said tensioner includes:

a drum configured to capture at least one end of said straps and be rotated about an axis,

a means for rotating said drum to tension said straps, and

a ratchet configured to retain strap tension during tensioning,

wherein said tensioner is configured to straddle said at least one magnetostrictive strip.

9. The system of claim 6, wherein said at least one strap includes one of an aramid fiber material or a metal.

10. The system of claim 1, wherein said plurality of coil circuits are fabricated from materials able to withstand temperatures of at least 500°

F.

11. The system of claim 1, wherein said plurality of coil circuits are components of a plurality of flexible circuit boards each having two layers of conductive signal traces.

12. The system of claim 1, wherein said plurality of coil circuits are components of a at least one flexible circuit board having at least two layers of conductive signal traces.

13. The system of claim 1, wherein said jacket comprises at least one first jacket member and at least one second jacket member, the at least one first jacket member being less rigid than the at least one second jacket member.

14. The system of claim 13, wherein the at least one first jacket member includes silicone rubber.

15. The system of claim 13, wherein the at least one second jacket member includes stainless steel.

16. The system of claim 1, wherein said plurality of coil circuits are configured such that a respective end of each of at least two of said plurality of coil circuits wrap around at least one component layer of the jacket.

17. The system of claim 1, further comprising a thermally-insulating material configured to be disposed between said plurality of coil circuits and said at least one magnetostrictive strip.

18. A method of using the system for non-destructive inspection of the structure of claim 1, the method comprising:

placing the at least one magnetostrictive strip on the outer surface of the structure;

positioning the plurality of coil circuits adjacent to the at least one magnetostrictive strip; and

applying mechanical pressure to the at least one magnetostrictive strip to at least temporarily secure the plurality of coil circuits and the magnetostrictive strip to the structure.

19. The method of claim 18, wherein said plurality of coil circuits are, at least temporarily, attached over some portion of their length to said jacket.

20. The method of claim 18, wherein said at least one magnetostrictive strip is, at least temporarily, attached to at least one of the plurality of coil circuits or the jacket to ensure proper alignment with said circuits.