HOLOGRAPHIC DETECTION AND CHARACTERIZATION OF LARGE IMPURITY PARTICLES IN PRECISION SLURRIES

• US 20180252628A1
• Filed: 09/15/2016
• Published: 09/06/2018
• Est. Priority Date: 09/18/2015
• Status: Active Grant

• Current Assignee: New York University
• Original Assignee: New York University
• Inventors: RUFFNER, David B., GRIER, David G., PHILIPS, Laura
• Granted Patent: US 10,641,696 B2
• Time in Patent Office: Days
• CPC Class Codes: G01N 15/0227 using imaging; using holography
• CPC Class Codes: G01N 15/1433 using image recognition
• CPC Class Codes: G01N 15/1434 Optical arrangements
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/0053 in liquids, e.g. trouble
• CPC Class Codes: G01N 2015/0233 using holography
• CPC Class Codes: G01N 2015/1454 using phase shift or interference, e.g. for improving contrast
• CPC Class Codes: G01N 2015/1493 Particle size
• CPC Class Codes: G01N 21/453 Holographic interferometry for dimensional measurements G01B9/021 - G01B9/029
• CPC Class Codes: G03H 1/0005 Adaptation of holography to specific applications holographic optical element G02B5/32; holographic scanner G02B26/106; recognition using holographic mask G06V10/88; holographic memories G11B7/0065, G11C13/042
• CPC Class Codes: G03H 1/0443 Digital holography, i.e. recording holograms with digital recording means holobject computation G03H1/0866
• CPC Class Codes: G03H 2001/0033 in hologrammetry for measuring or analysing
• CPC Class Codes: G03H 2001/005 in microscopy, e.g. digital holographic microscope [DHM] microscopes G02B21/00; digital holography G03H1/0866
• CPC Class Codes: G03H 2001/0447 In-line recording arrangement

Abstract

Impurities within a sample are detected by use of holographic video microscopy. The sample flows through the microscope and holographic images are generated. The holographic image is analyzed to identify regions associated with large impurities in the sample. The contribution of the particles of the sample to the holographic images is determined and the impurities are characterized.

Claims

1. A method of characterizing impurities in a sample, comprising:

flowing the sample through an observation volume of a holographic microscope;

generating a first holographic image based upon holographic video microscopy of the sample within the observation volume at a first time;

analyzing the first holographic image for one or more regions of interest corresponding to a particle of interest;

normalizing the region of interest for a contribution of a diffuse wave created by interaction of light with the sample;

fitting the normalized region of interest to a light scattering theory; and

characterizing one or more properties of particle of interest.

2. The method of claim 1, wherein the sample is a slurry.

3. The method of claim 1, wherein the slurry comprises particles of 200 nm or less size.

4. The method of claim 3, wherein the particle of interest has a size of about 200 nanometers to about 20 micrometers.

5. The method of claim 1, wherein the peak flow is about 100 micrometers per second.

6. The method of claim 1, further comprising selecting a sample cell of depth D.

7. The method of claim 1, wherein characterizing the particle of interest comprises determining radius and refractive index.

8. A method of characterizing particles of interest in a slurry, comprising:

flowing the slurry through an observation volume of a holographic microscope;

generating a first holographic image based upon holographic video microscopy of the sample within the observation volume at a first time;

analyzing the first holographic image;

applying Lorenz Mie analysis to the holographic image;

characterizing the particle of interest.

9. The method of claim 8, further comprising quantifying a contribution of a diffuse wave created by interaction of light with the sample.