METHOD FOR SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS AND DEVICE FOR SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS

• US 20180313756A1
• Filed: 10/31/2016
• Published: 11/01/2018
• Est. Priority Date: 11/13/2015
• Status: Abandoned Application

• Current Assignee: Konica Minolta Inc.
• Original Assignee: Konica Minolta Inc.
• Inventors: YAMAUCHI, Nobuhiro, KYOGOKU, Yuichi
• Application Number:
  US15/771,879
• Publication Number:
  US 20180313756A1
• Time in Patent Office: Days
• CPC Class Codes: G01N 2021/8455 and using position detectors
• CPC Class Codes: G01N 21/13 Moving of cuvettes or solid samples to or from the investigating station handling materials for automatic analysis G01N35/00
• CPC Class Codes: G01N 21/41 Refractivity; Phase-affecting properties, e.g. optical path length G01N21/21 takes precedence
• CPC Class Codes: G01N 21/553 and using surface plasmons fluorescence excitation G01N21/648; enhanced Raman G01N21/658
• CPC Class Codes: G01N 21/648 using evanescent coupling or surface plasmon coupling for the excitation of fluorescence

Abstract

The present invention includes a prism having a light incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a trapping body secured to the metal film. Excitation light is irradiated from an excitation light irradiation part onto an analysis chip installed in a chip holder, and excitation light reflected by the analysis chip is detected. The information outputted by the excitation light irradiation part is acquired.

Claims

1. A surface plasmon resonance fluorescence analysis method of detecting presence or an amount of a detection object substance by detecting fluorescence that is emitted by a fluorescence material labelling the detection object substance when the fluorescence material is excited by localized light based on a surface plasmon resonance, the surface plasmon resonance fluorescence analysis method comprising:

acquiring output information of an excitation light irradiator by applying excitation light from the excitation light irradiator to an analysis chip installed in a chip holder, and by detecting excitation light reflected by the analysis chip, the analysis chip including a prism including an incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film.

2. The surface plasmon resonance fluorescence analysis method according to claim 1 further comprising acquiring position information of the analysis chip by applying excitation light from the excitation light irradiator to the analysis chip installed in the chip holder fixed on a conveyance stage, and by detecting excitation light reflected by the analysis chip.

3. The surface plasmon resonance fluorescence analysis method according to claim 2, wherein the acquiring the output information of the excitation light irradiator, and the acquiring the position information of the analysis chip are simultaneously performed.

4. The surface plasmon resonance fluorescence analysis method according to claim 3, wherein, in the acquiring the output information of the excitation light irradiator and the acquiring the position information of the analysis chip,

excitation light is applied to two adjacent surfaces of the analysis chip,

the position information of the analysis chip is acquired based on an intensity of excitation light reflected by the two surfaces, and

the output information of the excitation light irradiator is acquired based on a maximum value of an intensity of excitation light reflected by the analysis chip.

5. The surface plasmon resonance fluorescence analysis method according to claim 4, wherein, in the acquiring the output information of the excitation light irradiator and the acquiring the position information of the analysis chip, excitation light is applied to the incidence surface and a surface adjacent to the incidence surface of the analysis chip.

6. The surface plasmon resonance fluorescence analysis method according to claim 1, wherein in the acquiring the output information of the excitation light irradiator, reflection light from the incidence surface is detected.

7. The surface plasmon resonance fluorescence analysis method according to claim 1 further comprising determining whether the excitation light irradiator is in a normal condition by comparing the output information of the excitation light irradiator with preliminarily acquired output information that serves as a reference of the excitation light irradiator.

8. The surface plasmon resonance fluorescence analysis method according to claim 1 further comprising applying excitation light to the analysis chip from the excitation light irradiator to detect fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body.

9. The surface plasmon resonance fluorescence analysis method according to claim 2 further comprising:

moving the analysis chip to a measurement position by moving the chip holder by the conveyance stage based on the position information; and

applying excitation light to the analysis chip disposed at the measurement position from the excitation light irradiator to detect fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body.

10. A surface plasmon resonance fluorescence analysis apparatus that detects presence or an amount of a detection object substance by detecting fluorescence that is emitted by a fluorescence material labelling the detection object substance when the fluorescence material is excited by localized light based on a surface plasmon resonance, the surface plasmon resonance fluorescence analysis apparatus comprising:

a chip holder for detachably holding an analysis chip including a prism including an incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film;

an excitation light irradiator that applies excitation light to the analysis chip held by the chip holder;

an excitation light detector that detects excitation light reflected by the analysis chip;

a fluorescence detector that detects fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body; and

a processor that acquires output information of the excitation light irradiator based on a detection result of the excitation light detector.

11. The surface plasmon resonance fluorescence analysis apparatus according to claim 10 further comprising a conveyance stage that moves the chip holder,

wherein the processor further acquires position information of the analysis chip held by the chip holder based on the detection result of the excitation light detector;

and

wherein the processor moves the analysis chip to a measurement position by causing the conveyance stage to move the chip holder based on the position information.

12. The surface plasmon resonance fluorescence analysis apparatus according to claim 10,

wherein the excitation light detector is a photodiode including a plurality of light reception surfaces;

and

wherein the output information of the excitation light irradiator is information relating to a power of the excitation light irradiator and an irradiation direction of excitation light of the excitation light irradiator.

13. The surface plasmon resonance fluorescence analysis apparatus according to claim 10,

wherein the excitation light detector is a position detection device;

and

wherein the output information of the excitation light irradiator is information relating to a power of the excitation light irradiator and an irradiation direction of the excitation light of the excitation light irradiator.

14. The surface plasmon resonance fluorescence analysis apparatus according to claim 10,

wherein the processor stores output information that serves as a reference of the excitation light irradiator;

and

wherein the processor compares the output information of the excitation light irradiator and the output information that serves as the reference of the excitation light irradiator to determine whether the excitation light irradiator is in a normal condition.