LEVEL SHIFTER AND METHOD OF CALIBRATION

• US 20180358968A1
• Filed: 08/22/2018
• Published: 12/13/2018
• Est. Priority Date: 03/30/2016
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Schemm, Nathan Richard
• Granted Patent: US 10,644,702 B2
• Time in Patent Office: Days
• CPC Class Codes: H03K 19/018507 Interface arrangements

Abstract

A level shifter includes a signal generator that generates differential signals on a first output and a second output. A first capacitor is coupled between the first output and a first node and a second capacitor is coupled between the second output and a second node. A third capacitor is coupled between the first node and a first voltage potential, wherein the capacitance of the third capacitor is variable. A fourth capacitor is coupled between the second node and the first voltage potential, wherein the capacitance of the fourth capacitor is variable.

Claims

1. A circuit comprising:

a first input terminal adapted to receive a first capacitor having a first capacitance;

a second input terminal adapted to receive a second capacitor having a second capacitance;

a terminal voltage source;

a third capacitor coupled between the first input terminal and the terminal voltage source, and having a third capacitance defining a first ratio over the first capacitance; and

a fourth capacitor coupled between the second input terminal and the terminal voltage source, and having a fourth capacitance defining a second ratio over the second capacitance, the second ratio approximating the first ratio.

2. The circuit of claim 1, further comprising:

a common mode voltage source;

a first switch coupled between the first input terminal and the common mode voltage source; and

a second switch coupled between the second input terminal and the common mode voltage source.

3. The circuit of claim 1, further comprising:

a differential amplifier having a first input coupled to the first input terminal, and a second input coupled to the second input terminal, the differential amplifier configured to generate a test signal based on a voltage difference between the first and second input terminals when the first and second input terminals are decoupled from a common mode voltage source.

4. The circuit of claim 3, wherein:

the third capacitor includes a first adjustable capacitor;

the fourth capacitor includes a second adjustable capacitor; and

at least one of the third capacitance or the fourth capacitance is adjusted based on the test signal such that the second ratio approximates the first ratio.

5. The circuit of claim 4, further comprising:

a processor coupled to receive the test signal from the differential amplifier, and configured to provide instructions to adjust at least one of the third capacitance or the fourth capacitance.

6. The circuit of claim 5, wherein the processor is configured to decouple the common mode voltage source from the first and second input terminals while the test signal is being generated.

7. The circuit of claim 5, wherein the processor is configured to determine a common mode transient immunity between the first input terminal and the second first input terminal based on the test signal.

8. The circuit of claim 1, wherein the first capacitance is different from the second capacitance.

9. A level shifter comprising:

first and second input terminals;

a terminal voltage source;

a supply voltage source;

a first adjustable capacitor coupled between the first input terminal and the terminal voltage source;

a second adjustable capacitor coupled between the second input terminal and the terminal voltage source; and

a differential amplifier having a supply terminal coupled to the supply voltage source, a first differential input coupled to the first input terminal, a second differential input coupled to the second input terminal, and a differential output.

10. The level shifter of claim 9, further comprising:

a common mode voltage source;

a first switch coupled between the first input terminal and the common mode voltage source; and

a second switch coupled between the second input terminal and the common mode voltage source.

11. The level shifter of claim 9, further comprising:

a second differential amplifier having a first input coupled to the first input terminal, and a second input coupled to the second input terminal, the second differential amplifier configured to generate a test signal based on a voltage difference between the first and second input terminals when the first and second input terminals are decoupled from a common mode voltage source,

wherein the differential amplifier is a first differential amplifier.

12. The level shifter of claim 11, further comprising:

a processor coupled to receive the test signal from the second differential amplifier, and configured to determine a common mode transient immunity between the first input terminal and the second first input terminal based on the test signal.

13. The level shifter of claim 12, wherein the processor is configured to decouple the common mode voltage source from the first and second input terminals while the test signal is being generated.

14. The level shifter of claim 12, wherein the processor is configured to adjust at least one of the first adjustable capacitor or the second adjustable capacitor based on the common mode transient immunity.

15. The level shifter of claim 12, wherein:

the first input terminal is adapted to receive a third capacitor having a third capacitance;

the second input terminal adapted to receive a fourth capacitor having a fourth capacitance;

the first adjustable capacitor having a first capacitance;

the second adjustable capacitor having a second capacitance; and

the processor is configured to adjust at least one of the first capacitance or the second capacitance such that a first ratio of the first capacitance over the third capacitance approximates a second ratio of the second capacitance over the fourth capacitance.

16. A level shifter comprising:

first and second input terminals;

a terminal voltage source;

a first adjustable capacitor coupled between the first input terminal and the terminal voltage source;

a second adjustable capacitor coupled between the second input terminal and the terminal voltage source;

a common mode voltage source;

a first switch coupled between the first input terminal and the common mode voltage source; and

a second switch coupled between the second input terminal and the common mode voltage source.

17. The level shifter of claim 16, further comprising:

a differential amplifier having a first input coupled to the first input terminal, and a second input coupled to the second input terminal, the differential amplifier configured to generate a test signal based on a voltage difference between the first and second input terminals when the first and second input terminals are decoupled from the common mode voltage source.

18. The level shifter of claim 17, further comprising:

a processor coupled to receive the test signal from the differential amplifier, and configured to determine a common mode transient immunity between the first input terminal and the second first input terminal based on the test signal.

19. The level shifter of claim 18, wherein the processor is configured to adjust at least one of the first adjustable capacitor or the second adjustable capacitor based on the common mode transient immunity.

20. The level shifter of claim 18, wherein:

the first input terminal is adapted to receive a third capacitor having a third capacitance;

the second input terminal adapted to receive a fourth capacitor having a fourth capacitance;

the first adjustable capacitor having a first capacitance;

the second adjustable capacitor having a second capacitance; and

the processor is configured to adjust at least one of the first capacitance or the second capacitance such that a first ratio of the first capacitance over the third capacitance approximates a second ratio of the second capacitance over the fourth capacitance.