MICRO-ELECTRO-MECHANICAL-SYSTEMS PROCESSING METHOD, AND MICRO-ELECTRO-MECHANICAL-SYSTEMS PROCESSING APPARATUS
First Claim
1. A micro-electro-mechanical-systems processing method in a processing apparatus,the processing apparatus including:
- an irradiation unit that irradiates a sample with a charged particle beam;
a shape measuring unit that measures a shape of the sample; and
a control unit, whereinthe micro-electro-mechanical-systems is processed by a first step and a second step,in the first step,the irradiation unit irradiates a plurality of single field-of-view points with the charged particle beam in a first region of the sample;
the shape measuring unit measures the shape of a spot hole formed in the first region of the sample; and
the control unit sets, based on measurement results of the shape of the spot hole, a scan condition of the charged particle beam or a forming mask of the charged particle beam at each of the single field-of-view points, andin the second step,the irradiation unit irradiates, based on the scan condition or the forming mask set in the first step, a second region of the sample with the charged particle beam.
1 Assignment
0 Petitions
Accused Products
Abstract
The invention is to reduce non-uniformity of a processing shape over a wide range of a single field-of-view.
The invention is directed to a method of processing micro electro mechanical systems with a first step and a second step in a processing apparatus including an irradiation unit that irradiates a sample with a charged particle beam, a shape measuring unit that measures a shape of the sample, and a control unit. In the first step, the irradiation unit irradiates a plurality of single field-of-view points with the charged particle beam in a first region of the sample, the shape measuring unit measures the shape of a spot hole formed in the first region of the sample, and the control unit sets, based on measurement results of the shape of the spot hole, a scan condition of the charged particle beam or a forming mask of the charged particle beam at each of the single field-of-view points. In the second step, the irradiation unit irradiates, based on the scan condition or the forming mask set in the first step, a second region of the sample with the charged particle beam.
-
Citations
15 Claims
-
1. A micro-electro-mechanical-systems processing method in a processing apparatus,
the processing apparatus including: -
an irradiation unit that irradiates a sample with a charged particle beam; a shape measuring unit that measures a shape of the sample; and a control unit, wherein the micro-electro-mechanical-systems is processed by a first step and a second step, in the first step, the irradiation unit irradiates a plurality of single field-of-view points with the charged particle beam in a first region of the sample; the shape measuring unit measures the shape of a spot hole formed in the first region of the sample; and the control unit sets, based on measurement results of the shape of the spot hole, a scan condition of the charged particle beam or a forming mask of the charged particle beam at each of the single field-of-view points, and in the second step, the irradiation unit irradiates, based on the scan condition or the forming mask set in the first step, a second region of the sample with the charged particle beam. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. A micro-electro-mechanical-systems processing apparatus comprising:
-
an irradiation unit that irradiates a sample with a charged particle beam; a shape measuring unit that measures a shape of the sample; and a control unit, wherein the irradiation unit includes a plurality of forming masks for forming the charged particle beam, and irradiates a plurality of single field-of-view points with the charged particle beam using the same forming mask in a first region of the sample, the shape measuring unit measures the shape of a spot hole formed in the first region of the sample, the control unit selects, based on the measurement results of the shape of the spot hole, the forming mask for forming the spot hole having a shape equivalent to a center of a beam axis of the charged particle beam with respect to each of the single field-of-view points, and the irradiation unit irradiates a second region of the sample with the charged particle beam while switching the forming mask with respect to each of the single field-of-view points. - View Dependent Claims (14, 15)
-
Specification