METHODS AND SYSTEMS FOR TESTING STORAGE DEVICES VIA A REPRESENTATIVE I/O GENERATOR
First Claim
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1. A storage system configured for generating representative Input/Output (I/O), the storage system comprising:
- a processor; and
a memory coupled to the processor, wherein the memory stores instructions that, when executed by the processor, cause the processor to;
retrieve, from a pattern database, a first representative I/O pattern;
assemble a representative workload by modifying the first representative I/O pattern according to at least one workload parameter;
generate representative I/O based on the representative workload; and
measure a storage system performance.
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Abstract
A system and method of generating representative I/O. The system is configured to utilize representative I/O patterns stored in a pattern database. A user may select one or more patterns to perform I/O using. The patterns are modified according to user supplied parameters and multiple parameters are integrated into a single workload. I/O is then generated according to the workload and system performance may be measured.
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Citations
20 Claims
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1. A storage system configured for generating representative Input/Output (I/O), the storage system comprising:
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a processor; and a memory coupled to the processor, wherein the memory stores instructions that, when executed by the processor, cause the processor to; retrieve, from a pattern database, a first representative I/O pattern; assemble a representative workload by modifying the first representative I/O pattern according to at least one workload parameter; generate representative I/O based on the representative workload; and measure a storage system performance. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of performing storage system benchmarking comprising:
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retrieving, by a processor from a pattern database stored in memory, a first representative I/O pattern; assembling, by the processor, a representative workload by modifying the first representative I/O pattern according to at least one workload parameter; generating, by the processor, representative I/O to at least one SSD based on the representative workload; and measuring, by the processor, a storage system performance. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. A storage system configured for generating representative Input/Output (I/O), the storage system comprising:
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a processor; and a memory coupled to the processor, wherein the memory stores instructions that, when executed by the processor, cause the processor to; receive, at a graphical user interface, a user selection for a first representative I/O pattern, a second representative I/O pattern, and at least one workload parameter. retrieve, from a pattern database, the first representative I/O pattern and the second representative I/O pattern; modify the first representative I/O pattern and the second I/O pattern according to the at least one workload parameter; integrate the first modified I/O pattern with the second modified I/O pattern to produce a single representative workload; generate representative I/O based on the single representative workload; and measure a storage system performance. - View Dependent Claims (17, 18, 19, 20)
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Specification