METHODS AND SYSTEMS FOR TESTING STORAGE DEVICES VIA A REPRESENTATIVE I/O GENERATOR

• US 20190087300A1
• Filed: 12/22/2017
• Published: 03/21/2019
• Est. Priority Date: 09/15/2017
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Bhimani, Janki Sharadkumar, Pandurangan, Rajinikanth, Balakrishnan, Vijay, Choi, Changho
• Granted Patent: US 10,956,294 B2
• Time in Patent Office: Days
• CPC Class Codes: G06F 11/3034 where the computing system component is a storage system, e.g. DASD based or network based digital input from or digital output to record carriers G06F3/06; digital recording or reproducing G11B20/18; for distributed storage of data in networks, e.g. transport arrangements for network file system [NFS], storage area networks [SAN] or network attached storage [NAS], H04L67/1097
• CPC Class Codes: G06F 11/3414 Workload generation, e.g. scripts, playback
• CPC Class Codes: G06F 11/3428 Benchmarking
• CPC Class Codes: G06F 11/3485 for I/O devices
• CPC Class Codes: G06F 3/0605 by facilitating the interaction with a user or administrator
• CPC Class Codes: G06F 3/061 Improving I/O performance
• CPC Class Codes: G06F 3/0653 Monitoring storage devices or systems
• CPC Class Codes: G06F 3/0679 Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
• CPC Class Codes: G06F 8/34 Graphical or visual programming
• CPC Class Codes: G06F 8/36 Software reuse
• CPC Class Codes: G06F 9/44505 Configuring for program initiating, e.g. using registry, configuration files

Abstract

A system and method of generating representative I/O. The system is configured to utilize representative I/O patterns stored in a pattern database. A user may select one or more patterns to perform I/O using. The patterns are modified according to user supplied parameters and multiple parameters are integrated into a single workload. I/O is then generated according to the workload and system performance may be measured.

Claims

1. A storage system configured for generating representative Input/Output (I/O), the storage system comprising:

a processor; and

a memory coupled to the processor, wherein the memory stores instructions that, when executed by the processor, cause the processor to;

retrieve, from a pattern database, a first representative I/O pattern;

assemble a representative workload by modifying the first representative I/O pattern according to at least one workload parameter;

generate representative I/O based on the representative workload; and

measure a storage system performance.

2. The system of claim 1, wherein the instructions further cause the processor to:

retrieve, from the pattern database, a second representative I/O pattern; and

wherein assemble a representative workload further comprises;

modifying the second representative I/O pattern according to the at least one workload parameter; and

integrating the first modified I/O pattern with the second modified I/O pattern.

3. The system of claim 2, wherein the instructions further cause the processor to:

identify a conflict between the first modified representative I/O pattern and the second modified representative I/O pattern;

resolve the conflict by further modifying at least one of the first modified representative workload or the second modified representative workload; and

generate representative I/O based on the further modified first modified representative workload and second modified representative workload.

4. The system of claim 1, wherein the instructions further cause the processor to:

generate a graphical user interface (GUI) for receiving a selection of the first representative I/O pattern and the at least one workload parameter.

5. The system of claim 4, wherein the at least one workload parameter comprises at least one of a runtime, a storage size, and a background noise level.

6. The system of claim 1, wherein storage system performance comprises a SSD performance.

7. The system of claim 1, wherein the first representative I/O pattern comprises a repetitive I/O pattern measured on the storage system while executing an application.

8. The system of claim 1, wherein the first representative I/O pattern comprises at least one workload.

9. A method of performing storage system benchmarking comprising:

retrieving, by a processor from a pattern database stored in memory, a first representative I/O pattern;

assembling, by the processor, a representative workload by modifying the first representative I/O pattern according to at least one workload parameter;

generating, by the processor, representative I/O to at least one SSD based on the representative workload; and

measuring, by the processor, a storage system performance.

10. The method of claim 9, further comprising:

retrieving, by the processor from the pattern database stored in memory, a second representative I/O pattern; and

wherein assembling, by the processor, a representative workload further comprises;

modifying the second representative I/O pattern according to the at least one workload parameter; and

integrating the first modified representative I/O pattern with the second modified representative I/O pattern.

11. The method of claim 10, further comprising:

identifying, by the processor, a conflict between the first modified representative I/O pattern and the second modified representative I/O pattern;

resolving the conflict by further modifying at least one of the first modified representative workload or the second modified representative workload; and

generating the representative I/O based on the further modified first modified representative workload and second modified representative workload.

12. The method of claim 9, further comprising:

receiving from a graphical user interface (GUI) the first representative I/O pattern and the at least one workload parameter.

13. The method of claim 9, wherein the at least one workload parameter comprises at least one of a runtime, a storage size, and a background noise level.

14. The method of claim 9, wherein the first representative I/O pattern comprises a repetitive I/O pattern measured on the storage system while executing an application.

15. The method of claim 9, wherein the storage system performance comprises at least one of a throughput, a bandwidth, an IOPS, or a latency.

16. A storage system configured for generating representative Input/Output (I/O), the storage system comprising:

a processor; and

a memory coupled to the processor, wherein the memory stores instructions that, when executed by the processor, cause the processor to;

receive, at a graphical user interface, a user selection for a first representative I/O pattern, a second representative I/O pattern, and at least one workload parameter.

retrieve, from a pattern database, the first representative I/O pattern and the second representative I/O pattern;

modify the first representative I/O pattern and the second I/O pattern according to the at least one workload parameter;

integrate the first modified I/O pattern with the second modified I/O pattern to produce a single representative workload;

generate representative I/O based on the single representative workload; and

measure a storage system performance.

17. The storage system of claim 16, wherein the processor is a multithreaded processor and the single representative workload is multithreaded.

18. The system of claim 16, wherein the instructions further cause the processor to:

identify a conflict between the first modified I/O pattern and the second modified I/O pattern;

resolve the conflict by further modifying at least one of the first modified I/O pattern or the second modified I/O pattern; and

generate representative I/O based on the further modified first modified representative workload and second modified representative workload.

19. The system of claim 16, wherein the storage system performance comprises a SSD performance.

20. The system of claim 16, wherein the first representative I/O pattern comprises a repetitive I/O pattern measured on the storage system while executing an application and an associated workload.