MEMORY DEVICE AND PROGRAMMING OPERATION METHOD THEREOF WITH DIFFERENT BIT LINE VOLTAGES
First Claim
1. An operation method for a memory device having a memory array including a plurality of memory cells, a plurality of word lines and a plurality of bit lines, the operation method for the memory device including:
- applying a program voltage to at least a selected word line of the word lines; and
during a high level period of the program voltage, based on respective locations of a plurality of selected bit lines of the bit lines on the word lines, applying a plurality of different bit line voltages to the selected bit lines, wherein the selected bit lines are coupled to at least one memory cell of the memory cells, which is to be written logic 0;
the plurality of different bit line voltage applied to the selected bit lines have different rising transition timing; and
a plurality of first selected bit lines of the selected bit lines, which are closest to a head of the word lines, are applied by the bit line voltage having a fastest rising transition timing or a highest bit line voltage.
1 Assignment
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Accused Products
Abstract
Provided is an operation method for a memory device. The memory device includes a memory array having a plurality of word lines and a plurality of bit lines. The operation method for the memory device includes: applying a program voltage to at least one selected word line of the word lines; and during a high level of the program voltage, based on respective locations of a plurality of selected bit line, which are to be written into data 0, on the word lines, applying different plurality of bit line voltages to the selected bit line which are to be written into data 0.
4 Citations
10 Claims
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1. An operation method for a memory device having a memory array including a plurality of memory cells, a plurality of word lines and a plurality of bit lines, the operation method for the memory device including:
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applying a program voltage to at least a selected word line of the word lines; and during a high level period of the program voltage, based on respective locations of a plurality of selected bit lines of the bit lines on the word lines, applying a plurality of different bit line voltages to the selected bit lines, wherein the selected bit lines are coupled to at least one memory cell of the memory cells, which is to be written logic 0;
the plurality of different bit line voltage applied to the selected bit lines have different rising transition timing; and
a plurality of first selected bit lines of the selected bit lines, which are closest to a head of the word lines, are applied by the bit line voltage having a fastest rising transition timing or a highest bit line voltage. - View Dependent Claims (2)
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3. An operation method for a memory device having a memory array including a plurality of word lines and a plurality of bit lines, the bit lines being grouped into a plurality of bit line groups based on respective locations of the bit lines on the word lines, the operation method for the memory device including:
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applying a program voltage to at least a selected word line of the word lines; and during a high level period of the program voltage, applying a plurality of different bit line voltages to the selected bit line groups, wherein the plurality of different bit line voltage have different rising transition timing; and
a first selected bit line group of the selected bit line groups, which is closest to a head of the word lines, is applied by the bit line voltage having a fastest rising transition timing or a highest bit line voltage. - View Dependent Claims (4, 5, 6, 7, 8)
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9. A memory device, including:
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a memory array including a plurality of memory cells, a plurality of word lines and a plurality of bit lines; a control circuit coupled to the memory array; and an operation voltage generation circuit, coupled to the memory array and the control circuit, for generating a program voltage to at least a selected word line of the word lines of the memory array; wherein under control of the control circuit, during a high level period of the program voltage, based on respective locations of a plurality of selected bit lines of the bit lines on the word lines, the operation voltage generation circuit applies a plurality of different bit line voltages to the selected bit lines, wherein the selected bit lines are coupled to at least one memory cell of the memory cells, which is to be written logic 0;
the plurality of different bit line voltage have different rising transition timing; and
a plurality of first selected bit lines of the selected bit lines, which are closest to a head of the word lines, are applied by the bit line voltage having a fastest rising transition timing or a highest bit line voltage. - View Dependent Claims (10)
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Specification