SYSTEM AND METHOD FOR MULTI-PARAMETER SPECTROSCOPY
First Claim
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1. An apparatus for detecting a material within a sample, comprising:
- a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample;
an OAM spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an orbital angular momentum (OAM) spectroscopic analysis to detect a first signature associated with the sample;
a Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a Raman spectroscopic analysis to detect a second signature associated with the sample;
a database including a plurality of unique combinations of first signatures and second signatures, each of the plurality of unique combinations of the first signatures and the second signatures associated with a particular material; and
a processor for detecting the material within the sample responsive to a comparison of the unique combination of the first signature and the second signature detected by the OAM spectroscopic unit and the Raman spectroscopic unit with the plurality of unique combinations of first signatures and second signatures within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein the identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone.
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Abstract
An apparatus for detecting a material within a sample includes a light emitting unit for directing at least one light beam through the sample. A plurality of units receive the light beam that has passed through the sample and performs a spectroscopic analysis of the sample based on the received light beam. Each of the plurality of units analyze a different parameter with respect to the sample and provide a separate output signal with respect to the analysis. A processor detects the material with respect each of the provided separate output signals.
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19 Claims
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1. An apparatus for detecting a material within a sample, comprising:
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a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample; an OAM spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an orbital angular momentum (OAM) spectroscopic analysis to detect a first signature associated with the sample; a Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a Raman spectroscopic analysis to detect a second signature associated with the sample; a database including a plurality of unique combinations of first signatures and second signatures, each of the plurality of unique combinations of the first signatures and the second signatures associated with a particular material; and a processor for detecting the material within the sample responsive to a comparison of the unique combination of the first signature and the second signature detected by the OAM spectroscopic unit and the Raman spectroscopic unit with the plurality of unique combinations of first signatures and second signatures within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein the identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone. - View Dependent Claims (2, 3, 4, 5)
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6. An apparatus for detecting a material within a sample, comprising:
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a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample; a first Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a first Raman spectroscopic analysis to detect a first signature associated with the sample; a polarizer for polarizing the at least one light beam prior to passing through the sample; a second Raman spectroscopic unit for receiving the polarized at least one light beam that has passed through the sample and performing a second Raman spectroscopic analysis to detect a second signature associated with the sample; first circuitry for applying vortices to the at least one light beam prior to passing though the sample; a third Ramen spectroscopic unit for receiving the at least one light beam having vortices applied thereto that has passed through the sample and performing a third Raman spectroscopic analysis to detect a third signature associated with the sample; a database including a plurality of unique combinations of first signatures, second signatures and third signatures, each of the plurality of unique combinations of the first signatures, the second signatures and the third signatures associated with a particular material; and a processor for detecting the material within the sample responsive to a comparison of the unique combination of the first signature, the second signature and the third signature detected by the first Raman spectroscopic unit, the second Raman spectroscopic unit and the third Raman spectroscopic unit with the plurality of unique combinations of the first signatures, the second signatures and the third signatures within the database and for determining a matching unique combination of the first signature, the second signature and the third signature within the database, wherein the identification of the unique combination of the first signature, the second signature and the third signatures enables detection of the material not detectable using any of the first signature, the second signature or the third signature alone. - View Dependent Claims (7, 8, 9, 10)
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11. An apparatus for detecting a material within a sample, comprising:
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a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample; a polarizer for polarizing the at least one light beam; an first Raman spectroscopic unit for receiving the polarized at least one light beam that has passed though the sample and performing a first Raman spectroscopic analysis to detect a first signature associated with the sample; a second Raman spectroscopic unit for receiving the non-polarized at least one light beam that has passed through the sample and performing a second Raman spectroscopic analysis to detect a second signature associated with the sample; a database including a plurality of unique combinations of the first signatures and the second signatures, each of the plurality of unique combinations of the first signatures and the second signatures associated with a particular material; and a processor for detecting the material within the sample responsive to a comparison of the unique combination of the first signature and the second signature detected by the first Raman spectroscopic unit and the second Raman spectroscopic unit with the plurality of unique combinations of the first signatures and the second signatures within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein the identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone. - View Dependent Claims (12, 13, 14)
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15. An apparatus for detecting a material within a sample, comprising:
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a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample; an Ince-Gaussian spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an Ince-Gaussian spectroscopic analysis to detect a first signature associated with the sample; a second spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a second spectroscopic analysis to detect a second signature associated with the sample; a database including a plurality of unique combinations of first signatures and second signatures, each of the plurality of unique combinations of the first signatures and the second signatures associated with a particular material; and a processor for detecting the material within the sample responsive to a comparison of the unique combination of the first signature and the second signature detected by the Ince-Gaussian spectroscopic unit and the second spectroscopic unit with the plurality of unique combinations of the first signatures and the second signatures within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein the identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone. - View Dependent Claims (16, 17, 18, 19)
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Specification