SUM-OF-PRODUCTS ARRAY FOR NEUROMORPHIC COMPUTING SYSTEM

• US 20190244662A1
• Filed: 02/02/2018
• Published: 08/08/2019
• Est. Priority Date: 02/02/2018
• Status: Abandoned Application

• Current Assignee: Macronix International Co., Ltd.
• Original Assignee: Macronix International Co., Ltd.
• Inventors: LEE, Feng-Min, LIN, Yu-Yu
• Application Number:
  US15/887,166
• Publication Number:
  US 20190244662A1
• Time in Patent Office: Days
• CPC Class Codes: G06F 2207/4814 Non-logic devices, e.g. operational amplifiers
• CPC Class Codes: G06F 7/5443 Sum of products for applications thereof, see the relevant places, e.g. G06F17/10, H03H17/00
• CPC Class Codes: G06N 3/065 Analogue means
• CPC Class Codes: G11C 11/54 using elements simulating biological cells, e.g. neuron
• CPC Class Codes: G11C 13/0007 comprising metal oxide memory material, e.g. perovskites
• CPC Class Codes: G11C 13/0026 Bit-line or column circuits
• CPC Class Codes: G11C 13/004 Reading or sensing circuits or methods
• CPC Class Codes: G11C 16/04 using variable threshold transistors, e.g. FAMOS
• CPC Class Codes: G11C 16/0483 comprising cells having several storage transistors connected in series
• CPC Class Codes: G11C 2013/0045 Read using current through the cell
• CPC Class Codes: H10B 43/35 with cell select transistors, e.g. NAND
• CPC Class Codes: H10B 63/30 comprising selection components having three or more electrodes, e.g. transistors

Abstract

An array of variable resistance cells based on a programmable threshold transistor and a resistor connected in parallel is described. An input voltage applied to the transistor, and the programmable threshold of the transistor, can represent variables of sum-of-products operations. Programmable threshold transistors in the variable resistance cells comprise charge trapping memory transistors, such as floating gate transistors or dielectric charge trapping transistors. The resistor in the variable resistance cells can comprise a buried implant resistor connecting the current-carrying terminals (e.g. source and drain) of the programmable threshold transistor. A voltage sensing sense amplifier is configured to sense the voltage generated by the variable resistance cells as a function of an applied current and the resistance of the variable resistance cells.

Claims

1. A device, comprising:

an array of variable resistance cells, at least one of the variable resistance cells in the array comprising a programmable threshold transistor programmed to store a weight parameter for a sum-of-products operation and a resistor connected in parallel;

a plurality of word lines coupled to the programmable threshold transistors in the variable resistance cells, and word line drivers connected to the plurality of word lines to apply variable gate voltages representing input parameters for a sum-of-products operation to the programmable threshold transistors in a selected set of the variable resistance cells; and

a sense amplifier configured to sense voltages across the selected set of variable resistance cells representing a sum-of-products of the input parameters and the weight parameters.

2. The device of claim 1, wherein the variable resistance cells in the array are arranged in a plurality of strings of series-connected variable resistance cells.

3. The device of claim 2, wherein the plurality of word lines is coupled to the strings of series-connected variable resistance cells.

4. The device of claim 1, wherein the programmable threshold transistor in the variable resistance cells comprises a charge trapping memory transistor.

5. The device of claim 4, wherein the resistor in the variable resistance cells comprises a buried implant resistor.

6. The device of claim 1, wherein the programmable threshold transistor in the variable resistance cell comprises a floating gate charge trapping memory transistor, and the resistor in the variable resistance cell comprises a buried implant resistor.

7. The device of claim 1, wherein the programmable threshold transistor in the variable resistance cell comprises a dielectric charge trapping memory transistor, and the resistor in the variable resistance cell comprises a buried implant resistor.

9. The device of claim 1, wherein the variable resistance cells in the array consist of one transistor having a layout footprint, and one resistor, in which the resistor is implemented within the layout footprint of the one transistor.

8. (canceled)

10. A device, comprising:

a plurality of strings of variable resistance cells;

at least one of the variable resistance cells in strings in the plurality of strings having a first current-carrying node, a second current-carrying node, and a control terminal, and comprising a programmable threshold transistor programmed to store a weight parameter for a sum-of-products operation and a resistor connected in parallel to the first and second current-carrying nodes, the programmable threshold transistor having a gate connected to the control terminal; and

wherein;

a variable resistance of each variable resistance cell in the strings is a function of a voltage applied to the control gate of the cell, a threshold of the programmable threshold transistor, and the resistor;

a plurality of word lines coupled to the programmable threshold transistors in the variable resistance cells, and word line drivers connected to the plurality of word lines to apply variable gate voltages representing input parameters for a sum-of-products operation to the programmable threshold transistors in a selected set of the variable resistance cells; and

a sense amplifier configured to sense voltages across the selected set of variable resistance cells representing a sum-of-products of the input parameters and the weight parameters.

12. The device of claim 10, wherein the programmable threshold transistor in the at least one of the variable resistance cells comprises a charge trapping memory transistor, and the threshold of the transistor is a function of charge trapped in the charge trapping memory transistor.

13. The device of claim 12, wherein the resistor in the at least one of the variable resistance cells comprises a buried implant resistor.

14. The device of claim 12, including circuitry to program the threshold of the charge trapping memory transistor with multiple levels.

15. The device of claim 10, wherein the programmable threshold transistor in the variable resistance cell comprises a floating gate charge trapping memory transistor, and the resistor in each of the variable resistance cells comprises a buried implant resistor, and the threshold of the transistor is a function of charge trapped in the floating gate charge trapping memory transistor.

16. The device of claim 10, wherein the programmable threshold transistor in the variable resistance cell comprises a dielectric charge trapping memory transistor, and the resistor in each of the variable resistance cells comprises a buried implant resistor, and the threshold of the transistor is a function of charge trapped in the dielectric charge trapping memory transistor.

17. The device of claim 10, wherein the sense amplifier is responsive to a voltage generated by an applied current and a sum of the variable resistances of a plurality of variable resistance cells in the selected string.

18. The device of claim 10, wherein the at least one of the variable resistance cells in the plurality of strings consists of one transistor having a layout footprint, and one resistor, in which the resistor is implemented within the layout footprint of the one transistor.

11. (canceled)